$\require{mediawiki-texvc}$

연합인증

연합인증 가입 기관의 연구자들은 소속기관의 인증정보(ID와 암호)를 이용해 다른 대학, 연구기관, 서비스 공급자의 다양한 온라인 자원과 연구 데이터를 이용할 수 있습니다.

이는 여행자가 자국에서 발행 받은 여권으로 세계 각국을 자유롭게 여행할 수 있는 것과 같습니다.

연합인증으로 이용이 가능한 서비스는 NTIS, DataON, Edison, Kafe, Webinar 등이 있습니다.

한번의 인증절차만으로 연합인증 가입 서비스에 추가 로그인 없이 이용이 가능합니다.

다만, 연합인증을 위해서는 최초 1회만 인증 절차가 필요합니다. (회원이 아닐 경우 회원 가입이 필요합니다.)

연합인증 절차는 다음과 같습니다.

최초이용시에는
ScienceON에 로그인 → 연합인증 서비스 접속 → 로그인 (본인 확인 또는 회원가입) → 서비스 이용

그 이후에는
ScienceON 로그인 → 연합인증 서비스 접속 → 서비스 이용

연합인증을 활용하시면 KISTI가 제공하는 다양한 서비스를 편리하게 이용하실 수 있습니다.

Method and procedure for neural control of dynamic processes 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G05B-013/02
출원번호 US-0567873 (1990-08-15)
발명자 / 주소
  • Frerichs Donald K. (Shaker Heights OH) Kaya Azmi (Akron OH) Keyes
  • IV Marion A. (Chagrin Falls OH)
출원인 / 주소
  • Elsag International B.V. (Amsterdam - Zuidoost NLX 03)
인용정보 피인용 횟수 : 110  인용 특허 : 0

초록

A neural network control based on a general multi-variable nonlinear dynamic model incorporating time delays is disclosed. The inverse dynamics of the process being controlled is learned represented by a multi-layer neural network which is used as a feedforward control to achieve a specified closed

대표청구항

A system for controlling a dynamic process to produce a desired process value comprising means for producing an inverse dynamics of the process being controlled, means responsive to said inverse dynamics producing means, said responsive means modifying the desired process value to produce a signal c

이 특허를 인용한 특허 (110)

