$\require{mediawiki-texvc}$

연합인증

연합인증 가입 기관의 연구자들은 소속기관의 인증정보(ID와 암호)를 이용해 다른 대학, 연구기관, 서비스 공급자의 다양한 온라인 자원과 연구 데이터를 이용할 수 있습니다.

이는 여행자가 자국에서 발행 받은 여권으로 세계 각국을 자유롭게 여행할 수 있는 것과 같습니다.

연합인증으로 이용이 가능한 서비스는 NTIS, DataON, Edison, Kafe, Webinar 등이 있습니다.

한번의 인증절차만으로 연합인증 가입 서비스에 추가 로그인 없이 이용이 가능합니다.

다만, 연합인증을 위해서는 최초 1회만 인증 절차가 필요합니다. (회원이 아닐 경우 회원 가입이 필요합니다.)

연합인증 절차는 다음과 같습니다.

최초이용시에는
ScienceON에 로그인 → 연합인증 서비스 접속 → 로그인 (본인 확인 또는 회원가입) → 서비스 이용

그 이후에는
ScienceON 로그인 → 연합인증 서비스 접속 → 서비스 이용

연합인증을 활용하시면 KISTI가 제공하는 다양한 서비스를 편리하게 이용하실 수 있습니다.

High-temperature, low-noise coaxial cable assembly with high strength reinforcement braid 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H01B-011/18
  • H01R-004/28
출원번호 US-0774690 (1991-10-11)
발명자 / 주소
  • Johnson Robert B. (Laguna Beach CA)
출원인 / 주소
  • Endevco Corporation (San Juan Capistrano CA 02)
인용정보 피인용 횟수 : 122  인용 특허 : 0

초록 ▼

A high-temperature, low-noise coaxial cable assembly with high strength reinforcement braid is depicted and described. The cable assembly has very low self-noise generation and is particularly useful for telemetry and instrumentation purposes. Also, the cable assembly offers a tensile strength about

대표청구항 ▼

A coaxial cable having a center conductor concentrically surrounded by a dielectric layer, said cable further comprising a continuous electrostatically conductive polymer layer including a spiral wrap of fused PTFE polymer tape having powder-fine carbon particles dispersed therein surrounding said d

이 특허를 인용한 특허 (122)

