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Local thinning of channel region for ultra-thin film SOI MOSFET with elevated source/drain 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H01L-027/01
  • H01L-027/12
  • H01L-029/76
출원번호 US-0478310 (1995-06-07)
발명자 / 주소
  • Hwang Jeong-Mo (Plano TX)
출원인 / 주소
  • Texas Instruments Incorporated (Dallas TX 02)
인용정보 피인용 횟수 : 74  인용 특허 : 1

초록

An elevated source/drain structure is described in which the channel region is thinned by local oxidation and wet etch while the source/drain region remained thick. This structure achieves source/drain resistances as small as 300 ohm-m

대표청구항

A semiconductor-on-insulator transistor having elevated source/drain regions and a channel, said transistor comprising: a semiconductor substrate; an insulating layer situated on and abutting said semiconductor substrate; a semiconductor layer situated on and abutting said insulating layer, said sem

이 특허에 인용된 특허 (1)

  1. Mano Toshihiko (Suwa JPX) Kodaira Toshimoto (Suwa JPX) Ohshima Hiroyuki (Suwa JPX), Thin film transistor and active matrix assembly including same.

이 특허를 인용한 특허 (74)

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