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Method for diagnosing a remaining lifetime, apparatus for diagnosing a remaining lifetime, method for displaying remaini 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G06F-015/18
출원번호 US-0158439 (1993-11-29)
우선권정보 JP-0063852 (1989-03-17)
발명자 / 주소
  • Ohtsuka Hisao (Hitachi JPX) Utamura Motoaki (Hitachi JPX)
출원인 / 주소
  • Hitachi, Ltd. (Tokyo JPX 03)
인용정보 피인용 횟수 : 47  인용 특허 : 12

초록

In a method for determining a remaining lifetime of an aggregate constructed of a plurality of components and having at least one function, and an apparatus thereof, a first remaining lifetime of the aggregate is acquired based upon experimental aging degradation data on one characteristic of at lea

대표청구항

An expert system for diagnosing a remaining lifetime (L) of an apparatus included in a plant and selecting an apparatus to be inspected, said expert system comprising: an external system interface for taking history data of the plant under on line operation from an external sensor; a terminal system

이 특허에 인용된 특허 (12)

  1. Bellows James C. (Maitland FL) Osborne Robert L. (Winter Springs FL) Gonzalez Avelino J. (Winter Springs FL) Kemper Christian T. (Silver Spring MD), Automated system to prioritize repair of plant equipment.
  2. Palusamy Sam S. (Murrysville PA) Schmertz John C. (Pittsburgh PA) Li Dali (Monroeville PA) Chirigos John N. (Churchill PA) Bond Charles B. (Plum Borough PA) Yang Chuang Y. (Murrysville PA), Cycle monitoring method and apparatus.
  3. Kemper Christian T. (Winter Park FL) Bellows James C. (Seminole FL) Kleinosky Pamela J. (Philadelphia PA), Diagnostic apparatus.
  4. Kemper Christian T. (Winter Park FL) Osborne Robert L. (Winter Springs FL) Bellows James C. (Maitland FL), Diagnostic system and method.
  5. Takeuchi Kenji (Murrysville PA) Gagnon Andre F. (Monroeville PA) Cheung Augustine C. (Murrysville PA) Meyer Philip E. (Penn Hills PA), Expert system for surveillance, diagnosis and prognosis of plant operation.
  6. Kleinschnitz Donald (Melbourne FL), Failure and performance tracking system.
  7. Sakurai Shigeo (Hitachi JPX) Umezawa Sadao (Mito JPX) Usami Saburo (Hitachi JPX) Miyata Hiroshi (Mito JPX) Toriya Hajime (Hitachi JPX) Tsubouchi Kuniyoshi (Mito JPX) Kaneko Ryoichi (Hitachi JPX), Method and apparatus for estimating life expectancy of mechanical structures.
  8. Shine M. Carl (Mountainvew CA), Method of predicting fatigue lifetimes of metallic structures.
  9. McCown Patricia M. (Cresskill NJ) Conway Timothy J. (Highland Park NJ) Jessen Karl M. (Bayonne NJ), Methods and apparatus for monitoring system performance.
  10. Thompson Timothy F. (Pittsburgh PA) Wojcik Robert M. (Greensburg PA), Methods and apparatus for system fault diagnosis and control.
  11. Sakurai Shigeo (Hitachi JPX) Miyata Hiroshi (Mito JPX) Tan Toshimi (Katsuta JPX) Kaneko Ryoichi (Hitachi JPX), System for administering life of plant.
  12. Lawrence Trevor (Coldfield CA GB2) Denaci Edward N. (San Diego CA) Conn William H. (LaMesa CA), Turbine engine monitoring system.

이 특허를 인용한 특허 (47)

