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Process for detecting and mapping dirt on the surface of a photographic element 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01N-021/88
출원번호 US-0934089 (1992-08-21)
발명자 / 주소
  • Gray Robert T. (Rochester NY) Patton David L. (Webster NY)
출원인 / 주소
  • Eastman Kodak Company (Rochester NY 02)
인용정보 피인용 횟수 : 58  인용 특허 : 0

초록

A method and associated apparatus for detecting the amount, size, shape, and location of anomalies, such as dirt and scratches, on the surface of a test photographic element after the application of a cleaning procedure and for objectively determining the effectiveness of the film cleaning devices a

대표청구항

A method for determining the presence of anomalies on the surface of a photographic element having a film grain, said film grain having an essentially Gaussian density distribution, said method comprising the steps of: (a) forming non-enhanced original image data of a sample of the photographic elem

이 특허를 인용한 특허 (58)

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  3. Hirasawa, Toshio, Apparatus for determining the soil degree of printed matter.
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  9. Steinberg, Eran; Prilutsky, Yury; Corcoran, Peter; Bigioi, Petronel; Zamfir, Adrian; Buzuloiu, Vasile; Ursu, Danutz; Zamfir, Marta, Automated statistical self-calibrating detection and removal of blemishes in digital images based on determining probabilities based on image analysis of single images.
  10. Steinberg,Eran; Prilutsky,Yury; Corcoran,Peter; Bigioi,Petronel; Zamfir,Adrian; Buzuloiu,Vasile; Ursu,Danutz; Zamfir,Marta, Automated statistical self-calibrating detection and removal of blemishes in digital images based on determining probabilities based on image analysis of single images.
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