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Low temperature crystallization and patterning of amorphous silicon films on electrically insulating substrates 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H01L-021/324
  • B05D-003/06
출원번호 US-0025710 (1993-03-03)
발명자 / 주소
  • Fonash Stephen J. (State College PA) Liu Gang (Sunnyvale CA)
출원인 / 주소
  • The Penn State Research Foundation (University Park PA 02)
인용정보 피인용 횟수 : 350  인용 특허 : 0

초록

A fabrication process polycrystalline silicon thin film transistors commences with the deposition of an ultra-thin nucleating-site forming layer onto the surface of an insulating substrate (e.g., 7059 glass). Next, an amorphous silicon film is deposited thereover and the combined films are annealed

대표청구항

A method for producing a polycrystalline silicon film on an electrically insulating substrate, comprising the steps of: (a) depositing on said electrically insulating substrate a thin discontinuous film of a nucleating site forming material; (b) depositing an amorphous silicon film on said discontin

이 특허를 인용한 특허 (350)

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  165. Yamaguchi,Naoaki; Tanaka,Koichiro; Teramoto,Satoshi, Optical processing apparatus and optical processing method.
  166. Yamaguchi Naoaki,JPX ; Tanaka Koichiro,JPX ; Teramoto Satoshi,JPX, Optical processing method with control of the illumination energy of laser light.
  167. Lee, Won-Kyu; Yang, Tae-Hoon; Choi, Bo-Kyung; Choo, Byoung-Kwon; Cho, Kyu-Sik; Park, Yong-Hwan; Moon, Sang-Ho; Shin, Min-Chul; Lee, Yun-Gyu; Choi, Joon-Hoo, Organic light emitting display and method of fabricating the same.
  168. Yamazaki Shunpei,JPX, Photoelectric conversion device and method manufacturing same.
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  187. Maekawa Masashi ; Nakata Yukihiko, Selected site, metal-induced, continuous crystallization method.
  188. Maekawa Masashi, Selective silicide thin-film transistor and method for same.
  189. Maekawa Masashi, Selective silicide thin-film transistor having polysilicon active layers with crystallizing metal agent introduced only in the source/drain regions.
  190. Koyama Jun,JPX ; Takemura Yasuhiko,JPX ; Hayakawa Masahiko,JPX ; Yamazaki Shunpei,JPX ; Miyanaga Akiharu,JPX ; Ohtani Hisashi,JPX, Semiconductor active matrix circuit.
  191. Yamazaki, Shunpei; Teramoto, Satoshi; Koyama, Jun; Ogata, Yasushi; Hayakawa, Masahiko; Osame, Mitsuaki; Ohtani, Hisashi; Hamatani, Toshiji, Semiconductor active region of TFTs having radial crystal grains through the whole area of the region.
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  194. Zhang Hongyong,JPX ; Takayama Toru,JPX ; Takemura Yasuhiko,JPX, Semiconductor circuit and method of fabricating the same.
  195. Zhang, Hongyong; Takayama, Toru; Takemura, Yasuhiko, Semiconductor circuit and method of fabricating the same.
  196. Yamazaki Shunpei,JPX ; Teramoto Satoshi,JPX, Semiconductor circuit for electro-optical device and method of manufacturing the same.
  197. Akiharu Mitanaga JP; Hisashi Ohtani JP; Satoshi Teramoto JP, Semiconductor device.
  198. Mitanaga Akiharu,JPX ; Ohtani Hisashi,JPX ; Teramoto Satoshi,JPX, Semiconductor device.
  199. Yamazaki, Shunpei; Yamaguchi, Naoaki; Nakajima, Setsuo, Semiconductor device.
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  201. Yamazaki Shunpei,JPX ; Teramoto Satoshi,JPX ; Koyama Jun,JPX ; Ogata Yasushi,JPX ; Hayakawa Masahiko,JPX ; Osame Mitsuaki,JPX, Semiconductor device and fabrication method thereof.
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  204. Shunpei Yamazaki JP, Semiconductor device and its manufacturing method.
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  206. Yamazaki Shunpei,JPX, Semiconductor device and its manufacturing method.
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  210. Kokubo, Chiho; Shiga, Aiko; Tanada, Yoshifumi; Yamazaki, Shunpei, Semiconductor device and manufacturing method therefor.
  211. Tanaka, Koichiro; Ohnuma, Hideto, Semiconductor device and manufacturing method thereof.
  212. Zhang, Hongyong, Semiconductor device and manufacturing method thereof.
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  216. Satoshi Teramoto JP, Semiconductor device and method for forming the same.
