이 특허를 인용한 특허 (124)

1. Kley, Victor B., Active cantilever for nanomachining and metrology.

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2. Kley, Victor B., Active cantilever for nanomachining and metrology.

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3. Kley,Victor B., Active cantilever for nanomachining and metrology.

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4. Kley,Victor B., Active cantilever for nanomachining and metrology.

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5. Xu Shaohua ; Arnsdorf Morton F., Atomic force microscope for biological specimens.

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6. Minne Stephen Charles ; Quate Calvin F. ; Manalis Scott, Atomic force microscope for high speed imaging including integral actuator and sensor.

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7. Sanjay K. Yedur ; Bhanwar Singh ; Bryan K. Choo ; Carmen L. Morales, Cantilever assembly and scanning tip therefor with associated optical sensor.

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8. Bourgoin Jean-Philippe M.,FRX ; Johnson Matthew B. ; Michel Bruno,CHX, Cantilever deflection sensor and use thereof.

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9. Kim, Young Sik; Nam, Hyo Jin, Cantilever for scanning probe microscope.

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10. Itoh Junju (Ibaraki-ken JPX) Toma Yasushi (Ibaraki-ken JPX), Cantilever for use with atomic force microscope and process for the production thereof.

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11. Binnig Gerd Karl,CHX ; Rohrer Heinrich,CHX ; Vettiger Peter,CHX, Cantilever with integrated deflection sensor.

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12. Han Wenhai ; Lindsay Stuart M. ; Jing Tianwei, Cantilevers for a magnetically driven atomic force microscope.

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13. Kim,Hong Koo; Sun,Zhijun; Jung,Yun Suk, Chip-scale optical spectrum analyzers with enhanced resolution.

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14. van der Weide Daniel Warren, Combined topography and electromagnetic field scanning probe microscope.

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15. Feist,Thomas P.; Bushko,Wit C.; Dal,Kevin H.; Furlano,Daniel; Hariharan,Ramesh; Kubotera,Kazunao; Landa,Bernard P.; Subramanian,Suresh; Woods,Joseph T., Data storage media utilizing a substrate including a plastic resin layer, and method thereof.

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16. Kubena, Randall L.; Chang, David T., Dual-wafer tunneling gyroscope and an assembly for making same.

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17. Davis, John E., Embossing methods.

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18. Ebbesen Thomas W. ; Grupp Daniel E. ; Thio Tineke ; Lezec Henri J.,FRX, Enhanced optical transmission apparatus utilizing metal films having apertures and periodic surface topography.

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19. Thio, Tineke; Linke, Richard A.; Pellerin, Kelly M.; Ebbesen, Thomas W.; Lezec, Henri J., Enhanced optical transmission apparatus with improved aperture geometry.

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20. Kim Tae Jin ; Krishnan Ajit ; Thio Tineke ; Lezec Henri Joseph,FRX ; Ebbesen Thomas W.,FRX, Enhanced optical transmission apparatus with improved inter-surface coupling.

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21. Kley, Victor B., Fluid delivery for scanning probe microscopy.

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22. Kley,Victor B., Fluid delivery for scanning probe microscopy.

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23. Lindsay Stuart M. (Tempe AZ), Formation of a magnetic film on an atomic force microscope cantilever.

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24. Schneider, Thomas D., High speed parallel molecular nucleic acid sequencing.

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25. Schneider,Thomas D.; Rubens,Denise, High speed parallel molecular nucleic acid sequencing.

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26. Wise, Richard S.; Deshpande, Sadanand V.; Yan, Wendy; Allen, Soctt D.; Mahorowala, Arpan P., In-situ plasma etch for TERA hard mask materials.

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27. Kley, Victor B., Low-friction moving interfaces in micromachines and nanomachines.

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28. Han Wenhai ; Lindsay Stuart M. ; Jing Tianwei, Magnetic modulation of force sensor for AC detection in an atomic force microscope.

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29. Chou Rou-Fu,TWX ; Hsu Wen-Syang,TWX ; Lo Shih-Che,TWX ; Lin Hsi-Fu,TWX, Manufacturing method for planar microprobe including electrostatic actuator using sacrificial layer technology.

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30. Kley, Victor B., Manufacturing of micro-objects such as miniature diamond tool tips.

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31. Olin,H��kan; Svensson,Krister; Althoff,Fredrik; Danilov,Andrey, Measurement device for electron microscope.

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32. Kim,Hong Koo; Sun,Zhijun; Capelli,Christopher C., Metallic nano-optic lenses and beam shaping devices.

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33. Kim,Hong Koo; Sun,Zhijun; Capelli,Christopher C., Metallic nano-optic lenses and beam shaping devices.