  1. Frye Robert Charles ; Harry Thomas Richard ; Lory Earl Ryan ; Rietman Edward Alois, Active neural network control of wafer attributes in a plasma etch process.
  2. Meng,Zhuo; Duan,Baofu; Pao,Yoh Han, Adaptive learning enhancement to automated model maintenance.
  3. Mealy, James, Adaptive neural net feed forward system and method for adaptive control of mechanical systems.
  4. Kavaklioglu,Kadir; Dillon,Steven R.; Rome,Gregory H.; Westbrock,Jon, Aggregation of asset use indices within a process plant.
  5. Jongsma,Jonathon Michael; Huisenga,Garrie David, Analog-to-digital converter with range error detection.
  6. Eryurek, Evren; Warrior, Jogesh, Auto correcting temperature transmitter with resistance based sensor.
  7. Schumacher, Mark S.; Eryurek, Evren, Automatic field device service adviser.
  8. Meng,Zhuo; Pao,Yoh Han; Duan,Baofu, Automatic model maintenance through local nets.
  9. Meng,Zhuo; Pao,Yoh Han, Automatic neural-net model generation and maintenance.
  10. Mathur Anoop K. (4341 Rustic Pl. Shoreview MN 55126) Samad Tariq (5212 Xerxes Ave. South Minneapolis MN 55410), Closed loop neural network automatic tuner.
  11. Evren Eryurek, Communication technique for field devices in industrial processes.
  12. Eryurek, Evren; Kavaklioglu, Kadir, Control system using process model.
  13. Eryurek,Evren; Schleiss,Trevor D., Creation and display of indices within a process plant.
  14. Eryurek,Evren; Schleiss,Trevor D.; Harris,Stuart, Data sharing in a process plant.
  15. Longsdorf, Randy J.; Nelson, Scott D.; Davis, Dale S.; Nelson, Richard L.; Johnson, Amy K.; Brown, Gregory C., Dedicated process diagnostic device.
  16. Rud, Jason H., Degrading sensor detection implemented within a transmitter.
  17. Eryurek Evren ; Warrior Jogesh, Device in a process system for detecting events.
  18. Evren Eryurek ; Jogesh Warrior, Device in a process system for detecting events.
  19. Eryurek, Evren; Warrior, Jogesh, Device in a process system for determining statistical parameter.
  20. Eryurek Evren, Device in a process system for validating a control signal from a field device.
  21. Schleiss, Trevor D.; Nixon, Mark; Blevins, Terrence Lynn; Brase, Todd B.; Ganesamoorthi, Suresh, Diagnostic expert in a process control system.
  22. Eryurek, Evren; Esboldt, Steven R.; Rome, Gregory H., Diagnostics for resistive elements of process devices.
  23. Schleiss Trevor D. ; Wojsznis Wilhelm K. ; Blevins Terrence L., Diagnostics in a process control system.
  24. Schleiss, Trevor D.; Wojsznis, Wilhelm K.; Blevins, Terrence L., Diagnostics in a process control system.
  25. Blevins, Terrence L.; Nixon, Mark J.; Wojsznis, Wilhelm K., Diagnostics in a process control system which uses multi-variable control techniques.
  26. Brown, Gregory C.; Schumacher, Mark S., Diagnostics of impulse piping in an industrial process.
  27. Keyes, IV, Marion A.; Nixon, Mark J.; Blevins, Terrence Lynn, Economic calculations in a process control system.
  28. Keyes, Marion A.; Nixon, Mark J.; Blevins, Terrence Lynn, Economic calculations in a process control system.
  29. Coursolle, Thomas P.; Wehrs, David L., Electrode leakage diagnostics in a magnetic flow meter.
  30. Rome, Gregory H.; Eryurek, Evren; Kavaklioglu, Kadir, Electronics board life prediction of microprocessor-based transmitters.
  31. Mandel Stephen ; Sobel Richard A., Emission monitoring system.
  32. Eryurek, Evren; Ramachandran, Ram; Scott, Cindy Alsup; Schleiss, Trevor Duncan, Enhanced fieldbus device alerts in a process control system.
  33. William R. Kirkpatrick ; Eric D. Rotvold, Error compensation for a process fluid temperature transmitter.
  34. Huisenga, Garrie D.; Lewis, Richard A.; Lattimer, Donald R., Field device for digital process control loop diagnostics.
  35. Miller, John Philip, Field device with capability of calculating digital filter coefficients.
  36. Eryurek, Evren; Kavaklioglu, Kadir, Flow diagnostic system.
  37. Wehrs, David L.; Eryurek, Evren, Flow measurement diagnostics.
  38. Eryurek, Evren; Kavaklioglu, Kadir, Flow measurement with diagnostics.
  39. Barber Andrew J., Generating a nonlinear model and generating drive signals for simulation testing using the same.
  40. Borgeson, Dale W.; DelaCruz, Moises A., Hand held diagnostic and communication device with automatic bus detection.
  41. Eryurek, Evren; Gao, Rong; Tsoukalas, Lefteri H., High accuracy signal processing for magnetic flowmeter.
