$\require{mediawiki-texvc}$

연합인증

연합인증 가입 기관의 연구자들은 소속기관의 인증정보(ID와 암호)를 이용해 다른 대학, 연구기관, 서비스 공급자의 다양한 온라인 자원과 연구 데이터를 이용할 수 있습니다.

이는 여행자가 자국에서 발행 받은 여권으로 세계 각국을 자유롭게 여행할 수 있는 것과 같습니다.

연합인증으로 이용이 가능한 서비스는 NTIS, DataON, Edison, Kafe, Webinar 등이 있습니다.

한번의 인증절차만으로 연합인증 가입 서비스에 추가 로그인 없이 이용이 가능합니다.

다만, 연합인증을 위해서는 최초 1회만 인증 절차가 필요합니다. (회원이 아닐 경우 회원 가입이 필요합니다.)

연합인증 절차는 다음과 같습니다.

최초이용시에는
ScienceON에 로그인 → 연합인증 서비스 접속 → 로그인 (본인 확인 또는 회원가입) → 서비스 이용

그 이후에는
ScienceON 로그인 → 연합인증 서비스 접속 → 서비스 이용

연합인증을 활용하시면 KISTI가 제공하는 다양한 서비스를 편리하게 이용하실 수 있습니다.

Method and apparatus for measuring the permittivity of materials 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01R-027/04
출원번호 US-0655755 (1991-02-13)
발명자 / 주소
  • Misra Devendra K. (Whitefish Bay WI)
출원인 / 주소
  • The Board of Regents of the University of Wisconsin System (Milwaukee WI 02)
인용정보 피인용 횟수 : 131  인용 특허 : 0

초록

A method and apparatus for determining the permittivity of a sample is disclosed. The method includes applying an AC electrical signal in the microwave frequency range via a coaxial probe having an end position near the sample and measuring the reflection coefficient of the sample. The complex permi

대표청구항

A method for determining the permittivity of a sample using a coaxial probe having a first end positioned at the sample and a second end, comprising the steps of: applying an AC electrical signal in the microwave frequency range to the second end; measuring the resulting reflection coefficient of th

이 특허를 인용한 특허 (131)

