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Resist for forming patterns comprising an acid generating compound and a polymer having acid decomposable groups 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G03F-007/023
  • G03F-007/30
출원번호 US-0876457 (1992-04-30)
우선권정보 JP-0128737 (1991-04-30); JP-0276188 (1991-09-30)
발명자 / 주소
  • Hayase Rumiko (Kawasaki JPX) Onishi Yasunobu (Yokohama JPX) Niki Hirokazu (Yokohama JPX) Oyasato Naohiko (Kawaguchi JPX) Kobayashi Yoshihito (Kawasaki JPX) Hayase Shuzi (Kawasaki JPX)
출원인 / 주소
  • Kabushiki Kaisha Toshiba (Kawasaki JPX 03)
인용정보 피인용 횟수 : 50  인용 특허 : 0

초록

Disclosed herein is a resist for forming patterns, which is greatly sensitive to ultraviolet rays an ionizing radiation, and which can therefore form a high-resolution resist pattern if exposed to ultra violet rays or an unionizing radiation. Hence, the resist is useful in a method of manufacturing

대표청구항

A resist for forming patterns, comprising in admixture: (a) an acid-generating compound which generates an acid when exposed to ultraviolet rays or ionizing radiation; and (b) a compound which has an acid decomposable substituent group and which is represented by the following formula (I): [Figure]

이 특허를 인용한 특허 (50)

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