  42. Elke, Anthony Michael, Industrial process temperature transmitter with sensor stress diagnostics.
  43. Tani, Jun, Information processing apparatus and method, and recording medium.
  44. Tani,Jun, Information processing apparatus and method, and recording medium.
  45. Tani,Jun, Information processing apparatus and method, and recording medium.
  46. Tani,Jun, Information processing apparatus and method, and recording medium.
  47. Eryurek, Evren; Llewellyn, Craig Thomas; Marschall, Lester David; Westbrock, Jon D.; Harris, Stuart A.; Hokeness, Scott N., Integrated alert generation in a process plant.
  48. Eryurek, Evren; Harris, Stuart Andrew; Hokeness, Scott Nels; Marschall, Lester David, Integrated device alerts in a process control system.
  49. Wojsznis, Wilhelm K.; Blevins, Terrence L.; Seeman, Richard C.; Nixon, Mark J., Integrated optimal model predictive control in a process control system.
  50. Schlang, Martin; Malisch, Frank-Oliver; Broese, Einar; Gramckow, Otto, Learning process for a neural network.
  51. Evren Eryurek, Low power two-wire self validating temperature transmitter.
  52. Schulz, Robert K., Magnetic flow meter with reference electrode.
  53. Graber, William F.; Foss, Scot R.; Schulz, Robert K., Magnetic flowmeter with verification.
  54. Roger G. Brown ; Douglas S. Mann ; Richard A. Lund, Measuring system repeatable bandwidth for simulation testing.
  55. Keeler James David ; Hartman Eric Jon, Method and apparatus for analyzing a neural network within desired operating parameter constraints.
  56. Keeler James David ; Hartman Eric J. ; Liano Kadir, Method and apparatus for determining the sensitivity of inputs to a neural network on output parameters.
  57. Keeler James David ; Hartman Eric Jon ; Liano Kadir, Method and apparatus for determining the sensitivity of inputs to a neural network on output parameters.
  58. Huddleston, David Eugene; Pao, Yoh Han; Cass, Ronald; Yang, Qian; Polyak, Ella; Cryer, Peter; Garofalo, Charles Edward, Method and apparatus for discovering evolutionary changes within a system.
  59. Lund,Richard A., Method and apparatus for generating input signals in a physical system.
  60. Spall James C. (Ellicott City MD), Method and apparatus for model-free optimal signal timing for system-wide traffic control.
  61. Armstrong, Steve; Hokeness, Scott N.; Di Giovanni, Augustine, Method and apparatus for monitoring and performing corrective measures in a process plant using monitoring data with corrective measures data.
  62. Nixon,Mark J.; Keyes, IV,Marion A.; Schleiss,Trevor D.; Gudaz,John A.; Blevins,Terrence L., Method and apparatus for performing a function in a plant using process performance monitoring with process equipment monitoring and control.
  63. Armstrong, Stephen; Hokeness, Scott N.; Di Giovanni, Augustine, Method and apparatus for performing a function in a process plant using monitoring data with criticality evaluation data.
  64. Hansen Peter D. (Wellesley Hills MA) Badavas Paul C. (Southboro MA), Method and apparatus for providing multivariable nonlinear control.
  65. Gramckow Otto,DEX ; Martinetz Thomas,DEX ; Poppe Thomas,DEX ; Sorgel Gunter,DEX, Method and control device for controlling a material-processing process.
  66. Broese Einar (Erlangen DEX) Gramckow Otto (Erlangen DEX) Martinetz Thomas (Munich DEX) Soergel Guenter (Nuremberg DEX), Method and device for conducting a process in a controlled system with at least one precomputed parameter based on a plu.
  67. de Vries Aalbert, Method and system for training a neural network with adaptive weight updating and adaptive pruning in principal componen.
  68. Matthew Rabinowitz, Method and system for training dynamic nonlinear adaptive filters which have embedded memory.
  69. Mathur Anoop ; Samad Tariq, Method for developing a neural network tool for process identification.
  70. Yesildirek A. ; Lewis F. L., Method for feedback linearization of neural networks and neural network incorporating same.
  71. Swanson, Brian G., Method for generating a model representative of a process.
  72. Mathur Anoop ; Samad Tariq, Method for process system identification using neural network.
  73. Russell, III, Alden C.; Harris, Stuart A.; Peluso, Marcos; Borgeson, Dale W., Multi-protocol field device interface with automatic bus detection.
  74. Merchant,Michael; Lund,Richard; Mann,Doug, Multiple region convolver with tapering.
  75. Eryurek, Evren; Lenz, Gary A.; Kavaklioglu, Kadir, Prediction of error magnitude in a pressure transmitter.
