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In a semiconductor memory device, data required for controlling design margins and access time is stored at a selected fuse ROM array and a vendor test is performed. By using the information obtained by the vendor testing, fuse ROM arrays are programed, so that design margins and access time can be

In a semiconductor memory device, data required for controlling design margins and access time is stored at a selected fuse ROM array and a vendor test is performed. By using the information obtained by the vendor testing, fuse ROM arrays are programed, so that design margins and access time can be easily varied according to semiconductor memory device, thereby enhancing the device performance. Moreover, by additionally adapting a multiplexer, a plurality of fuse ROM arrays can be programmed by using a few pads.

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A semiconductor memory device comprising: a vendor test mode detector for detecting a vendor test mode in response to a row address strobe signal, a column address strobe signal, a write enable signal and a specific address signal, each of which are applied from an external source and outputting a d

A semiconductor memory device comprising: a vendor test mode detector for detecting a vendor test mode in response to a row address strobe signal, a column address strobe signal, a write enable signal and a specific address signal, each of which are applied from an external source and outputting a detect signal in accordance therewith; a vendor test mode selector for selecting a vendor test mode corresponding to an address signal applied from an external source according to the detect signal provided from the vendor test mode detector and outputting a select signal in accordance therewith; a multiplexer for controlling outputs of pad signals applied from an external source according to the select signal provided from the vendor test mode selector; a plurality of fuse ROM arrays being programmed by the signals provided from the multiplexer and outputting programmed data, the plurality of fuse ROM arrays being respectively corresponding in number to the vendor test modes; a decoder for decoding a signal provided from a one of the plurality of fuse ROM arrays in which data of an operational point of a bit line sense amplifier are stored, said bit line sense amplifier being operated in response to a delayed sense amplifier enable signal; a delay means for delaying a sense amplifier enable signal provided from a sense amplifier enabling unit for a predetermined time according to an output signal of the decoder; and a memory cell array for outputting a stored data to the bit line sense amplifier.