  1. Wegerich,Stephan W.; Bell,David R.; Xu,Xiao, Adaptive modeling of changed states in predictive condition monitoring.
  2. Eryurek, Evren; Harris, Stuart; Marschall, Lester (David); Hokeness, Scott Nels, Automatic work order/parts order generation and tracking.
  3. Wegerich, Stephan W., Complex signal decomposition and modeling.
  4. Hogan, James R.; Rivas, Olegario S., Complexity index methodology for the analysis of run life performance.
  5. Carlos M. Talbott, Condition-based prognosis for machinery.
  6. Okada, Hideo, Device and method of calculating a residual value of an apparatus based on a history of use of the apparatus as well as an electrical apparatus including the device.
  7. Wegerich, Stephan W.; Wolosewicz, Andre; Pipke, R. Matthew, Diagnostic systems and methods for predictive condition monitoring.
  8. David B. Board ; Craig Hughes ; Michael Caulfield ; Sylvia Andrews, Distributed stress wave analysis system.
  9. Keyes, IV, Marion A.; Nixon, Mark J.; Blevins, Terrence Lynn, Economic calculations in a process control system.
  10. Keyes, Marion A.; Nixon, Mark J.; Blevins, Terrence Lynn, Economic calculations in a process control system.
  11. Eryurek, Evren; Dewar, Ian Bryce, Fiducial technique for estimating and using degradation levels in a process plant.
  12. Wegerich, Stephan W., Inferential signal generator for instrumented equipment and processes.
  13. Wegerich, Stephan W., Inferential signal generator for instrumented equipment and processes.
  14. Brummel,Hans Gerd, Infrared-based method and apparatus for online detection of cracks in steam turbine components.
  15. Herzog, James P., Kernel-based method for detecting boiler tube leaks.
  16. Allen-Ware, Malcolm S.; Bolam, Ronald J.; Drake, Alan J.; Lefurgy, Charles R.; Linder, Barry P.; Mittl, Steven W.; Rajamani, Karthick, Managing aging of silicon in an integrated circuit device.
  17. F철rster,Karl Heinz; Binder,Josef, Method and apparatus for diagnosing a cyclic system.
  18. Kambli,Sachin; Engelhardt,Jens; Boehm,Christian, Method and apparatus for diagnosing leakage in a fluid power system.
  19. Zombo, Paul J.; Lemieux, Dennis; Diatzikis, Evangelos, Method and apparatus for measuring on-line failure of turbine thermal barrier coatings.
  20. Ahrens,Oliver; Szenn,Otto; Missal,Wjatscheslaw; Forster,Karl Heinz, Method and apparatus for monitoring and determining the functional status of an electromagnetic valve.
  21. Kobayashi, Noboru; Ogawa, Tamotsu; Morooka, Chikara; Matsuoka, Yuki; Oniki, Hideharu, Method for selecting boundary sample, apparatus for selecting boundary sample, storage medium, and system for selecting boundary sample.
  22. Herzog, James P., Method of sequential kernel regression modeling for forecasting and prognostics.
  23. Davis,Tim; Moynihan,Andy; Sparrow,Trevor; Morrison,Robert; Stork,Gary, Method of time-in-service reliability concern resolution.
  24. Bacon, Douglas Carl; Faour, David Anthony; Ruddy, Thomas Aloysius; Hamilton, Jeffrey Scott; Scherluebbe, Mark Kurt Wilhelm; Heuser, Leigh-Ann Darden, Methods and systems for generating a financial report.
  25. Allen-Ware, Malcolm S.; Bolam, Ronald J.; Drake, Alan J.; Lefurgy, Charles R.; Linder, Barry P.; Mittl, Steven W.; Rajamani, Karthick, Monitoring aging of silicon in an integrated circuit device.
  26. Herzog, James P., Monitoring method using kernel regression modeling with pattern sequences.
  27. Board, David B., Multi-function stress wave sensor.
  28. Ranganathan, Parthasarathy; Hamburgen, William; Mayo, Robert N.; Nicholas, Ken, Optimizing lifetime of a display.
  29. Bellows, James C.; Shoemaker, Fred W., Power plant life assessment.
  30. Ridolfo, Charles F., Predictive maintenance display system.
  31. Rud, Jason H., Process variable transmitter with EMF detection and correction.
  32. Clem, Nicholas J., Real time tool erosion prediction monitoring.
  33. Osborn, Brock Estel; Stanard, Christopher Leon; Handkins, David Mark; Hershey, John Erik, Reliability assessment method, apparatus and system for quality control.
  34. Wegerich, Stephan W.; Pipke, Robert Matthew, Residual signal alert generation for condition monitoring using approximated SPRT distribution.
  35. Hines, J. Wesley, Robust distance measures for on-line monitoring.
  36. Balentine, James R.; Dicaire, Andre A.; Scott, Cindy A.; Lattimer, Donald Robert; Schibler, Kenneth; Shepard, John R.; Jundt, Larry O., Software lockout coordination between a process control system and an asset management system.
  37. Board, David B., Stress wave sensor.
  38. Aragones, James Kenneth; Stein, Jeffrey William; Aragones, Amy Victoria; Tucker, William Talbert, System and method for automatically predicting the timing and costs of service events in a life cycle of a product.
  39. Rosenbaum, Rafi; Shohat, Shaul; Fish, Rakefet; Kessler, Judith; Kupeli, Lazars, System and method for device monitoring.
  40. Dubois, Jr.,Andrew J.; Evans,Vaughn Robert; Jensen,David L.; Khabibrakhmanov,Ildar; Restivo,Stephen; Ross,Christopher D.; Yashchin,Emmanuel, System and method for early detection of system component failure.
  41. Aragones, James Kenneth; Stein, Jeffrey William, System and method for predicting the timing of future service events of a product.
  42. Stephenson, Stanley V.; Dant, Ronald Edward; Horinek, Herb John; Phillippi, Max Lynn, System and method for servicing a wellbore.
  43. Siew, Pey Yen; Sandvad, Ingemann Hvas, System for real time supervision of component wear in a wind turbine population.
  44. Herzog, James P., System of sequential kernel regression modeling for forecasting and prognostics.
  45. Schumacher,Mark Stephen, User-viewable relative diagnostic output.
  46. Peterson, Neil J.; Deitz, David L.; Wilson, Grant; Zhou, Ling; Tanyous, Ebtesam S.; Worek, Christopher J.; Nixon, Mark J., Web services-based communications for use with process control systems.
  47. Peterson, Neil J.; Deitz, David L.; Wilson, Grant; Zhou, Ling; Tanyous, Ebtesam S.; Worek, Christopher J.; Nixon, Mark J., Web services-based communications for use with process control systems.
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