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  221. Yamazaki Shunpei,JPX ; Zhang Hongyong,JPX, Semiconductor device and method for forming the same.
  222. Yamazaki, Shunpei; Zhang, Hongyong; Takemura, Yasuhiko, Semiconductor device and method for forming the same.
  223. Yamazaki,Shunpei; Zhang,Hongyong, Semiconductor device and method for forming the same.
  224. Yamazaki,Shunpei; Zhang,Hongyong, Semiconductor device and method for forming the same.
  225. Koyama Jun,JPX ; Suzawa Hideomi,JPX ; Teramoto Satoshi,JPX, Semiconductor device and method for its fabrication.
  226. Zhang Hongyong,JPX ; Takemura Yasuhiko,JPX ; Takayama Toru,JPX ; Miyanaga Akiharu,JPX ; Ohtani Hisashi,JPX ; Takeyama Junichi,JPX, Semiconductor device and method for its preparation.
  227. Zhang, Hongyong; Takayama, Toru; Takemura, Yasuhiko; Miyanaga, Akiharu; Ohtani, Hisashi; Takeyama, Junichi, Semiconductor device and method for its preparation.
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  229. Adachi Hiroki,JPX ; Takenouchi Akira,JPX ; Fukada Takeshi,JPX ; Uehara Hiroshi,JPX ; Takemura Yasuhiko,JPX, Semiconductor device and method for manufacturing the same.
  230. Adachi Hiroki,JPX ; Takenouchi Akira,JPX ; Fukada Takeshi,JPX ; Uehara Hiroshi,JPX ; Takemura Yasuhiko,JPX, Semiconductor device and method for manufacturing the same.
  231. Akiharu Miyanaga JP; Hisashi Ohtani JP; Satoshi Teramoto JP, Semiconductor device and method for manufacturing the same.
  232. Hiroki Adachi JP; Akira Takenouchi JP; Takeshi Fukada JP; Hiroshi Uehara JP; Yasuhiko Takemura JP, Semiconductor device and method for manufacturing the same.
  233. Hongyong Zhang JP; Hideki Uochi JP; Toru Takayama JP; Takeshi Fukunaga JP; Yasuhiko Takemura JP, Semiconductor device and method for manufacturing the same.
  234. Miyanaga, Akiharu; Ohtani, Hisashi; Takemura, Yasuhiko, Semiconductor device and method for manufacturing the same.
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  237. Takemura Yasuhiko,JPX, Semiconductor device and method for manufacturing the same.
  238. Takemura, Yasuhiko, Semiconductor device and method for manufacturing the same.
  239. Takemura, Yasuhiko, Semiconductor device and method for manufacturing the same.
  240. Takemura, Yasuhiko; Zhang, Hongyong; Konuma, Toshimitsu, Semiconductor device and method for manufacturing the same.
  241. Takemura,Yasuhiko, Semiconductor device and method for manufacturing the same.
  242. Takemura,Yasuhiro, Semiconductor device and method for manufacturing the same.
  243. Zhang Hongyong,JPX ; Uochi Hideki,JPX ; Takayama Toru,JPX ; Fukunaga Takeshi,JPX ; Takemura Yasuhiko,JPX, Semiconductor device and method for manufacturing the same.
  244. Zhang, Hongyong; Uochi, Hideki; Takayama, Toru; Fukunaga, Takeshi; Takemura, Yasuhiko, Semiconductor device and method for manufacturing the same.
  245. Zhang, Hongyong; Uochi, Hideki; Takayama, Toru; Fukunaga, Takeshi; Takemura, Yasuhiko, Semiconductor device and method for manufacturing the same.
  246. Yamazaki, Shunpei; Yamaguchi, Naoaki; Nakajima, Setsuo, Semiconductor device and method for producing it.
  247. Ohtani Hisashi,JPX ; Takemura Yasuhiko,JPX ; Miyanaga Akiharu,JPX ; Yamazaki Shunpei,JPX, Semiconductor device and method for producing the same.
  248. Yamazaki Shunpei,JPX ; Ohtani Hisashi,JPX ; Miyanaga Akiharu,JPX ; Teramoto Satoshi,JPX, Semiconductor device and method for producing the same.
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  252. Shunpei Yamazaki JP; Yasuhiko Takemura JP; Hongyong Zhang JP, Semiconductor device and method of fabricating the same.