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34. Phillips, Edward Alan; Wyeth, Newell Convers, Method and apparatus for controlling the focus of a read/write head for an optical scanner.

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35. Van Berkel, Koos; Akbulut, Duygu; Van De Wijdeven, Jeroen Johan Maarten; Zijp, Ferry, Method and apparatus for inspection and metrology.

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36. Kley, Victor B., Method and apparatus for micromachines, microstructures, nanomachines and nanostructures.

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37. Kley, Victor B., Method and apparatus for micromachines, microstructures, nanomachines and nanostructures.

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38. Kley,Victor B., Method and apparatus for micromachines, microstructures, nanomachines and nanostructures.

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39. Kley, Victor B., Method and apparatus for scanning in scanning probe microscopy and presenting results.

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40. Kley,Victor B., Method and apparatus for scanning in scanning probe microscopy and presenting results.

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41. Kley, Victor B.; LoBianco, Robert T., Method and apparatus for tool and tip design for nanomachining and measurement.

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42. Bernard, Andre; Biebuyck, Hans; Delamarche, Emmanuel; Michel, Bruno; Schmid, Heinz, Method and device for identification of a substance.

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43. Kuroda Ryo,JPX ; Shimada Yasuhiro,JPX, Method and producing probe with minute aperture, scanning near-field optical microscope using the probe and recording and/or reproducing apparatus using the probe.

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44. Manalis Scott R. ; Minne Stephen C. ; Quate Calvin F., Method for making nitride cantilevers devices.

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45. Soh Hyongsok (Stanford CA) Minne Stephen C. (Danville IL) Quate Calvin F. (Stanford CA), Method of etching a pattern on a substrate using a scanning probe microscope.

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46. Quate Calvin F., Method of fabricating an aperture for a near field scanning optical microscope.

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47. Celotta Robert J. ; McClelland Jabez J. ; Gupta Rajeev ; Craighead Harold, Method of fabricating of structures by metastable atom impact desorption of a passivating layer.

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48. Minne Stephen Charles ; Soh Hyongsok ; Quate Calvin F., Method of fabricating transistor or other electronic device using scanning probe microscope.

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49. Kubena, Randall L.; Chang, David T., Method of manufacturing a dual wafer tunneling gyroscope.

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50. Feist, Thomas P.; Bushko, Wit C.; Cole, Herbert S.; Davis, John E.; Gorczyca, Thomas B.; Woods, Joseph T., Methods for making data storage media.

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51. Mirkin, Chad A.; Piner, Richard; Hong, Seunghun, Methods utilizing scanning probe microscope tips and products therefor or produced thereby.

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52. Mirkin, Chad A.; Piner, Richard; Hong, Seunghun, Methods utilizing scanning probe microscope tips and products therefor or produced thereby.

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53. Mirkin, Chad A.; Piner, Richard; Hong, Seunghun, Methods utilizing scanning probe microscope tips and products therefor or produced thereby.

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54. Mirkin, Chad A.; Piner, Richard; Hong, Seunghun, Methods utilizing scanning probe microscope tips and products therefor or products thereby.

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55. Sulzbach, Thomas; Engl, Wolfgang; Richter, Christoph, Micro-mechanical component with cantilever integrated electrical functional element.

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56. Kubena, Randall L.; Chang, David T., Microelectromechanical tunneling gyroscope and an assembly for making a microelectromechanical tunneling gyroscope therefrom.

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57. Williams Clayton C ; Davis Robert C ; Neuzil Pavel, Micromachined probes for nanometer scale measurements and methods of making such probes.

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58. Galvin Gregory J. ; Davis Timothy J., Micromachined silicon probe for scanning probe microscopy.

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59. Wang, Weijie; Su, Chanmin, Miniaturized cantilever probe for scanning probe microscopy and fabrication thereof.

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60. Adam Thomas Drobot ; Albert Myron Green ; Edward Alan Phillips ; Robert Courtney White ; Newell Convers Wyeth, Multiple channel scanning device using oversampling and image processing to increase throughput.

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61. Kley,Victor B., Nanomachining method and apparatus.

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62. Kley, Victor B., Nanometer scale data storage device and associated positioning system.

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63. Kley,Victor B., Nanometer scale data storage device and associated positioning system.

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64. Lyakhov, Ilya G.; Schneider, Thomas D.; Needle, Danielle, Nanoprobes for detection or modification of molecules.

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65. Lyakhov, Ilya G.; Schneider, Thomas D.; Needle, Danielle, Nanoprobes for detection or modification of molecules.

