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Method of dynamic thresholding for flaw detection in ultrasonic C-scan images 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G06K-009/36
출원번호 US-0341470 (1994-11-17)
발명자 / 주소
  • Gilmore Robert S. (Burnt Hills NY) Howard Patrick J. (Cincinnati OH)
출원인 / 주소
  • General Electric Company (Schenectady NY 02)
인용정보 피인용 횟수 : 19  인용 특허 : 12

초록

The method of producing a binary flaw-no flaw image of an object, including employing an ultrasonic data acquisition system to obtain data values f(i,j) which define a C-scan image (F) of the object, dividing the C-scan image (F) into a plurality of subimages (Gk for k=1,2, . . . ,K), determining re

대표청구항

A method of producing a binary image of an object, the image showing any regions of flaws in the object and any regions in the object without flaws, the method comprising the steps of: ultrasonically scanning an object with sound wave energy; detecting echo signals reflected from the object; determi

이 특허에 인용된 특허 (12)

  1. Hwang Juin-Jet (Redmond WA) Hurt William A. (Issaquah WA) Daigle Ronald E. (Redmond WA), Adaptive temporal filter for ultrasound imaging system.
  2. Moreland John F. (Fairport NY) Stoffel James C. (Rochester NY), Adaptive thresholder.
  3. Stoffel James C. (Rochester NY) Hsing To R. (Sudbury MA) Tandon Jagdish C. (Fairport NY), Adaptive thresholder.
  4. Assael David (Agoura CA) Lincoln Brian (Agoura Hills CA), Adaptive thresholding technique.
  5. Martin, Ronald J., Automated inspection of hot steel slabs.
  6. Miglianico Thierry (4 rue Raie Tortue 91240 Saint-Michel-sur-Orge FRX) Mougel Jean-Francois (6 ; rue Rimbaud 91470 Limours FRX) Papezyk Francois (47 ; rue Molire 91470 Limours FRX) Wident Pierre (12 , Automatic process for identification of defects by ultrasound and corresponding system.
  7. Persoon Eric H. J. (Eindhoven NLX) Abeysekera Ratnayake M. S. S. (Nugegoda LKX), Device for the dynamic adjustment of a black/white discrimination threshold for the processing of images containing grey.
  8. Mishima Tadaaki (Hitachi) Kanasaki Morio (Katsuta) Takatoo Masao (Katsuta) Fujiwara Kazunori (Hitachi) Kobayashi Yoshiki (Hitachi), Method for processing gray scale images and an apparatus thereof.
  9. Herby Grard (Le Kremlin Bicetre FRX) Legall Serge (Paris FRX), Method of automatically extracting a contrasting object in a digital image.
  10. Oyabu Masaaki (Aichi JPX) Sugiura Masamichi (Toyokawa JPX) Hasegawa Hirofumi (Toyokawa JPX) Nakatani Munehiro (Toyokawa JPX), Method of the image processing.
  11. Sauerwein Kurt (Erkrath DEX) Busse Hans P. (Wuppertal DEX) Link Rainer (Kerpen-Horrem DEX) Wiacker Helmut (Hilden DEX) Stapf Christian (Wuppertal DEX) Schulz Rdiger (Wuppertal DEX) Stolzenberg Ekhard, Process and device for detecting and evaluating surface cracks in workpieces.
  12. Dousse Bruno (Basel CHX), Reducing noise in ultrasonic images.

이 특허를 인용한 특허 (19)

  1. Gordon, Grant A.; Hedl, Radek, Automated defect detection of corrosion or cracks using SAFT processed Lamb wave images.
  2. Isaacs Ralph G. ; Portaz Joseph M., Computed tomography inspection of composite ply structure.
  3. Kesler, Joseph M.; Liggett, Uriah M.; Roth, II, Richard A.; Sharp, Thomas D., Managing non-destructive evaluation data.
  4. Kesler, Joseph M.; Liggett, Uriah M.; Roth, II, Richard A.; Sharp, Thomas D., Managing non-destructive evaluation data.
  5. Sharp, Thomas D.; Roth, II, Richard A.; Liggett, Uriah M.; Kesler, Joseph M., Managing non-destructive evaluation data.
  6. Sharp, Thomas D.; Roth, II, Richard A.; Liggett, Uriah M.; Kesler, Joseph M., Managing non-destructive evaluation data.
  7. Kesler, Joseph M.; Sharp, Thomas D.; Liggett, Uriah M.; Bahr, Brian; Hodapp, Chris M.; Coyan, Gary E., Manufacture modeling and monitoring.
  8. Bredt, James F.; Anderson, Timothy; Russell, David B.; Clark, Sarah L.; DiCologero, Matthew J., Material systems and methods of three-dimensional printing.
  9. Ferro, Andrew Frank; Howard, Patrick Joseph, Method and apparatus for inspecting components.
  10. Barrett, Russell A.; Fischer, Jon J.; Garrett, Kenneth E.; Gayle, David M.; Holdeman, Timothy L.; Jundt, Darrell C.; Kitt, Brian R.; Ruebke, Donald D.; Russell, Brett E.; Stewart, Kenneth C.; Welch, , Method and system for providing feedback from a non-destructive inspection of a composite part.
  11. Blixt Christian Bjorn Stefan,SEX ; Blixt Stefan Sven,SEX, Method for transforming a gray-level image into a black-and-white image.
  12. Bredt, James F.; Clark, Sarah L.; Uy, Evert F.; DiCologero, Matthew J.; Anderson, Timothy; Tarkanian, Michael; Williams, Derek X., Methods and compositions for three-dimensional printing of solid objects.
  13. Bredt, James F.; Clark, Sarah L.; Williams, Derek X.; DiCologero, Matthew J., Thermoplastic powder material system for appearance models from 3D printing systems.
  14. Bredt,James F.; Anderson,Timothy C.; Russell,David B., Three dimensional printing material system and method.
  15. Williams, Derek X., Three dimensional printing material system and method using peroxide cure.
  16. Giller, Eugene; Williams, Derek X., Three dimensional printing material system and method using plasticizer-assisted sintering.
  17. Giller, Eugene; Williams, Derek X., Three dimensional printing material system and method using plasticizer-assisted sintering.
  18. Alam, Amir; Bredt, James F.; Clark, Nanette; Flynn, Mary; Sprauer, Jean; Williams, Derek X., Three-dimensional printing material system with improved color, article performance, and ease of use.
  19. Bernard Patrick Bewlay ; John Broddus Deaton, Jr. ; Michael Francis Xavier Gigliotti, Jr. ; Robert Snee Gilmore, Ultrasonic inspection method and system for detecting critical flaws.
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