  76. Swanson,Brian G., Predictive emissions monitoring method.
  77. Swanson, Brian G., Predictive emissions monitoring using a statistical hybrid model.
  78. Eryurek,Evren; Kavaklioglu,Kadir, Pressure transmitter with diagnostics.
  79. Lenz, Gary A., Printer with a process diagnostics system for detecting events.
  80. Eryurek, Evren; Kavaklioglu, Kadir; Esboldt, Steven R., Process device diagnostics using process variable sensor signal.
  81. Eryurek,Evren; Kavaklioglu,Kadir; Esboldt,Steven R., Process device diagnostics using process variable sensor signal.
  82. Huisenga,Garrie D.; Longsdorf,Randy J., Process device with quiescent current diagnostics.
  83. Longsdorf, Randy J.; Blumeyer, Chad C., Process device with vibration based diagnostics.
  84. Brown,Gregory C.; Peluso,Marcos; Karschnia,Robert J., Process diagnostics.
  85. Rud, Jason Harold; Engelstad, Loren Michael, Process variable measurement noise diagnostic.
  86. Rud, Jason H., Process variable transmitter with EMF detection and correction.
  87. Sittler, Fred C.; Hedtke, Robert C., Process variable transmitter with acceleration sensor.
  88. Meng, Zhuo; Duan, Baofu; Pao, Yoh-Han; Cass, Ronald J, Processing mixed numeric and symbolic data encodings using scaling at one distance of at least one dimension, clustering, and a signpost transformation.
  89. Evren Eryurek ; Jogesh Warrior ; Andrew T. Patten, Resistance based process control device diagnostics.
  90. Evren Eryurek ; Steven R. Esboldt ; Gregory H. Rome, Resistance based process control device diagnostics.
  91. Eryurek, Evren; Esboldt, Steven R., Resistive element diagnostics for process devices.
  92. Eryurek,Evren; Kavaklioglu,Kadir, Root cause diagnostics.
  93. Miller, John P.; Eryurek, Evren, Rule set for root cause diagnostics.
  94. Eryurek Evren, Signal processing technique which separates signal components in a sensor for sensor diagnostics.
  95. Miller, John P., Simplified algorithm for abnormal situation prevention in load following applications including plugged line diagnostics in a dynamic process.
  96. Miller, John Philip, Simplified algorithm for abnormal situation prevention in load following applications including plugged line diagnostics in a dynamic process.
  97. Balentine, James R.; Dicaire, Andre A.; Scott, Cindy A.; Lattimer, Donald Robert; Schibler, Kenneth; Shepard, John R.; Jundt, Larry O., Software lockout coordination between a process control system and an asset management system.
  98. Wehrs, David L., Spectral diagnostics in a magnetic flow meter.
  99. Ulyanov, Sergei V.; Panfilov, Sergei; Takahashi, Kazuki, System and method for nonlinear dynamic control based on soft computing with discrete constraints.
  100. Eryurek, Evren; Westbrock, Jon, System for preserving and displaying process control data associated with an abnormal situation.
  101. Hosogi Shinya,JPX ; Maeda Yoshiharu,JPX, System identifying device and adaptive learning control device.
  102. Eryurek Evren ; Lenz Gary, Temperature transmitter with on-line calibration using johnson noise.
  103. Eryurek Evren ; Warrior Jogesh ; Esboldt Steven R., Transmitter with software for determining when to initiate diagnostics.
  104. Eryurek, Evren; Warrior, Jogesh; Esboldt, Steven R., Transmitter with software for determining when to initiate diagnostics.
  105. Kirkpatrick, William R.; Goetzinger, Charles E., Two-wire fluid temperature transmitter with thermocouple diagnostics.
  106. Huisenga,Garrie D.; Longsdorf,Randy J.; Lattimer,Donald R., Two-wire process control loop diagnostics.
  107. Yang,Qian; Garofalo,Charles; Gupta,Yogesh; Cass,Ronald; Wilson,Kirk; Sedukhin,Igor, Using neural networks for data mining.
  108. Pao, Yoh-Han; Meng, Zhuo; Duan, Baofu, Viewing multi-dimensional data through hierarchical visualization.
  109. Peterson, Neil J.; Deitz, David L.; Wilson, Grant; Zhou, Ling; Tanyous, Ebtesam S.; Worek, Christopher J.; Nixon, Mark J., Web services-based communications for use with process control systems.
  110. Peterson, Neil J.; Deitz, David L.; Wilson, Grant; Zhou, Ling; Tanyous, Ebtesam S.; Worek, Christopher J.; Nixon, Mark J., Web services-based communications for use with process control systems.
섹션별 컨텐츠 바로가기

AI-Helper ※ AI-Helper는 오픈소스 모델을 사용합니다.

AI-Helper 아이콘
AI-Helper
안녕하세요, AI-Helper입니다. 좌측 "선택된 텍스트"에서 텍스트를 선택하여 요약, 번역, 용어설명을 실행하세요.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.

선택된 텍스트

맨위로