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66. Nobuyuki Kasama JP; Yasuyuki Mitsuoka JP; Norio Chiba JP; Takashi Niwa JP; Kunio Nakajima JP; Manabu Oumi JP; Kenji Kato JP; Masataka Shinogi JP, Near field optical memory head.

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67. Kenneth B. Cozier ; Daniel A. Fletcher ; Gordon S. Kino ; Calvin F. Quate ; Hyongsok T. Soh, Near field optical scanning system employing microfabricated solid immersion lens.

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68. Fillard Jean Pierre,FRX ; Castagne Michel,FRX ; Bonnafe Jacques,FRX, Near field sensor with cantilever and tip containing optical path for an evanescent wave.

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69. Niwa, Takashi; Kato, Kenji; Kasama, Nobuyuki; Oumi, Manabu; Mitsuoka, Yasuyuki; Ichihara, Susumu, Near-field optical probe having cantilever and probe formed of transparent material, method for manufacturing near-field optical probe, and optical apparatus having near-field optical probe.

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70. Ebbesen Thomas W. ; Ghaemi Hadi F. ; Thio Tineke ; Wolff Peter A., Near-field scanning optical microscope having a sub-wavelength aperture array for enhanced light transmission.

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71. Kley,Victor B., Object inspection and/or modification system and method.

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72. Park, Kang Ho; Kim, Eun Kyoung; Lee, Sung Q, Optical fiber illuminator, method of fabricating optical fiber illuminator, and optical recording head and optical recording and reading apparatus having the optical fiber illuminator.

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73. Korchev, Yuri Evgenievich; Klenerman, David; Lab, Max Joseph, Optical microscopy and its use in the study of cells.

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74. Yagi Takayuki,JPX ; Ikeda Tsutomu,JPX ; Kuroda Ryo,JPX ; Shimada Yasuhiro,JPX, Optical probe for detecting or irradiating light and near-field optical microscope having such probe and manufacturing method of such probe.

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75. Mitsuoka, Yasuyuki; Chiba, Norio; Kasama, Nobuyuki; Niwa, Takashi; Nakajima, Kunio, Optical probe for proximity field.

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76. Kim Tae Jin ; Thio Tineke ; Ebbesen Thomas Wren, Optical transmission control apparatus utilizing metal films perforated with subwavelength-diameter holes.

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77. Kazuo Sato JP; Mitsuhiro Shikita JP; Kenji Kato JP; Masataka Shinogi JP; Kunio Nakajima JP; Norio Chiba JP; Susumu Ichihara JP; Takashi Niwa JP; Yasayuki Mitsuoka JP; Nobuyuki Kasama JP, Optical waveguide probe and its manufacturing method.

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78. Muramatsu Hiroshi,JPX ; Nakajima Kunio,JPX, Optical waveguide probe and optical system and atomic force microscope using the optical waveguide probe.

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79. Feist,Thomas Paul; Dai,Kevin Hsingtao; Merfeld,Glen David, Poly(arylene ether) data storage media.

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80. Gaitas, Angelo, Polymeric micro-arm apparatus and method to use the same.

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81. Brandenburg,Albrecht, Probe for an optical near field microscope with improved scattered light suppression and method for producing the same.

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82. Yasuhiro Shimada JP; Ryo Kuroda JP, Probe for irradiating with or detecting light and method for manufacturing the same.

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83. Shimada, Yasuhiro; Kuroda, Ryo, Probe with hollow waveguide and method for producing the same.

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84. Shimada,Yasuhiro; Kuroda,Ryo, Probe with hollow waveguide and method for producing the same.

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85. Shimada,Yasuhiro; Kuroda,Ryo, Probe with hollow waveguide and method for producing the same.

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86. Shimada Yasuhiro,JPX ; Kuroda Ryo,JPX, Probe with tip having micro aperture for detecting or irradiating light, near-field optical microscope, recording/reproduction apparatus, and exposure apparatus using the probe, and method of manufac.

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87. Shimada Yasuhiro,JPX ; Kuroda Ryo,JPX, Probe with tip having micro aperture for detecting or irradiating light, near-field optical microscope, recording/reproduction apparatus, and exposure apparatus using the probe, and method of manufac.

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88. Yamada,Tomohiro; Mizutani,Natsuhiko, Probe, near-field light generation apparatus including probe, exposure apparatus, and exposing method using probe.

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89. Haydon Philip G., Probe-type near-field confocal having feedback for adjusting probe distance.

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90. Lapchuk,Anatoliy; Jeong,Ho Seop; Shin,Dong Ik, Pyramid-shaped near field probe using surface plasmon wave.

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91. Brent A. Anderson ; James A. Bruce ; Steven J. Holmes ; Peter H. Mitchell ; Robert A. Myers, SPM base focal plane positioning.

