초록

Rapid and efficient memory testing is provided by using direct memory access techniques. This hardware-based scheme operates at a considerably faster rate than a software-dependent solution running on a system\s central processor.

대표청구항 ▼

A method for testing a memory system comprising the steps of: (a) initializing, by a processor, a DMA controller and a peripheral controller; (b) in response to the initializing in step (a), writing a test pattern generated by a pattern generator within the peripheral controller to a random access m

A method for testing a memory system comprising the steps of: (a) initializing, by a processor, a DMA controller and a peripheral controller; (b) in response to the initializing in step (a), writing a test pattern generated by a pattern generator within the peripheral controller to a random access memory, writing of the test pattern being controlled by the DMA controller; and, (c) retrieving, from the random access memory to the peripheral controller, the test pattern written into the random access memory in step (b), including the following substep, (c.1) comparing, using a data checker within the peripheral controller, the test pattern as retrieved from the random access memory with the test pattern as generated in step (b) to detect whether any errors have occurred.