[특허]Apparatus for efficient transfer of electronic devices

Apparatus for efficient transfer of electronic devices 원문보기

IPC분류정보
국가/구분	United States(US) Patent 등록
국제특허분류(IPC7판)	B65G-037/00
출원번호	US-0932656 (1992-08-19)
발명자 / 주소	Butera Richard R. (Palo Alto CA) Childress Robert S. (Sunnyvale CA) Heydarpour Amin (Mountain View CA) Sagar Jagdish (Chandler AZ)
출원인 / 주소	Intel Corporation (Santa Clara CA 02)
인용정보	피인용 횟수 : 25 인용 특허 : 0

초록 ▼

An apparatus for the fast and efficient transfer of integrated circuits between three locations: an input location, a test site location, and an output location. The apparatus includes a front and a rear work press assembly for transferring integrated circuits between the locations and for applying pressure during testing. The work press assemblies is constructed of a variable length shaft coupled to an arm extension which is coupled to a work press. The work press assemblies can each move between three horizontal positions, a first horizontal position associated with the input location, a second horizontal position associated with the test site location, and a third horizontal position associated with the output location. The work press assemblies move independently of one another. While one work press assembly is applying pressure to an integrated circuit during testing at the test site location, the other work press assembly is transferring a tested integrated to the output location and then move back past the test site location to the input location to pick up an untested integrated circuit. The work press assemblies each move horizontally in a separate but parallel planes to one another so that they may pass each other without colliding.

대표청구항 ▼

An apparatus for the fast and efficient transfer of integrated circuits between three locations, a first input location, a second test site location, and a third output location, wherein each of said three locations reside in a first XY-plane comprising: a first work press assembly for transferring integrated circuits between said three locations and for applying pressure while the integrated circuits are being tested at said test site location, said first work assembly comprising: a variable length shaft; an arm rigidly coupled perpendicularly to said variable length shaft; a work press coupled to said arm; said first work press assembly capable of moving between three horizontal positions, a first position associated with said input location, a second position associated with said test site location, and a third position associated with said output location, said shaft of said first work press assembly located in a second plane whenever said work press assembly is in one of said three positions, said second plane substantially parallel to said first plane; and a second work press assembly for transferring integrated circuit between said locations and for applying pressure to integrated circuits while circuits are being tested at said test site location, said second work press assembly comprising: a variable length shaft; an arm rigidly coupled perpendicular to said variable length shaft; a work press coupled to said arm; said second work press assembly capable of moving between three horizontal positions, a first position associated with said input location, a second position associated with said test site location, and a third position associated with said output location, said variable length shaft of said second work press assembly located in a third plane whenever said second work press assembly is in one of said three positions, wherein said third plane is parallel to said first plane; said first work press assembly capable of moving from said third position associated with said output location to said first position associated with said input location while said second work press assembly is at said second position associated with said test site location, and said second work press assembly capable of moving from said third position associated with said output location to said first position associated with said input location while said first work press assembly is located at said second position associated with said test site location.

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IPC	Description
A	생활필수품
A62	인명구조; 소방(사다리 E06C)
A62B	인명구조용의 기구, 장치 또는 방법(특히 의료용에 사용되는 밸브 A61M 39/00; 특히 물에서 쓰이는 인명구조 장치 또는 방법 B63C 9/00; 잠수장비 B63C 11/00; 특히 항공기에 쓰는 것, 예. 낙하산, 투출좌석 B64D; 특히 광산에서 쓰이는 구조장치 E21F 11/00)
A62B-1/08	.. 윈치 또는 풀리에 제동기구가 있는 것

내보내기 구분	파일저장 인쇄 메일전송
구성항목	기본정보 상세정보 관리번호, 국가코드, 자료구분, 상태, 출원번호, 출원일자, 공개번호, 공개일자, 등록번호, 등록일자, 발명명칭(한글), 발명명칭(영문), 출원인(한글), 출원인(영문), 출원인코드, 대표IPC 관리번호, 국가코드, 자료구분, 상태, 출원번호, 출원일자, 공개번호, 공개일자, 공고번호, 공고일자, 등록번호, 등록일자, 발명명칭(한글), 발명명칭(영문), 출원인(한글), 출원인(영문), 출원인코드, 대표출원인, 출원인국적, 출원인주소, 발명자, 발명자E, 발명자코드, 발명자주소, 발명자 우편번호, 발명자국적, 대표IPC, IPC코드, 요약, 미국특허분류, 대리인주소, 대리인코드, 대리인(한글), 대리인(영문), 국제공개일자, 국제공개번호, 국제출원일자, 국제출원번호, 우선권, 우선권주장일, 우선권국가, 우선권출원번호, 원출원일자, 원출원번호, 지정국, Citing Patents, Cited Patents
저장형식	Text(ASCII format) Excel format PIAS분석(.xls)
메일정보	받는사람 (필수) @ 보내는사람 (선택) @ 제목 내용 KISTI 검색결과 이메일 서비스
안내	총 건의 자료가 검색되었습니다. 다운받으실 자료의 인덱스를 입력하세요. (1-10,000) 검색결과의 순서대로 최대 10,000건 까지 다운로드가 가능합니다. 데이타가 많을 경우 속도가 느려질 수 있습니다.(최대 2~3분 소요) 다운로드 파일은 UTF-8 형태로 저장됩니다. 파일의 내용이 제대로 보이지 않을실 때는 웹브라우저 상단의 보기 -> 인코딩 -> 자동선택 여부를 확인하십시오. ~ Text(ASCII format) Excel format

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Apparatus for efficient transfer of electronic devices 원문보기

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Apparatus for efficient transfer of electronic devices 원문보기

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