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92. Matsuyama Katsuhiro,JPX ; Takayama Michio,JPX, SPM cantilever and a method for manufacturing the same.

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93. Roessler,Kenneth; Chen,Dong, Scan data collection for better overall data accuracy.

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94. Roessler, Kenneth; Chen, Dong, Scan data collection for better overall data accurancy.

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95. Reuter, Mark C.; Bryce, Brian A.; Ilic, Bojan R.; Tiwari, Sandip, Scanned probe microscopy (SPM) probe having angled tip.

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96. Drobot Adam Thomas ; White Robert Courtney, Scanning device using fiber optic bimorph.

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97. Muramatsu Hiroshi,JPX ; Ataka Tatsuaki,JPX ; Fujihira Masamichi,JPX ; Chiba Norio,JPX, Scanning near-field optic/atomic force microscope.

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98. Kuroda Ryo,JPX ; Shimada Yasuhiro,JPX, Scanning near-field optical microscope using the probe and recording and/or reproducing apparatus using the probe.

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99. Kley,Victor B., Scanning probe microscope assembly.

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100. Kley,Victor B., Scanning probe microscope assembly.

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101. Kley, Vic B., Scanning probe microscope assembly and method for making confocal, spectrophotometric, near-field, and scanning probe measurements and associated images.

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102. Vic B. Kley, Scanning probe microscope assembly and method for making confocal, spectrophotometric, near-field, and scanning probe measurements and associated images.

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103. Vic B. Kley, Scanning probe microscope assembly and method for making confocal, spectrophotometric, near-field, and scanning probe measurements and associated images.

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104. Kley Victor B., Scanning probe microscope assembly and method for making spectrophotometric near-field optical and scanning measurements.

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105. Kley, Victor B., Scanning probe microscope assembly and method for making spectrophotometric, near-field, and scanning probe measurements.

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106. Victor B. Kley, Scanning probe microscope assembly and method for making spectrophotometric, near-field, and scanning probe measurements.

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107. Sanjay K. Yedur ; Bhanwar Singh ; Bryan K. Choo ; Carmen L. Morales, Scanning probe microscope having optical fiber spaced from point of hp.

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108. Hofrichter, Jens; Holzner, Felix; Horst, Folkert; Paul, Philip, Scanning probe microscopy cantilever comprising an electromagnetic sensor.

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109. Kley,Victor B., Scanning probe microscopy inspection and modification system.

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110. Kley,Victor B., Scanning probe microscopy inspection and modification system.

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111. Muramatsu Hiroshi,JPX ; Umemoto Takeshi,JPX, Scanning type near field interatomic force microscope.

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112. Kley, Victor B., Sharpness testing of micro-objects such as miniature diamond tool tips.

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113. Kubena, Randall L.; Little, Michael J.; Hackett, Leroy H., Single crystal dual wafer, tunneling sensor and a method of making same.

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114. Kubena, Randall L.; Chang, David T., Single crystal tunneling sensor or switch with silicon beam structure and a method of making same.

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115. Kubena, Randall L.; Little, Michael J.; Hackett, LeRoy H., Single crystal, dual wafer, tunneling sensor and a method of making same.

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116. Kubena, Randall L.; Chang, David T., Single crystal, dual wafer, tunneling sensor or switch with silicon on insulator substrate and a method of making same.

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117. Kubena,Randall L.; Chang,David T., Single crystal, dual wafer, tunneling sensor or switch with silicon on insulator substrate and a method of making same.

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118. Kubena, Randall L.; Chang, David T., Single crystal, tunneling and capacitive, three-axes sensor using eutectic bonding and a method of making same.

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119. Kubena, Randall L.; Chang, David T., Single crystal, tunneling and capacitive, three-axes sensor using eutectic bonding and a method of making same.

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120. Ebbesen Thomas W. ; Ghaemi Hadi F. ; Thio Tineke ; Wolff Peter A., Sub-wavelength aperture arrays with enhanced light transmission.

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121. Tineke Thio, Surface-plasmon enhanced photovoltaic device.

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122. Lindsay Stuart M. ; Jing Tianwei ; Lyubchenko Yuri L. ; Gall Alexander A., Tip coating system for scanning probe microscopy.

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123. Lindsay Stuart M. (Tempe AZ) Jing Tianwei (Tempe AZ) Lyubchenko Yuri L. (Tempe AZ) Gall Alexander A. (Bothell WA), Tip etching system and method for etching platinum-containing wire.

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124. Minne Stephen Charles ; Quate Calvin F. ; Manalis Scott, Vibrating probe for a scanning probe microscope.

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