  1. Strid, Eric; Gleason, K. Reed, Active wafer probe.
    상세보기
  2. Martin,Eric, Cable sleeve and method of installation.
    상세보기
  3. Strid, Eric; Campbell, Richard, Calibration structures for differential signal probing.
    상세보기
  4. Dunklee, John, Chuck for holding a device under test.
    상세보기
  5. Dunklee, John, Chuck for holding a device under test.
    상세보기
  6. Dunklee, John, Chuck for holding a device under test.
    상세보기
  7. Dunklee,John, Chuck for holding a device under test.
    상세보기
  8. Dunklee,John, Chuck for holding a device under test.
    상세보기
  9. Dunklee,John, Chuck for holding a device under test.
    상세보기
  10. Stewart, Craig; Lord, Anthony; Spencer, Jeff; Burcham, Terry; McCann, Peter; Jones, Rod; Dunklee, John; Lesher, Tim; Newton, David, Chuck for holding a device under test.
    상세보기
  11. Stewart,Craig; Lord,Anthony; Spencer,Jeff; Burcham,Terry; McCann,Peter; Jones,Rod; Dunklee,John; Lesher,Tim; Newton,David, Chuck for holding a device under test.
    상세보기
  12. Andrews, Peter; Froemke, Brad; Dunklee, John, Chuck with integrated wafer support.
    상세보기
  13. Andrews,Peter; Froemke,Brad; Dunklee,John, Chuck with integrated wafer support.
    상세보기
  14. Andrews,Peter; Froemke,Brad; Dunklee,John, Chuck with integrated wafer support.
    상세보기
  15. Fuks, Rudolf; Toma, Stephen J.; Georghiou, George; Durett, Donald P., Connector for coaxial cable.
    상세보기
  16. Campbell, Richard; Strid, Eric W.; Andrews, Mike, Differential signal probe with integral balun.
    상세보기
  17. Strid, Eric; Campbell, Richard, Differential signal probing system.
    상세보기
  18. Campbell, Richard L.; Andrews, Michael, Differential waveguide probe.
    상세보기
  19. Burcham, Terry; McCann, Peter; Jones, Rod, Double sided probing structures.
    상세보기
  20. Burcham,Terry; McCann,Peter; Jones,Rod, Double sided probing structures.
    상세보기
  21. Messer, Mark Alexander, Fiber optic cable and method of manufacture.
    상세보기
  22. Kim, Young Joon; Gnatek, Francis A.; Doak, Jeffrey S., Fiber optic cable demonstrating improved dimensional stability.
    상세보기
  23. Reed, Donald; Condrey, Greg; Messer, Mark, Fiber-optic cable and method of manufacture.
    상세보기
  24. Dunklee, John; Norgden, Greg; Cowan, C. Eugene, Guarded tub enclosure.
    상세보기
  25. Dunklee,John; Norgden,Greg; Cowan,C. Eugene, Guarded tub enclosure.
    상세보기
  26. Rumsey Roger L., High voltage wiring system for neon lights.
    상세보기
  27. Andrews, Peter; Hess, David; New, Robert, Interface for testing semiconductors.
    상세보기
  28. McFadden,Bruce, Localizing a temperature of a device for testing.
    상세보기
  29. Anilkumar, Ramsesh; Prabhakaran, Baburaj Kaimalilputhenpura, Low noise differential charge amplifier for measuring discrete charges in noisy and corrosive environments.
    상세보기
  30. Tervo Paul A. ; Cowan Clarence E., Low-current pogo probe card.
    상세보기
  31. Tervo, Paul A.; Cowan, Clarence E., Low-current pogo probe card.
    상세보기
  32. Tervo, Paul A.; Cowan, Clarence E., Low-current pogo probe card.
    상세보기
  33. Tervo,Paul A.; Cowan,Clarence E., Low-current pogo probe card.
    상세보기
  34. Tervo,Paul A.; Cowan,Clarence E., Low-current pogo probe card.
    상세보기
  35. Schwindt Randy J., Low-current probe card.
    상세보기
  36. Schwindt, Randy J., Low-current probe card.
    상세보기
  37. Schwindt, Randy J., Low-current probe card.
    상세보기
  38. Schwindt,Randy J., Low-current probe card.
    상세보기
  39. Schwindt,Randy J., Low-current probe card.
    상세보기
  40. Schwindt Randy J., Low-current probe card with reduced triboelectric current generating cables.
    상세보기
  41. Schwindt Randy J., Low-current probe card with reduced triboelectric current generating cables.
    상세보기
  42. Gleason, K. Reed; Bayne, Michael A.; Smith, Kenneth; Lesher, Timothy; Koxxy, Martin, Membrane probing method using improved contact.
    상세보기
  43. Gleason, Reed; Bayne, Michael A.; Smith, Kenneth; Lesher, Timothy; Koxxy, Martin, Membrane probing method using improved contact.
    상세보기
  44. Gleason, K. Reed; Smith, Kenneth R.; Bayne, Mike, Membrane probing structure with laterally scrubbing contacts.
    상세보기
  45. Gleason, Reed; Bayne, Michael A.; Smith, Kenneth; Lesher, Timothy; Koxxy, Martin, Membrane probing system.
    상세보기
  46. Smith,Kenneth; Gleason,Reed, Membrane probing system.
    상세보기