  1. Strid, Eric; Gleason, K. Reed, Active wafer probe.
  2. Xiang, Xiao Dong; Gao, Chen; Duewer, Fred; Yang, Hai Tao; Lu, Yalin, Analytical scanning evanescent microwave microscope and control stage.
  3. Xiang, Xiao-Dong; Gao, Chen; Duewer, Fred; Yang, Hai Tao; Lu, Yalin, Analytical scanning evanescent microwave microscope and control stage.
  4. Parsche, Francis Eugene, Apparatus and method for heating material by adjustable mode RF heating antenna array.
  5. Parsche, Francis Eugene, Apparatus and method for heating of hydrocarbon deposits by RF driven coaxial sleeve.
  6. Parsche, Francis Eugene, Apparatus and method for heating of hydrocarbon deposits by axial RF coupler.
  7. Jack R. Little, Jr., Apparatus and method for nondestructive testing of dielectric materials.
  8. Parsche, Francis Eugene, Applicator and method for RF heating of material.
  9. John Hefti, Bio-assay device and test system for detecting molecular binding events.
  10. Brannan, Joseph D., Bipolar electrode probe for ablation monitoring.
  11. Brannan, Joseph D., Bipolar electrode probe for ablation monitoring.
  12. Strid, Eric; Campbell, Richard, Calibration structures for differential signal probing.
  13. Parsche, Francis Eugene, Carbon strand radio frequency heating susceptor.
  14. Parsche, Francis Eugene, Carbon strand radio frequency heating susceptor.
  15. Parsche, Francis Eugene, Carbon strand radio frequency heating susceptor.
  16. Dunklee, John, Chuck for holding a device under test.
  17. Dunklee, John, Chuck for holding a device under test.
  18. Dunklee, John, Chuck for holding a device under test.
  19. Dunklee,John, Chuck for holding a device under test.
  20. Dunklee,John, Chuck for holding a device under test.
  21. Dunklee,John, Chuck for holding a device under test.
  22. Stewart, Craig; Lord, Anthony; Spencer, Jeff; Burcham, Terry; McCann, Peter; Jones, Rod; Dunklee, John; Lesher, Tim; Newton, David, Chuck for holding a device under test.
  23. Stewart,Craig; Lord,Anthony; Spencer,Jeff; Burcham,Terry; McCann,Peter; Jones,Rod; Dunklee,John; Lesher,Tim; Newton,David, Chuck for holding a device under test.
  24. Andrews, Peter; Froemke, Brad; Dunklee, John, Chuck with integrated wafer support.
  25. Andrews,Peter; Froemke,Brad; Dunklee,John, Chuck with integrated wafer support.
  26. John Hefti, Computer program and database structure for detecting molecular binding events.
  27. White, John; Blue, Mark E.; Ehresman, Derik T., Constant specific gravity heat minimization.
  28. Parsche, Francis Eugene, Continuous dipole antenna.
  29. Parsche, Francis E.; Daniel, David M., Control system for extraction of hydrocarbons from underground deposits.
  30. Parsche, Francis Eugene; Daniel, David M., Control system for extraction of hydrocarbons from underground deposits.
  31. Chan Tsing Yee Amy,GB3 ; Odlyha Marianne,GB3 ITX WC1H 0PP, Device and apparatus for measuring dielectric properties of materials.
  32. Parsche, Francis Eugene, Diaxial power transmission line for continuous dipole antenna.
  33. Hernandez, Victor; White, John, Dielectric characterization of bituminous froth.
  34. Campbell, Richard; Strid, Eric W.; Andrews, Mike, Differential signal probe with integral balun.
  35. Strid, Eric; Campbell, Richard, Differential signal probing system.
  36. Campbell, Richard L.; Andrews, Michael, Differential waveguide probe.
  37. Burcham, Terry; McCann, Peter; Jones, Rod, Double sided probing structures.
  38. Burcham,Terry; McCann,Peter; Jones,Rod, Double sided probing structures.
  39. Trautman, Mark; Ehresman, Derik; Edmunds, Neil; Taylor, George; Cimolai, Mauro, Effective solvent extraction system incorporating electromagnetic heating.
  40. Trautman, Mark; Ehresman, Derik; Edmunds, Neil; Taylor, George; Cimolai, Mauro, Effective solvent extraction system incorporating electromagnetic heating.
  41. Trautman, Mark; Ehresman, Derik; Edmunds, Neil; Taylor, George; Cimolai, Mauro, Effective solvent extraction system incorporating electromagnetic heating.
  42. Trautman, Mark; Ehresman, Derik; Edmunds, Neil; Taylor, George; Cimolai, Mauro, Effective solvent extraction system incorporating electromagnetic heating.
  43. Dunklee, John; Norgden, Greg; Cowan, C. Eugene, Guarded tub enclosure.
  44. Parsche, Francis Eugene, Hydrocarbon cracking antenna.
  45. Parsche, Francis Eugene, Hydrocarbon cracking antenna.
  46. Parsche, Francis Eugene, In situ loop antenna arrays for subsurface hydrocarbon heating.
  47. Little, Jr., Jack R., Interferometric localization of irregularities.
