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Electrical interconnect using particle enhanced joining of metal surfaces 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H01R-023/68
출원번호 US-0422546 (1995-04-12)
발명자 / 주소
  • Difrancesco Louis (Hayward CA)
출원인 / 주소
  • Particle Interconnect, Inc. (Hayward CA 02)
인용정보 피인용 횟수 : 43  인용 특허 : 0

초록

A method and apparatus for electrically interconnecting various electronic elements, including circuit components, assemblies, and subassemblies. A particle enhanced material metal contact layer, having a surface, formed on the electronic elements, includes particles of greater hardness disposed on

대표청구항

An apparatus for testing at least one integrated circuit in situ on a silicon wafer, comprising: a probe array having individual interconnect elements for contacting corresponding terminal pads on said integrated circuit, each interconnect element of said probe array having a metal contact layer, in

이 특허를 인용한 특허 (43)

  1. Akram, Salman; Hembree, David R.; Wood, Alan G., Apparatus for forming coaxial silicon interconnects.
  2. Salman Akram ; David R. Hembree ; Alan G. Wood, Apparatus for forming coaxial silicon interconnects.
  3. Breed, David S.; Du Vall, Wilbur E.; Johnson, Wendell C., Automotive electronic safety network.
  4. Breed, David S.; DuVall, Wilbur E.; Johnson, Wendell C.; Sanders, William Thomas, Automotive electronic safety network.
  5. Gilliland, Don Alan; Koschmeder, Max John Christopher; Huettner, Cary Michael, Conductive gasket including internal contact-enhancing strip.
  6. Connie M. Wong ; Michael G. Lee, Conductive interconnect structures and methods for forming conductive interconnect structures.
  7. Rytky, Pekka, Electric circuitry arrangement.
  8. Nelson, John E.; Sherry, Jeffrey C.; Warwick, Brian; Michalko, Gary W., Electrically conductive pins for microcircuit tester.
  9. Bahn, Robert J.; Blum, Fred A.; Neuhaus, Herbert J.; Zou, Bin, Electroless process for the preparation of particle enhanced electric contact surfaces.
  10. Beroz, Masud, Fluid pressure activated electrical contact devices and methods.
  11. Beroz, Masud, Fluid pressure activated electrical contact devices and methods.
  12. Beroz, Masud, Fluid pressure activated electrical contact devices and methods.
  13. Breed, David S.; DuVall, Wilbur E.; Johnson, Wendell C.; Sanders, William Thomas, Integrated occupant protection system.
  14. Cowan, Joseph W., Interconnector and method of connecting probes to a die for functional analysis.
  15. Fisher,Rayette Ann; Burdick, Jr.,William Edward; Rose,James Wilson, Large area transducer array.
  16. Fasano, Benjamin V.; Courtney, Mark G., Method and apparatus for interim assembly electrical testing of circuit boards.
  17. Akram Salman ; Hembree David R. ; Wood Alan G., Method for forming coaxial silicon interconnects.
  18. Akram Salman ; Hembree David R. ; Wood Alan G., Method for forming coaxial silicon interconnects.
  19. Salman Akram ; David R. Hembree ; Alan G. Wood, Method of forming coaxial silicon interconnects.
  20. Fisher, Rayette Ann; Burdick, Jr., William Edward; Rose, James Wilson, Methods of fabricating a large area transducer array.
  21. Hembree, David R.; Hess, Michael E.; Jacobson, John O.; Farnworth, Warren M.; Wood, Alan G., Methods to utilize ultrasonic energy to reduce the initial contact forces in known-good-die or permanent contact systems.
  22. Lee, Michael G.; Wong, Connie M.; Wang, Wen-chou Vincent, Multilayer interconnection and method.
  23. Lykins ; II James L., Rough electrical contact surface.
  24. Hashimoto Nobuaki,JPX, Semiconductor device and method of manufacturing the same, circuit board, and electronic instrument.
  25. Hashimoto, Nobuaki, Semiconductor device and method of manufacturing the same, circuit board, and electronic instrument.
  26. Hashimoto, Nobuaki, Semiconductor device and method of manufacturing the same, circuit board, and electronic instrument.
  27. Hashimoto, Nobuaki, Semiconductor device and method of manufacturing the same, circuit board, and electronic instrument.
  28. Hashimoto,Nobuaki, Semiconductor device and method of manufacturing the same, circuit board, and electronic instrument.
  29. Nobuaki Hashimoto JP, Semiconductor device and method of manufacturing the same, circuit board, and electronic instrument.
  30. Hashimoto, Nobuaki, Semiconductor device with substrate having penetrating hole having a protrusion.
  31. Breed, David S., Single side curtain airbag for vehicles.
  32. Kim Jang Ryeul,KRX, Test board having a plurality of power supply wiring patterns.
  33. Ortiz,Alfred E.; Collins,Joseph, Test system for device and method thereof.
  34. Glovatsky Andrew Z. ; Todd Michael G. ; Van Pham Cuong, Three-dimensional molded sockets for mechanical and electrical component attachment.
  35. David R. Hembree ; Michael E. Hess ; John O. Jacobson ; Warren M. Farnworth ; Alan G. Wood, Utilize ultrasonic energy to reduce the initial contact forces in known-good-die or permanent contact systems.
  36. David R. Hembree ; Michael E. Hess ; John O. Jacobson ; Warren M. Farnworth ; Alan G. Wood, Utilize ultrasonic energy to reduce the initial contact forces in known-good-die or permanent contact systems.
  37. Hembree David R. ; Hess Michael E. ; Jacobson John O. ; Farnworth Warren M. ; Wood Alan G., Utilize ultrasonic energy to reduce the initial contact forces in known-good-die or permanent contact systems.
  38. Hembree David R. ; Hess Michael E. ; Jacobson John O. ; Farnworth Warren M. ; Wood Alan G., Utilize ultrasonic energy to reduce the initial contact forces in known-good-die or permanent contact systems.
  39. Hembree, David R.; Hess, Michael E.; Jacobson, John O.; Farnworth, Warren M.; Wood, Alan G., Utilize ultrasonic energy to reduce the initial contact forces in known-good-die or permanent contact systems.
  40. Breed David S. ; Duvall Wilbur E. ; Johnson Wendell C., Vehicle electrical system.
  41. Breed, David S., Vehicle software upgrade techniques.
  42. Breed, David S., Vehicle software upgrade techniques.
  43. Breed, David S., Vehicle software upgrade techniques.
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