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특허 상세정보

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Calibration method and apparatus for measuring the concentration of components in a fluid

특허상세정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판) G01J-003/32   
미국특허분류(USC) 250/373 ; 250/341 ; 356/436
출원번호 US-0801453 (1991-12-02)
발명자 / 주소
  • Durham Michael D. (Castle Rock CO) Sagan Francis J. (Lakewood CO) Burkhardt Mark R. (Denver CO)
출원인 / 주소
  • ADA Technologies, Inc. (Englewood CO 02)
인용정보 피인용 횟수 : 13  인용 특허 : 30
초록

A calibration method and apparatus for use in measuring the concentrations of components of a fluid is provided. The measurements are determined from the intensity of radiation over a selected range of radiation wavelengths using peak-to-trough calculations. The peak-to-trough calculations are simplified by compensating for radiation absorption by the apparatus. The invention also allows absorption characteristics of an interfering fluid component to be accurately determined and negated thereby facilitating analysis of the fluid.

대표
청구항
▼

A method for substantially negating a measured effect of an interfering component of a sample fluid, comprising the steps of: (a) introducing said interfering component into a chamber; (b) passing radiation through said chamber; (c) flowing into said chamber a diluting fluid; (d) measuring the amount of radiation which passes through said component at a plurality of points in a first wavelength range, wherein said interfering component and at least one other component of the sample fluid to be measured absorb radiation, and at a plurality of points in a ...

이 특허에 인용된 특허 (30)

  1. Endo Ichiro (Yokohama JPX) Sato Yasushi (Kawasaki JPX) Saito Seiji (Yokohama JPX) Nakagiri Takashi (Tokyo JPX) Ohno Shigeru (Tokyo JPX), Bubble jet recording method and apparatus in which a heating element generates bubbles in a liquid flow path to project.
  2. Endo Ichiro (Yokohama JPX) Sato Yasushi (Kawasaki JPX) Saito Seiji (Yokohama JPX) Nakagiri Takashi (Tokyo JPX) Ohno Shigeru (Tokyo JPX), Bubble jet recording method and apparatus in which a heating element generates bubbles in multiple liquid flow paths to.
  3. Fabinski Walter (Hattersheim DEX) Faulhaber Reimar (Frankfurt am Main DEX), Device for determining the nitrogen oxide concentration in a gaseous mixture.
  4. Kaihara Mikio (Tokyo JPX) Mametsuka Hiroaki (Tokyo JPX) Gunji Naoki (Kanagawa JPX) Iwata Hideo (Kanagawa JPX) Gohshi Yohichi (Kanagawa JPX), Dilution material, filter and accessory for measuring infrared spectra.
  5. Tanaka Nobuyoshi (Tokyo JPX) Suzuki Toshiji (Machida JPX) Suzuki Tsuneo (Hiratsuka JPX) Ozaki Masaharu (Yokohama JPX) Sugawa Shigetoshi (Tokyo JPX) Shinohara Mahito (Tokyo JPX), Image sensor device having plural photoelectric converting elements.
  6. Helms Charles C. (Trumbull CT) Conlon Ralph D. (Wilton CT) Delany Edward B. (Ridgefield CT), Instantaneous reading multichannel polychromatic spectrophotometer method and apparatus.
  7. Hopkins ; II George W. (Sunnyvale CA), Mask for spectrophotometer photodiode array having a bridge portion that substantially covers each photodiode.
  8. Nestler Volker (Hamburg DEX) Olsowski Wolfgang (Norderstedt DEX), Method and apparatus for measurement of the concentration of a component of a mixture.
  9. D\Antonio Joseph P. (Woodbury CT), Method of monitoring oxygen concentrations in gas streams.
  10. Ward T. Victor (Thornhill CAX), Monitoring gas and vapor concentrations.
  11. Suzuki Jugoro (Kyoto JPX), Multi-channel spectrophotometric measuring device.
  12. Bibbero ; Robert J., Multigas digital correlation spectrometer.
  13. Conlon Brendan (Elm Grove WI) Dittmar James (Waukesha WI), Multiple component gas analyzer.
  14. Shinohara Mahito (Tokyo JPX) Sugawa Shigetoshi (Atsugi JPX) Hashimoto Seiji (Yokohama JPX) Miyawaki Mamoru (Tokyo JPX), Photoelectric conversion apparatus without isolation regions.
  15. Matsumoto Shigeyuki (Atsugi JPX), Photoelectric conversion device.
  16. Tanaka Nobuyoshi (Tokyo JPX) Nakamura Yoshio (Atsugi JPX) Sugawa Shigetoshi (Atsugi JPX) Ohzu Hayao (Hiratsuka JPX), Photoelectric conversion device with reduced fixed pattern noises.
  17. Ohmi Tadahiro (Sendai JPX) Tanaka Nobuyoshi (Tokyo JPX), Photoelectric converter.
  18. Ohmi Tadahiro (Sendai JPX) Tanaka Nobuyoshi (Tokyo JPX), Photoelectric converter.
  19. Sugawa Shigetoshi (Atsugi JPX) Nakamura Yoshio (Atsugi JPX) Tanaka Nobuyoshi (Tokyo JPX) Ueno Isamu (Atsugi JPX), Photoelectric converting apparatus having carrier eliminating means.
  20. Nakamura Yoshio (Atsugi JPX) Sugawa Shigetoshi (Atsugi JPX), Photoelectric converting apparatus to prevent the outflow of excess carriers.
  21. Matsumoto Shigeyuki (Atsugi JPX) Sugawa Shigetoshi (Atsugi JPX), Photoelectric converting device.
  22. Jackson Ralph Newton (Endicott NY) Kern Richard Wilhelm (Vestal NY) Tong Alvin Hu (Poughkeepsie NY), Self-calibratable spectrum analyzer.
  23. Tanaka Nobuyoshi (Tokyo JPX) Matsumoto Shigeyuki (Atsugi JPX), Semiconductor device and process for producing same.
  24. Ohuchi ; Hirobumi ; Okamura ; Masahiro ; Kawakami ; Sumio ; Ogawa ; Taku zo, Semiconductor photodetector.
  25. McGowan, Gerald F.; Price, Gerald W.; Polhemus, Carl E.; Ketchum, Ronald L., Situ multi-channel combustion gas analyzer.
  26. Takemoto Iwao (Kodaira JPX) Kubo Masaharu (Hachioji JPX) Ohba Shinya (Kokubunji JPX) Tanaka Shuhei (Higashiyamato JPX) Aoki Masakazu (Hachioji JPX), Solid-state imaging device.
  27. Durham Michael D. (Castle Rock CO) Stedman Donald H. (Englewood CO) Ebner Timothy G. (Westminster CO) Burkhardt Mark R. (Englewood CO), Spectrometer for measuring the concentration of components in a fluid stream and method for using same.
  28. Thevenon Alain (Bretigny FRX), Spectrometry device for analyzing polychromatic light.
  29. Owen Theodore R. (Wappingers Falls NY), Spectrophotometer with photodiode array.
  30. Mathisen Einar S. (Poughkeepsie NY) Schumann ; Jr. Paul A. (Wappinger Falls NY) Tong Alvin H. (Poughkeepsie NY), Spectrum analyzing system with photodiode array.