  253. Takemura, Yasuhiko, Semiconductor device and method of fabricating the same.
  254. Takemura,Yasuhiko, Semiconductor device and method of fabricating the same.
  255. Yamazaki Shunpei,JPX ; Takemura Yasuhiko,JPX ; Zhang Hongyong,JPX, Semiconductor device and method of fabricating the same.
  256. Yamazaki Shunpei,JPX ; Takemura Yasuhiko,JPX ; Zhang Hongyong,JPX, Semiconductor device and method of fabricating the same.
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  262. Miyanaga, Akiharu; Ohtani, Hisashi; Takemura, Yasuhiko, Semiconductor device and method of manufacturing the same.
  263. Yamazaki, Shunpei, Semiconductor device and method of manufacturing the same.
  264. Yamazaki, Shunpei; Hayakawa, Masahiko, Semiconductor device and method of manufacturing the same.
  265. Zhang Hongyong,JPX, Semiconductor device and method of manufacturing the same.
  266. Zhang Hongyong,JPX, Semiconductor device and method of manufacturing the same.
  267. Zhang, Hongyong, Semiconductor device and method of manufacturing the same.
  268. Zhang,Hongyong, Semiconductor device and method of manufacturing the same.
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  270. Takemura, Yasuhiko; Adachi, Hiroki, Semiconductor device and process for fabricating the same.
  271. Takemura,Yasuhiko; Adachi,Hiroki, Semiconductor device and process for fabricating the same.
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  273. Zhang, Hongyong; Ohnuma, Hideto; Takemura, Yasuhiko, Semiconductor device and process for fabricating the same.
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  275. Shunpei Yamazaki JP; Naoaki Yamaguchi JP; Setsuo Nakajima JP, Semiconductor device comprising a bottom gate type thin film transistor.
  276. Ohtani, Hisashi; Adachi, Hiroki; Miyanaga, Akiharu; Takayama, Toru, Semiconductor device comprising first insulating film, second insulating film comprising organic resin on the first insulating film, and pixel electrode over the second insulating film.
  277. Makita Naoki,JPX ; Funai Takashi,JPX ; Yamamoto Yoshitaka,JPX ; Mitani Yasuhiro,JPX ; Nomura Katsumi,JPX ; Miyamoto Tadayoshi,JPX ; Kosai Takamasa,JPX, Semiconductor device formed within asymetrically-shaped seed crystal region.
  278. Hongyong Zhang JP; Toru Takayama JP; Yasuhiko Takemura JP; Akiharu Miyanaga JP; Hisashi Ohtani JP, Semiconductor device forming method.
  279. Zhang Hongyong,JPX ; Takayama Toru,JPX ; Takemura Yasuhiko,JPX ; Miyanaga Akiharu,JPX ; Ohtani Hisashi,JPX, Semiconductor device forming method.
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  281. Yamazaki,Shunpei, Semiconductor device having El layer and sealing material.
  282. Teramoto Satoshi,JPX, Semiconductor device having SiO.sub.x N.sub.y gate insulating film.
  283. Teramoto, Satoshi, Semiconductor device having SiOxNy film.
  284. Teramoto, Satoshi, Semiconductor device having SiOxNy gate insulating film.
  285. Yamazaki Shunpei,JPX ; Takemura Yasuhiko,JPX ; Zhang Hongyong,JPX ; Takayama Toru,JPX ; Uochi Hideki,JPX, Semiconductor device having a catalyst enhanced crystallized layer.
  286. Yamazaki,Shunpei; Teramoto,Satoshi; Koyama,Jun; Ogata,Yasushi; Hayakawa,Masahiko; Osame,Mitsuaki; Ohtani,Hisashi; Hamatani,Toshiji, Semiconductor device having a crystalline semiconductor film.
  287. Takemura Yasuhiko (Kanagawa JPX), Semiconductor device having a crystallized silicon thin film in which the crystallization direction is oriented either v.
  288. Yamazaki Shunpei,JPX ; Teramoto Satoshi,JPX, Semiconductor device having a monocrystalline layer composed of carbon, oxygen, hydrogen and nitrogen atoms.
  289. Takayama Toru (Kanagawa JPX) Zhang Hongyong (Kanagawa JPX) Takemura Yasuhiko (Kanagawa JPX), Semiconductor device having a plurality of crystalline thin film transistors.
  290. Zhang, Hongyong; Kusumoto, Naoto, Semiconductor device having a thin film transistor.
  291. Hayakawa Masahiko,JPX, Semiconductor device having an active layer with separate layers where one of the layers acts as crystal nuclei for the.
