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Method for inspecting components having complex geometric shapes 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G06K-009/00
  • G01R-033/00
출원번호 US-0772761 (1991-09-16)
발명자 / 주소
  • Mahdavieh Yaghoub (West Chester OH) Hedengren Kristina H. V. (Schenectady NY)
출원인 / 주소
  • General Electric Company (Cincinnati OH 02)
인용정보 피인용 횟수 : 69  인용 특허 : 0

초록

A method for inspecting a component of a gas turbine engine or the like having a plurality of similarly shaped structural portions, such as the gear teeth of a gear, the dovetail slots of a turbine disk or the like, includes the steps of: scanning a surface of at least one of the similarly shaped st

대표청구항

A method for inspecting a component having a plurality of similarly shaped structural portions, comprising the steps of: (a) scanning a surface of at least one of the similarly shaped structural portions with an eddy current probe means to induce eddy currents in the component; (b) generating a two-

이 특허를 인용한 특허 (69)

  1. Goldfine Neil J. ; Schlicker Darrell E. ; Washabaugh Andrew P., Absolute property measurement with air calibration.
  2. Goldfine,Neil J.; Schlicker,Darrell E.; Washabaugh,Andrew P., Absolute property measurement with air calibration.
  3. Collins, Dennis G., Algorithm to measure symmetry and positional entropy of a data set.
  4. Ouyang, Tianhe; Sun, Yushi, Apparatus and method for eddy-current scanning of a surface to detect cracks and other defects.
  5. Sun, Yushi; Ouyang, Tianhe, Apparatus and method for holding a rotatable eddy-current magnetic probe, and for rotating the probe around a boundary.
  6. Smith, Douglas Raymond; Moser, Stefan Andreas; Jones, Daniel Edward, Apparatus and method for inspecting dovetail slot width for gas turbine engine disk.
  7. Neil J. Goldfine ; James R. Melcher, Apparatus and method for obtaining increased sensitivity, selectivity and dynamic range in property measurement using magnetometers.
  8. Goldfine Neil J. ; Melcher ; deceased James R., Apparatus and methods for obtaining increased sensitivity, selectivity and dynamic range in property measurement using.
  9. Goldfine Neil J. (Newton MA) Melcher ; deceased James R. (late of Lexington MA by Janet D. Melcher ; executrix ), Apparatus and methods for obtaining increased sensitivity, selectivity and dynamic range in property measurement using m.
  10. Goldfine Neil J. ; Melcher James R., Apparatus and methods for obtaining increased sensitivity, selectivity and dynamic range in property measurement using magnetometers.
  11. Goldfine Neil J. ; Clark David C. ; Eckhardt Homer D., Apparatus for measuring bulk materials and surface conditions for flat and curved parts.
  12. Oppenlander Jane E. ; Loomis Kent C. ; Brudnoy David M. ; Levy Arthur J., Automated feature detection and identification in digital point-ordered signals.
  13. Isaacs Ralph G. ; Portaz Joseph M., Computed tomography inspection of composite ply structure.
  14. Wang, Changting; Plotnikov, Yuri Alexeyevich; Godbole, Mandar Diwakar; Sheila-Vadde, Aparna Chakrapani, Eddy current array probe.
  15. Richard L. Trantow ; Francis H. Little ; Gigi O. Gambrell ; John W. Ertel, Eddy current calibration standard.
  16. Suh, Ui Won; Sneed, Jr., Clifford, Eddy current inspection method.
  17. Pisupati,Preeti; Gambrell,Gigi Olive; Mandayam,Shyamsunder Tondanur; Dutta,Amitabha, Eddy current inspection method and system.
  18. Richard L. Trantow, Eddy current inspection probe.
  19. Patton Thadd Clark ; Filkins Robert John ; Fulton James Paul ; Hedengren Kristina Helena Valborg ; Young John David, Finger controlled inspection apparatus.
  20. Patton Thadd Clark ; Filkins Robert John ; Fulton James Paul ; Hedengren Kristina Helena Valborg ; Young John David, Hand-holdable eddy-current probe.
  21. Yeh,Chia Jui, Image processing system with handwriting input function and the method for forming the same.
  22. Goldfine, Neil J.; Schlicker, Darrell E.; Zahn, Markus; Ryan, Wayne D.; Shay, Ian C.; Washabaugh, Andrew, Inspection method using penetrant and dielectrometer.
  23. Wang, Changting; Suh, Ui, Inspection of non-planar parts using multifrequency eddy current with phase analysis.
  24. Fields, Michael Wayne; Dziech, Michael Leonard; Dierdorf, Jon Russel; Mellors, Anthony William; Johnson, James Michael, Internal eddy current inspection.
  25. Goldfine Neil J. ; Schlicker Darrell E. ; Zahn Markus ; Ryan Wayne D., Magnetometer with waveform shaping.
  26. Goldfine Neil J. ; Clark David C. ; Eckhardt Homer D., Meandering winding test circuit.
  27. Wang Yinyan, Measuring surface flatness using shadow moire technology and phase-stepping image processing.
  28. Gieskes, Koenraad, Method and apparatus for applying fluid during a placement cycle.
  29. Nightingale, Gerald B.; Little, Francis Howard; Janning, John C., Method and apparatus for finding anomalies in finished parts and/or assemblies.
  30. Harding,Kevin George; Rebello,Alexander Bernard Flavian; Howard,Donald Robert, Method and apparatus for internal feature reconstruction.
  31. Goldfine, Neil J.; Washabaugh, Andrew P.; Lyons, Robert; Thomas, Zachary; Jablonski, David A.; Martin, Christopher, Method and apparatus for non-destructive evaluation of materials.