  48. Parsche, Francis Eugene, Litz heating antenna.
  49. McFadden,Bruce, Localizing a temperature of a device for testing.
  50. Gleason, K. Reed; Bayne, Michael A.; Smith, Kenneth; Lesher, Timothy; Koxxy, Martin, Membrane probing method using improved contact.
  51. Gleason, Reed; Bayne, Michael A.; Smith, Kenneth; Lesher, Timothy; Koxxy, Martin, Membrane probing method using improved contact.
  52. Gleason, K. Reed; Smith, Kenneth R.; Bayne, Mike, Membrane probing structure with laterally scrubbing contacts.
  53. Gleason, Reed; Bayne, Michael A.; Smith, Kenneth; Lesher, Timothy; Koxxy, Martin, Membrane probing system.
  54. Smith,Kenneth; Gleason,Reed, Membrane probing system.
  55. Smith,Kenneth; Gleason,Reed, Membrane probing system.
  56. Tervo,Paul A.; Smith,Kenneth R.; Cowan,Clarence E.; Dauphinais,Mike P.; Koxxy,Martin J., Membrane probing system.
  57. Gleason, K. Reed; Smith, Kenneth R.; Bayne, Mike, Membrane probing system with local contact scrub.
  58. John Hefti, Method and apparatus for detecting molecular binding events.
  59. Arndt G. Dickey (Friendswood TX) Nguyen Thanh X. (Houston TX) Carl James R. (Houston TX), Method and apparatus for measuring fluid flow.
  60. Eckert Hagen,DEX, Method for determining and compensating the transmission function of a measurement apparatus, in particular of a spectrum analyzer.
  61. Adenot, Anne Lise; Acher, Olivier, Method for determining the permeability of a magnetic material by coaxial line perturbation.
  62. Hayden, Leonard; Martin, John; Andrews, Mike, Method of assembling a wafer probe.
  63. Gleason, Reed; Bayne, Michael A.; Smith, Kenneth, Method of constructing a membrane probe.
  64. Smith, Kenneth R., Method of replacing an existing contact of a wafer probing assembly.
  65. Xie, Cheng-Gang; Segeral, Gerard; Roux, Gilles; Hammond, Paul, Methods and apparatus for estimating on-line water conductivity of multiphase mixtures.
  66. Manley, Prakash; Brannan, Joseph D., Microwave ablation system with dielectric temperature probe.
  67. Manley, Prakash; Brannan, Joseph D., Microwave ablation system with dielectric temperature probe.
  68. Bini, Marco; Ignesti, Amleto; Olmi, Roberto; Pieri, Lapo; Priori, Saverio; Riminesi, Cristiano, Microwave sensor for measuring the moisture of masonry surfaces comprising a microstrip resonator coupled with an open coaxial probe.
  69. Tixier, Sebastien; Hughes, Michael Kon Yew, Multi-frequency microwave sensor for temperature independent measurement of moisture.
  70. Strid,Eric; Campbell,Richard, On-wafer test structures for differential signals.
  71. Parsche, Francis Eugene, Parallel fed well antenna array for increased heavy oil recovery.
  72. Pesach,Benny, Permittivity based temperature measurement and related methods.
  73. Hayden,Leonard; Rumbaugh,Scott; Andrews,Mike, Probe for combined signals.
  74. Hayden,Leonard; Rumbaugh,Scott; Andrews,Mike, Probe for combined signals.
  75. Campbell,Richard L.; Andrews,Michael; Bui,Lynh, Probe for high frequency signals.
  76. Smith, Kenneth; Jolley, Michael; Van Syckel, Victoria, Probe head having a membrane suspended probe.
  77. Smith,Kenneth; Jolley,Michael; Van Syckel,Victoria, Probe head having a membrane suspended probe.
  78. Schwindt,Randy, Probe holder for testing of a test device.
  79. Nordgren, Greg; Dunklee, John, Probe station.
  80. Nordgren, Greg; Dunklee, John, Probe station.
  81. Peters, Ron A.; Hayden, Leonard A.; Hawkins, Jeffrey A.; Dougherty, R. Mark, Probe station having multiple enclosures.
  82. Peters,Ron A.; Hayden,Leonard A.; Hawkins,Jeffrey A.; Dougherty,R. Mark, Probe station having multiple enclosures.
  83. Cowan, Clarence E.; Tervo, Paul A.; Dunklee, John L., Probe station thermal chuck with shielding for capacitive current.
  84. Dunklee,John; Cowan,Clarence E., Probe station with low inductance path.
  85. Lesher, Timothy; Miller, Brad; Cowan, Clarence E.; Simmons, Michael; Gray, Frank; McDonald, Cynthia L., Probe station with low noise characteristics.
  86. Navratil,Peter; Froemke,Brad; Stewart,Craig; Lord,Anthony; Spencer,Jeff; Runbaugh,Scott; Fisher,Gavin; McCann,Pete; Jones,Rod, Probe station with two platens.
  87. Lesher, Timothy E., Probe testing structure.
  88. Smith, Kenneth R.; Hayward, Roger, Probing apparatus with impedance optimized interface.
  89. White, John; Parsche, Francis Eugene; Hernandez, Victor; Ehresman, Derik T.; Blue, Mark E., RF heating to reduce the use of supplemental water added in the recovery of unconventional oil.