  292. Yamazaki, Shunpei; Zhang, Hongyong; Takemura, Yasuhiko, Semiconductor device having an aluminum nitride film.
  293. Zhang, Hongyong; Takayama, Toru, Semiconductor device having channel formation region comprising silicon and containing a group IV element.
  294. Zhang Hongyong,JPX, Semiconductor device having improved crystal orientation.
  295. Zhang Hongyong,JPX, Semiconductor device having improved crystal orientation.
  296. Yamazaki, Shunpei; Teramoto, Satoshi, Semiconductor device having parallel thin film transistors.
  297. Yamazaki, Shunpei; Adachi, Hiroki; Kuwabara, Hideaki, Semiconductor device having semiconductor circuit comprising semiconductor element, and method for manufacturing same.
  298. Yamazaki, Shunpei; Teramoto, Satoshi, Semiconductor device having thin film transistor.
  299. Yamazaki Shunpei (Tokyo JPX) Teramoto Satoshi (Kanagawa JPX), Semiconductor device including a silicon film having an irregular surface.
  300. Yamazaki, Shunpei, Semiconductor device including semiconductor circuit made from semiconductor element and manufacturing method thereof.
  301. Zhang,Hongyong; Takayama,Toru; Takemura,Yasuhiko; Miyanaga,Akiharu; Ohtani,Hisashi, Semiconductor device structure.
  302. Ohtani,Hisashi; Miyanaga,Akiharu; Zhang,Hongyong; Yamaguchi,Naoaki, Semiconductor device with residual nickel from crystallization of semiconductor film.
  303. Takayama Toru,JPX ; Takemura Yasuhiko,JPX, Semiconductor device/circuit having at least partially crystallized semiconductor layer.
  304. Yamazaki,Shunpei; Ohtani,Hisashi; Hiroki,Masaaki; Tanaka,Koichiro; Shiga,Aiko; Akiba,Mai, Semiconductor fabricating apparatus.
  305. Yamazaki, Shunpei; Teramoto, Satoshi; Koyama, Jun; Miyanaga, Akiharu, Semiconductor film having a single-crystal like region with no grain boundary.
  306. Shunpei Yamazaki JP; Hisashi Ohtani JP; Hideto Ohnuma JP, Semiconductor film manufacturing with selective introduction of crystallization promoting material.
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  308. Yamazaki,Shunpei; Koyama,Jun; Miyanaga,Akiharu; Fukunaga,Takeshi, Semiconductor thin film and method of manufacturing the same and semiconductor device and method of manufacturing the same.
  309. Hisashi Ohtani JP; Akiharu Miyanaga JP; Takeshi Fukunaga JP; Hongyong Zhang JP, Semiconductor thin film transistor with crystal orientation.
  310. Yamazaki Shunpei (Tokyo JPX) Takemura Yasuhiko (Kanagawa JPX) Zhang Hongyong (Kanagawa JPX) Takayama Toru (Kanagawa JPX) Uochi Hideki (Atsugi JPX), Semiconductor, semiconductor device, and method for fabricating the same.
  311. Yamazaki Shunpei (Tokyo JPX) Takemura Yasuhiko (Kanagawa JPX) Zhang Hongyong (Kanagawa JPX) Takayama Toru (Kanagawa JPX) Uochi Hideki (Atsugi JPX), Semiconductor, semiconductor device, and method for fabricating the same.
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  314. Yamazaki,Shunpei; Takemura,Yasuhiko; Zhang,Hongyong; Takayama,Toru; Uochi,Hideki, Semiconductor, semiconductor device, and method for fabricating the same.
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  316. McCarthy, Anthony M., Silicon on insulator self-aligned transistors.
  317. Maekawa, Masashi; Nakata, Yukihiko, Single crystal TFT from continuous transition metal delivery method.
  318. Masashi Maekawa JP; Yukihiko Nakata, Single crystal TFT from continuous transition metal delivery method.
  319. Konuma,Toshimitsu, Solution applying apparatus and method.
  320. Konuma Toshimitsu,JPX, Solution applying method.
  321. Yamazaki Shunpei,JPX ; Miyanaga Akiharu,JPX ; Koyama Jun,JPX ; Fukunaga Takeshi,JPX, Thin film semiconductor and method for manufacturing the same, semiconductor device and method for manufacturing the sa.