  47. Smith,Kenneth; Gleason,Reed, Membrane probing system.
    상세보기
  48. Tervo,Paul A.; Smith,Kenneth R.; Cowan,Clarence E.; Dauphinais,Mike P.; Koxxy,Martin J., Membrane probing system.
    상세보기
  49. Gleason, K. Reed; Smith, Kenneth R.; Bayne, Mike, Membrane probing system with local contact scrub.
    상세보기
  50. Hayden, Leonard; Martin, John; Andrews, Mike, Method of assembling a wafer probe.
    상세보기
  51. Gleason, Reed; Bayne, Michael A.; Smith, Kenneth, Method of constructing a membrane probe.
    상세보기
  52. Smith, Kenneth R., Method of replacing an existing contact of a wafer probing assembly.
    상세보기
  53. Mei, Luciano; Franci, Fabrizio; Bianchi, Dino, Methods and systems for oil free low voltage conduits.
    상세보기
  54. Rupflin, Michael; Klarer, Matias, Microwave cable and method for producing and using such a microwave cable.
    상세보기
  55. Clark William T. ; Dellagala Joseph ; Allen Robert, Multiple twisted pair data cable with geometrically concentric cable groups.
    상세보기
  56. Strid,Eric; Campbell,Richard, On-wafer test structures for differential signals.
    상세보기
  57. Harris,Daniel L.; McCann,Peter R., Optical testing device.
    상세보기
  58. Tervo,Paul A.; Cowan,Clarence E., POGO probe card for low current measurements.
    상세보기
  59. Hayden,Leonard; Rumbaugh,Scott; Andrews,Mike, Probe for combined signals.
    상세보기
  60. Hayden,Leonard; Rumbaugh,Scott; Andrews,Mike, Probe for combined signals.
    상세보기
  61. Campbell,Richard L.; Andrews,Michael; Bui,Lynh, Probe for high frequency signals.
    상세보기
  62. Smith, Kenneth; Jolley, Michael; Van Syckel, Victoria, Probe head having a membrane suspended probe.
    상세보기
  63. Smith,Kenneth; Jolley,Michael; Van Syckel,Victoria, Probe head having a membrane suspended probe.
    상세보기
  64. Schwindt,Randy, Probe holder for testing of a test device.
    상세보기
  65. Nordgren, Greg; Dunklee, John, Probe station.
    상세보기
  66. Nordgren, Greg; Dunklee, John, Probe station.
    상세보기
  67. Peters, Ron A.; Hayden, Leonard A.; Hawkins, Jeffrey A.; Dougherty, R. Mark, Probe station having multiple enclosures.
    상세보기
  68. Peters,Ron A.; Hayden,Leonard A.; Hawkins,Jeffrey A.; Dougherty,R. Mark, Probe station having multiple enclosures.
    상세보기
  69. Peters,Ron A.; Hayden,Leonard A.; Hawkins,Jeffrey A.; Dougherty,R. Mark, Probe station having multiple enclosures.
    상세보기
  70. Cowan, Clarence E.; Tervo, Paul A.; Dunklee, John L., Probe station thermal chuck with shielding for capacitive current.
    상세보기
  71. Cowan,Clarence E.; Tervo,Paul A.; Dunklee,John L., Probe station thermal chuck with shielding for capacitive current.
    상세보기
  72. Cowan,Clarence E.; Tervo,Paul A.; Dunklee,John L., Probe station thermal chuck with shielding for capacitive current.
    상세보기
  73. Dunklee,John; Cowan,Clarence E., Probe station with low inductance path.
    상세보기
  74. Dunklee,John; Cowan,Clarence E., Probe station with low inductance path.
    상세보기
  75. Lesher, Timothy; Miller, Brad; Cowan, Clarence E.; Simmons, Michael; Gray, Frank; McDonald, Cynthia L., Probe station with low noise characteristics.
    상세보기
  76. Lesher,Timothy; Miller,Brad; Cowan,Clarence E.; Simmons,Michael; Gray,Frank; McDonald,Cynthia L., Probe station with low noise characteristics.
    상세보기
  77. Lesher,Timothy; Miller,Brad; Cowan,Clarence E.; Simmons,Michael; Gray,Frank; McDonald,Cynthia L., Probe station with low noise characteristics.
    상세보기
  78. Navratil,Peter; Froemke,Brad; Stewart,Craig; Lord,Anthony; Spencer,Jeff; Runbaugh,Scott; Fisher,Gavin; McCann,Pete; Jones,Rod, Probe station with two platens.
    상세보기
  79. Lesher, Timothy E., Probe testing structure.
    상세보기
  80. Lesher,Timothy E., Probe testing structure.
    상세보기
  81. Root, Bryan J., Probe tile for probing semiconductor wafer.
    상세보기
  82. Root,Bryan J., Probe tile for probing semiconductor wafer.
    상세보기
  83. Smith, Kenneth R.; Hayward, Roger, Probing apparatus with impedance optimized interface.
    상세보기
  84. Smith, Kenneth R., Replaceable coupon for a probing apparatus.
    상세보기
  85. Root, Bryan J.; Funk, William A., Replaceable probe apparatus for probing semiconductor wafer.
    상세보기
  86. Root, Bryan J.; Funk, William A., Replaceable probe apparatus for probing semiconductor wafer.
    상세보기
  87. Berland, Norvald, Seismic cable connection device.
    상세보기