  90. White, John; Parsche, Francis Eugene; Hernandez, Victor; Ehresman, Derik T.; Blue, Mark E., RF heating to reduce the use of supplemental water added in the recovery of unconventional oil.
  91. Trautman, Mark; Parsche, Francis Eugene, Radio frequency enhanced steam assisted gravity drainage method for recovery of hydrocarbons.
  92. Trautman, Mark; Parsche, Francis Eugene, Radio frequency enhanced steam assisted gravity drainage method for recovery of hydrocarbons.
  93. Parsche, Francis Eugene, Radio frequency heat applicator for increased heavy oil recovery.
  94. Parsche, Francis Eugene, Radio frequency heat applicator for increased heavy oil recovery.
  95. Parsche, Francis Eugene, Radio frequency heating fork.
  96. Parsche, Francis Eugene, Radio frequency heating of petroleum ore by particle susceptors.
  97. Parsche, Francis Eugene, Radio frequency heating of petroleum ore by particle susceptors.
  98. Fuller Milton E. ; Deamer David W. ; Iverson Mark N. ; Koshy ; deceased Ajit J., Radio frequency spectral analysis for in-vitro or in-vivo environments.
  99. Parsche, Francis Eugene, Reflectometry real time remote sensing for in situ hydrocarbon processing.
  100. Dan Hashimshony IL, Remote resistivity measurement.
  101. Smith, Kenneth R., Replaceable coupon for a probing apparatus.
  102. John Hefti, Resonant bio-assay device and test system for detecting molecular binding events.
  103. Hoclet, Michel, Sensor and assembly for hydrometric measurements.
  104. Arndt,G. Dickey; Carl,James R.; Ngo,Phong H.; Fink,Patrick W.; Siekierski,James D., Sensor and method for detecting a superstrate.
  105. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Shielded probe for high-frequency testing of a device under test.
  106. Gleason, K. Reed; Lesher, Tim; Strid, Eric W.; Andrews, Mike; Martin, John; Dunklee, John; Hayden, Leonard; Safwat, Amr M. E., Shielded probe for testing a device under test.
  107. Gleason,K. Reed; Lesher,Tim; Andrews,Mike; Martin,John, Shielded probe for testing a device under test.
  108. Gleason,K. Reed; Lesher,Tim; Andrews,Mike; Martin,John, Shielded probe for testing a device under test.
  109. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Shielded probe for testing a device under test.
  110. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Shielded probe for testing a device under test.
  111. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Shielded probe with low contact resistance for testing a device under test.
  112. Dunklee,John, Switched suspended conductor and connection.
  113. Hefti, John; Peng, Hong, System and method for detecting and identifying molecular events in a test sample using a resonant test structure.
  114. Strid,Eric W.; Schappacher,Jerry B.; Carlton,Dale E.; Gleason,K. Reed, System for evaluating probing networks.
  115. Andrews, Peter; Hess, David, System for testing semiconductors.
  116. Negishi, Kazuki; Hansen, Mark, Test apparatus for measuring a characteristic of a device under test.
  117. Campbell, Richard, Test structure and probe for differential signals.
  118. Campbell,Richard, Test structure and probe for differential signals.
  119. Rumbaugh,Scott, Thermal optical chuck.
  120. Parsche, Francis Eugene, Triaxial linear induction antenna array for increased heavy oil recovery.
  121. Parsche, Francis Eugene, Twinaxial linear induction antenna array for increased heavy oil recovery.
  122. Hayden, Leonard; Martin, John; Andrews, Mike, Wafer probe.
  123. Hayden,Leonard; Martin,John; Andrews,Mike, Wafer probe.
  124. Hayden,Leonard; Martin,John; Andrews,Mike, Wafer probe.
  125. Schwindt, Randy J.; Harwood, Warren K.; Tervo, Paul A.; Smith, Kenneth R.; Warner, Richard H., Wafer probe station having a skirting component.
  126. Schwindt,Randy J.; Harwood,Warren K.; Tervo,Paul A.; Smith,Kenneth R.; Warner,Richard H., Wafer probe station having a skirting component.
  127. Harwood, Warren K.; Tervo, Paul A.; Koxxy, Martin J., Wafer probe station having environment control enclosure.
  128. Harwood,Warren K.; Tervo,Paul A.; Koxxy,Martin J., Wafer probe station having environment control enclosure.
  129. Hernandez, Victor, Waveguide matching unit having gyrator.
  130. Ghasr, Mohammad Tayeb; Kempin, Matthew; Zoughi, Reza, Waveguide probe for nondestructive material characterization.
  131. Campbell, Richard, Wideband active-passive differential signal probe.
섹션별 컨텐츠 바로가기

AI-Helper ※ AI-Helper는 오픈소스 모델을 사용합니다.

AI-Helper 아이콘
AI-Helper
안녕하세요, AI-Helper입니다. 좌측 "선택된 텍스트"에서 텍스트를 선택하여 요약, 번역, 용어설명을 실행하세요.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.

선택된 텍스트

맨위로