  322. Shunpei Yamazaki JP; Akiharu Miyanaga JP; Jun Koyama JP; Takeshi Fukunaga JP, Thin film semiconductor and method for manufacturing the same, semiconductor device and method for manufacturing the same.
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  324. Kusumoto, Naoto; Takemura, Yasuhiko; Ohtani, Hisashi, Thin film semiconductor device and production method for the same.
  325. Yamazaki Shunpei,JPX ; Teramoto Satoshi,JPX, Thin film semiconductor having a monocrystalline region containing carbon, nitrogen and oxygen and crystallization prom.
  326. Zhang Hongyong (Kanagawa JPX) Uochi Hideki (Kanagawa JPX) Takayama Toru (Kanagawa JPX) Fukunaga Takeshi (Kanagawa JPX) Takemura Yasuhiko (Kanagawa JPX), Thin film transistor.
  327. Seo, Jin-Wook; Lee, Ki-Yong; Yang, Tae-Hoon; Park, Byoung-Keon, Thin film transistor and method of fabricating the same.
  328. Yasuhiko Takemura JP; Hongyong Zhang JP; Satoshi Teramoto JP, Thin film transistor having enhanced field mobility.
  329. Uochi Hideki,JPX ; Takemura Yasuhiko,JPX, Thin film transistor including a catalytic element for promoting crystallization of a semiconductor film.
  330. Zhang Hongyong,JPX ; Takayama Toru,JPX ; Takemura Yasuhiko,JPX, Thin film transistor using a semiconductor film.
  331. Yamazaki Shunpei,JPX ; Teramoto Satoshi,JPX, Thin film type monolithic semiconductor device.
  332. Yamazaki Shunpei,JPX ; Teramoto Satoshi,JPX, Thin film type monolithic semiconductor device.
  333. Yamazaki, Shunpei; Teramoto, Satoshi, Thin film type monolithic semiconductor device.
  334. Yamazaki Shunpei,JPX ; Arai Yasuyuki,JPX, Thin-film photoelectric conversion device and a method of manufacturing the same.
  335. Yamazaki,Shunpei; Arai,Yasuyuki, Thin-film photoelectric conversion device and a method of manufacturing the same.
  336. Zhang Hongyong,JPX ; Takayama Toru,JPX ; Takemura Yasuhiko,JPX, Thin-film transistor and fabrication method for same.
  337. Ohnuma Hideto,JPX ; Yamazaki Shunpei,JPX, Thin-film transistor and semiconductor device using thin-film transistors.
  338. Ohnuma, Hideto; Yamazaki, Shunpei, Thin-film transistor and semiconductor device using thin-film transistors.
  339. Zhang Hongyong,JPX ; Takayama Toru,JPX ; Takemura Yasuhiko,JPX, Thin-film transistor having a catalyst element in its active regions.
  340. Maekawa Masashi, Thin-film transistor polycrystalline film formation by nickel induced, rapid thermal annealing method.
  341. Uochi Hideki,JPX ; Takemura Yasuhiko,JPX, Transistor and method of forming the same.
  342. Zhang Hongyong (Kanagawa JPX) Takayama Toru (Kanagawa JPX) Takemura Yasuhiko (Kanagawa JPX), Transistor and process for fabricating the same.
  343. Zhang Hongyong,JPX ; Takayama Toru,JPX ; Takemura Yasuhiko,JPX, Transistor and process for fabricating the same.
  344. Zhang Hongyong,JPX ; Takayama Toru,JPX ; Takemura Yasuhiko,JPX, Transistor and process for fabricating the same.
  345. Zhang, Hongyong; Takayama, Toru; Takemura, Yasuhiko, Transistor and process for fabricating the same.
  346. Zhang Hongyong,JPX ; Takayama Toru,JPX ; Takemura Yasuhiko,JPX ; Miyanaga Akiharu,JPX ; Ohtani Hisashi,JPX, Transistor and semiconductor device.
  347. Zhang Hongyong,JPX ; Takayama Toru,JPX ; Takemura Yasuhiko,JPX ; Miyanaga Akiharu,JPX ; Ohtani Hisashi,JPX, Transistor and semiconductor device having columnar crystals.
  348. Zhang, Hongyong; Takayama, Toru; Takemura, Yasuhiko; Miyanaga, Akiharu; Ohtani, Hisashi, Transistor and semiconductor device having columnar crystals.
  349. Hideki Uochi JP; Yasuhiko Takemura JP, Transistor device and method of forming the same.
  350. Nanba Norihiro,JPX, Zoom lens and optical apparatus having the same.
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