  32. Goldfine, Neil J.; Washabaugh, Andrew P.; Lyons, Robert; Thomas, Zachary; Martin, Christopher, Method and apparatus for non-destructive evaluation of materials.
  33. Boenisch, Andreas, Method and apparatus for non-destructive testing.
  34. DeBlock, Mark John; Fife, W. R. Hugh, Method and apparatus for separating electrical runout from mechanical runout.
  35. Nakajima, Tsuyoshi; Takeshi, Masami; Murota, Naoya; Miyahara, Yutaka, Method and system for detecting a defect in projected portions of an object having the projected portions formed in the same shape with a predetermined pitch along an arc.
  36. Sarig, Nimrod, Method and system for detecting defects.
  37. Neil J. Goldfine ; Kevin G. Rhoads ; Karen E. Walrath ; David C. Clark, Method for characterizing coating and substrates.
  38. Jaworowski Mark ; Janowsky Glenn T. ; Weston Charles H., Method for fabricating and inspecting coatings.
  39. Arakawa Akio,JPX ; Tsurumaki Hideyuki,JPX ; Hattori Yoshiaki,JPX ; Kanemoto Shigeru,JPX ; Tai Ichiro,JPX ; Haneda Riyoko,JPX, Method for monitoring equipment state by distribution measurement data, and equipment monitoring apparatus.
  40. Boenisch, Andreas, Method for non-destructive testing of electrically conductive test components employing eddy current probe and rotating magnet to perform partial saturation eddy current test.
  41. Gieskes,Koenraad, Method for rejecting component during a placement cycle.
  42. Neil J. Goldfine ; David C. Clark ; Karen E. Walrath ; Volker Weiss ; William M. Chepolis, Method of detecting widespread fatigue and cracks in a metal structure.
  43. Takada, Hajime; Sugimoto, Ryouichi; Yarita, Ikuo, Method of displaying signal obtained by measuring probe and device therefor.
  44. Suzuki, Tetsuo; Shigematsu, Hideki, Method of sorting out defect-free workpiece.
  45. Roney, Jr.,Robert Martin; Murphy,Thomas Francis, Methods and apparatus for eddy current inspection of metallic posts.
  46. Tenley,Brenda Catherine; Dziech,Michael Leonard; Traxler,Joseph Anthony, Methods and apparatus for inspecting a component.
  47. Suh, Ui Won; Gambrell, Gigi Olive; Ertel, John William; McKnight, William Stewart, Methods and apparatus for testing a component.
  48. Suh, Ui Won; Gambrell, Gigi Olive; McKnight, William; Pisupati, Preeti, Methods and apparatus for testing a component.
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  50. Ingram,Douglas Edward; Little,Francis Howard; Wilkins,Melvin Howard, Methods and system for inspection of fabricated components.
  51. Lange, Steve R.; Marella, Paul Frank; Ceglio, Nat; Hwang, Shiow-Hwei; Fu, Tao-Yi, Methods and systems for inspection of a specimen using different inspection parameters.
  52. Ruzzo,Patsy Augestine; Stewart,Matthew; Mellors,Anthony William, Methods for preparing and testing a thermal-spray coated substrate.
  53. Neil J. Goldfine ; Markus Zahn ; Alexander V. Mamishev ; Darrell E. Schlicker ; Andrew P. Washabaugh, Methods for processing, optimization, calibration and display of measured dielectrometry signals using property estimation grids.
  54. Suh, Ui Won; Gambrell, Gigi Olive; McKnight, William Stewart; Pisupati, Preeti; Mishra, Peyush Kumar; Dewangan, Sandeep Kumar; Wang, Changting, Multi-frequency image processing for inspecting parts having complex geometric shapes.
  55. Hsu David K. ; Barnard Daniel J. ; Peters John J. ; Hudelson Nordica A., Non-destructive inspections and the display of inspection results.
  56. Batzinger, Thomas James; Nath, Shridhar Champaknath; Rose, Curtis Wayne, Omnidirectional eddy current probes, array probes, and inspection systems.
  57. Goldfine, Neil J.; Sheiretov, Yanko K.; Spencer, Floyd W.; Jablonski, David A.; Grundy, David C.; Schlicker, Darrell E., Performance curve generation for non-destructive testing sensors.
  58. Bushman Boyd B., Plume or combustion detection by time sequence differentiation.
  59. Dziech, Michael Leonard; Traxler, Joseph Anthony; Fields, Michael Wayne, Rotor slot bottom inspection apparatus and method.
  60. Neil J. Goldfine ; Darrell E. Schlicker ; Markus Zahn ; Wayne D. Ryan ; Yanko Sheiretov ; Andrew Washabaugh, Segmented field dielectrometer.
  61. Schilling, Jan Christopher, Stator vane and gas turbine engine assembly including same.
  62. Blais, Mario; Roberge, Sylvain, System and method for automated part inspection.
  63. Wang, Changting; Plotnikov, Yury Alexeyevich; Suh, Ui Won; McKnight, William Stewart, System and method for eddy current inspection of parts with complex geometries.
  64. Hedengren Kristina Helena Valborg, System and method for normalizing and calibrating a sensor array.
  65. Crouch, Alfred E.; Goyen, Todd; Porter, Patrick C.; Laughlin, Shawn, System and method for producing color contour maps of surface defects of high pressure pipelines.
  66. Zwemer Dirk A. ; Hassell Patrick B., System for measuring surface flatness using shadow moire technology.
  67. Zwemer,Dirk Adrian; Pan,Jiahui; Petriccione,Gregory James; McCarron,Sean Patrick, Systems and methods for measuring sample surface flatness of continuously moving samples.
  68. Neil J. Goldfine, Test circuit on flexible membrane with adhesive.
  69. Goldfine Neil J., Test material analysis using offset scanning meandering windings.
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