  88. Frake, Robert K.; Culbertson, David P.; Harvey, Daniel D., Sensor adaptor circuit housing incapsulating connection of an input connector with a wire.
    상세보기
  89. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Shielded probe for high-frequency testing of a device under test.
    상세보기
  90. Gleason, K. Reed; Lesher, Tim; Strid, Eric W.; Andrews, Mike; Martin, John; Dunklee, John; Hayden, Leonard; Safwat, Amr M. E., Shielded probe for testing a device under test.
    상세보기
  91. Gleason,K. Reed; Lesher,Tim; Andrews,Mike; Martin,John, Shielded probe for testing a device under test.
    상세보기
  92. Gleason,K. Reed; Lesher,Tim; Andrews,Mike; Martin,John, Shielded probe for testing a device under test.
    상세보기
  93. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Shielded probe for testing a device under test.
    상세보기
  94. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Shielded probe for testing a device under test.
    상세보기
  95. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Shielded probe with low contact resistance for testing a device under test.
    상세보기
  96. Rumsey Roger L., Shielded wiring system for high voltage AC current.
    상세보기
  97. Dunklee,John, Switched suspended conductor and connection.
    상세보기
  98. Dunklee,John, Switched suspended conductor and connection.
    상세보기
  99. Strid,Eric W.; Schappacher,Jerry B.; Carlton,Dale E.; Gleason,K. Reed, System for evaluating probing networks.
    상세보기
  100. Strid,Eric W.; Schappacher,Jerry B.; Carlton,Dale E.; Gleason,K. Reed, System for evaluating probing networks.
    상세보기
  101. Andrews, Peter; Hess, David, System for testing semiconductors.
    상세보기
  102. Culbertson, David P.; Harvey, Daniel D.; Frake, Robert K., Temperature sensor assembly and method of manufacturing thereof.
    상세보기
  103. Negishi, Kazuki; Hansen, Mark, Test apparatus for measuring a characteristic of a device under test.
    상세보기
  104. Campbell, Richard, Test structure and probe for differential signals.
    상세보기
  105. Campbell,Richard, Test structure and probe for differential signals.
    상세보기
  106. Rumbaugh,Scott, Thermal optical chuck.
    상세보기
  107. Rumbaugh,Scott, Thermal optical chuck.
    상세보기
  108. Eisele, William E., Thermal shield and hermetic seal for preventing deterioration of plastic insulation in open access closures and method therefor.
    상세보기
  109. Eisele, William E., Thermal shield and hermetic seal for preventing deterioration of plastic insulation in open access closures and method therefor.
    상세보기
  110. William E. Eisele, Thermal shield and hermetic seal for preventing deterioration of plastic insulation in open access closures and method therefor.
    상세보기
  111. Peters, Volker; Benedict, Detlev; Buda, Robert; Mueller, Stephan; Rahn, Henning; Schulz, Rene, Transmission line for drill pipes and downhole tools.
    상세보기
  112. Peters, Volker; Benedict, Detlev; Buda, Robert; Mueller, Stephan; Rahn, Henning; Schulz, Rene, Transmission line for drill pipes and downhole tools.
    상세보기
  113. Hayden, Leonard; Martin, John; Andrews, Mike, Wafer probe.
    상세보기
  114. Hayden,Leonard; Martin,John; Andrews,Mike, Wafer probe.
    상세보기
  115. Hayden,Leonard; Martin,John; Andrews,Mike, Wafer probe.
    상세보기
  116. Schwindt, Randy J.; Harwood, Warren K.; Tervo, Paul A.; Smith, Kenneth R.; Warner, Richard H., Wafer probe station having a skirting component.
    상세보기
  117. Schwindt,Randy J.; Harwood,Warren K.; Tervo,Paul A.; Smith,Kenneth R.; Warner,Richard H., Wafer probe station having a skirting component.
    상세보기
  118. Schwindt,Randy J.; Harwood,Warren K.; Tervo,Paul A.; Smith,Kenneth R.; Warner,Richard H., Wafer probe station having a skirting component.
    상세보기
  119. Harwood, Warren K.; Tervo, Paul A.; Koxxy, Martin J., Wafer probe station having environment control enclosure.
    상세보기
  120. Harwood,Warren K.; Tervo,Paul A.; Koxxy,Martin J., Wafer probe station having environment control enclosure.
    상세보기
  121. Rumsey Roger L., Waterproof high voltage connector.
    상세보기
  122. Campbell, Richard, Wideband active-passive differential signal probe.
    상세보기

관련 콘텐츠

섹션별 컨텐츠 바로가기

AI-Helper ※ AI-Helper는 오픈소스 모델을 사용합니다.

AI-Helper 아이콘
AI-Helper
안녕하세요, AI-Helper입니다. 좌측 "선택된 텍스트"에서 텍스트를 선택하여 요약, 번역, 용어설명을 실행하세요.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.

선택된 텍스트

맨위로