이 특허를 인용한 특허 (13)

  1. Cliche Jean-Fran.cedilla.ois,CAX ; Tetu Michel,CAX ; Latrasse Christine,CAX, Absolute optical frequency calibrator for a variable frequency optical source.
  2. Kamimura, Ippei, Analysis device.
  3. Steuerwald,Ralf; Knoedler,Matthias, Device for photometrically measuring the concentration of a chemical substance in a solution to be measured.
  4. Lawal, Oliver; Ropic, Paul; Haslett, Thomas L., Fluid diagnostic devices and methods of using the same.
  5. Davenport, John; Hodgkinson, Elizabeth Jane; Saffell, John Robert; Tatam, Ralph Peter, Gas analyser.
  6. Gupta, Manish; Leen, J. Brian; Baer, Douglas Steven, Incoherent cavity ringdown spectroscopy gas analyzer coupled with periodic chemical scrubbing.
  7. Harbers, Rik; Schildknecht, Kurt, Increasing the usable dynamic range in photometry.
  8. Wagner John S., Method for identifying known materials within a mixture of unknowns.
  9. Yokoyama Issei,JPX ; Inoue Masaru,JPX, Method of analyzing the concentration of components in a solution.
  10. Andersen Hans Villemoes,DKX ; Kjaer Lisa,DKX ; Hansen Per Waaben,DKX ; Ridder Carsten,DKX, Method of standardizing a spectrometer.
  11. Sawyers, Craig, Multipass spectroscopic absorption cell.
  12. Barshad Yoav (Brookline MA), System and method for monitoring a stack gas.
  13. Wagner John S., System for identifying known materials within a mixture of unknowns.

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