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System for measuring the integrity of an electrical contact 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01R-031/02
출원번호 US-0139362 (1993-10-19)
발명자 / 주소
  • Crook David T. (Loveland CO) Keirn Kevin W. (Loveland CO) Cilingiroglu Ugur (Istanbul TRX)
출원인 / 주소
  • Hewlett-Packard Company (Palo Alto CA 02)
인용정보 피인용 횟수 : 10  인용 특허 : 31

초록

Disclosed is a system that determines whether pins of electrical components such as connectors, switches, and sockets are present and properly soldered to a printed circuit board. The system uses an oscillator which supplies a signal, typically ten kilohertz (10 kHz) at 0.2 volts, to the pin under t

대표청구항

A system for measuring the integrity of an electrical contact between an electrical connection pin of an electrical component comprising a plurality of connection pins and a circuit assembly, said system comprising: (a) a signal supply, comprising an output and a common signal return, supplying an e

이 특허에 인용된 특허 (31)

  1. Poduje Noel S. (Needham Heights MA) Mallory Roy S. (Bedford MA), A.C. capacitive gauging system.
  2. Pike Harold L. (R.R. No. 2 ; Box 134 Castle Rock CO 80104) Thomas G. Lamar (368 W. Powers Ave. ; Apt. 201 Littleton CO 80120) Ketchum Ronald L. (3555 S. Pennsylvania Englewood CO 80110) Evans John F., Automatic electronic test equipment and method.
  3. Schaaf Robert L. (Vestal NY) Olsen Floyd W. (Athens PA) Tasillo Edward J. (Newark Valley NY), Capacitance and leakage test method and apparatus.
  4. Riemer Dietrich E. (Auburn WA), Capacitive circuit board testing system and method using a conductive pliant elastomeric reference plane.
  5. Calhoun Jeffrey (Peekskill NY) Zupanski Stanimir T. (Bedford NY), Capacitive probe sensor with reduced effective stray capacitance.
  6. Hoyt Edward S. (Williston VT), Capacitor power probe.
  7. Wixley Frederick J. (Canterbury GB2), Electric circuit testing equipment.
  8. Hascal Marcel (183 Robert Hicks Dr. Willowdale ; Ontario CAX M4R 3R3) Watson Donald A. (R.R. #1 Claremont ; Ontario CAX L0H 1E0) Danielski Andrew (180 Sherwood Ave. Oshawa ; Ontario CAX L1G 3L8) Lope, Electric field strength indicator.
  9. Shah Shirsh J. (114 Olinda Dr. Brea CA 92621) Baran Jozef B. (25919 Redbay Ln. Moreno Valley CA 92388), Electrical field strength sensing probe.
  10. Williams Bruce T. (454 South St. Lockport NY 14094), High speed D.C. non-contacting electrostatic voltage follower.
  11. Cilingiroglu Ugur (College Station TX), Identification of pin-open faults by capacitive coupling through the integrated circuit package.
  12. Crook David T. (Loveland CO) Keirn Kevin W. (Loveland CO) Cilingiroglu Ugur (Goztepe TRX), Identification of pin-open faults by capacitive coupling through the integrated circuit package.
  13. Miller Gabriel L. (Westfield NJ) Wagner Eric R. (South Plainfield NJ), In situ monitoring technique and apparatus for chemical/mechanical planarization endpoint detection.
  14. Peiffer Ronald J. (Fort Collins CO) Crook David T. (Loveland CO), In-circuit transistor beta test and method.
  15. Williamson ; Jr. Eddie L. (Fort Collins CO), Integrated circuit transfer test device system.
  16. Harwood Vance R. (Loveland CO) Keirn Kevin W. (Boulder CO) Keller John J. (Loveland CO) Peiffer Ronald J. (Ft. Collins CO), Integrated circuit transfer test device system utilizing lateral transistors.
  17. Stribling Donald (Colorado Springs CO), Method and apparatus for determining RE gasket shielding effectiveness.
  18. Marek James E. (Cypress TX) Goss Douglas A. (Spring TX), Method and apparatus for determining nets among nodes in a circuit board.
  19. Burr Robert P. (Matinicus ME) Keogh Raymond J. (Huntington NY) Morino Ronald (Sea Cliff NY) Crowell Jonathan C. (Brooklyn NY) Burr James B. (Centerport NY) Christophersen James C. (West Islip NY), Method and apparatus for testing of electrical interconnection networks.
  20. Heumann John M. (Loveland CO) Harwood Vance R. (Amstelveen NLX), Method and apparatus for the detection of leakage current.
  21. Ringleb Diethelm (Andover MA) Schumann Reinhard (Stow MA) Stearns Elsworth (Hudson MA) Stylianos ; Jr. Tom (Acton MA) Sweeney John (Derry NH), Method and on-chip apparatus for continuity testing.
  22. Faran ; Jr. James J. (Lincoln MA) Fichtenbaum Matthew L. (Chelmsford MA) Kabele William C. (Littleton MA), Method of and apparatus for multiplexed automatic testing of electronic circuits and the like.
  23. Long ; Lewis Frank, Network testing method and apparatus.
  24. Webb Larry J. (Phoenix AZ), Non-contact coupling plate for circuit board tester.
  25. Marshall Neil A. (Rancho Palos Verdes CA), Open fault location system for photovoltaic module strings.
  26. Fichtenbaum Matthew L. (Chelmsford MA), Phase change detection method of and apparatus for current-tracing the location of faults on printed circuit boards and.
  27. Walz Dale D. (Colorado Springs CO), Pressure contact for connecting a coaxial shield to a microstrip ground plane.
  28. Sullivan Donald F. (115 Cambridge Road King of Prussia PA 19406), Printed circuit board open circuit tester.
  29. Johnson Ralph (Los Alamitos CA), Surface mountable miniature incandescent light.
  30. Lynch William T. (Summit NJ) Ng Kwok K. (Berkeley Heights NJ), Test circuit for measuring specific contact resistivity of self-aligned contacts in integrated circuits.
  31. Watts Vivian C. (Lydiard Way GBX), Testing electrical circuits.

이 특허를 인용한 특허 (10)

  1. Takahashi Tadashi,JPX, Circuit board inspection apparatus and method.
  2. Richards, Peter W., Compensation for nonlinear variation of gap capacitance with displacement.
  3. Brown, Matthew; Caird, Ross; Hind, Joleen; Chauvin, Jean Guy, Connection integrity monitor for digital selection circuits.
  4. Tsai, Su-Wei; Yeh, Shang-Tsang, Electrical connection defect detection system and method.
  5. Fazzio, Ronald Shane; Buck, Dean C, Method and apparatus for extracting measurement information and setting specifications using three dimensional visualization.
  6. King, Philip N; Crook, David T; McDermid, John Elliott, Multiple axis magnetic test for open integrated circuit pins.
  7. Durham,Michael R.; Higham,Stephen J.; Tupa,Mark D.; Paikattu,Jim, Systems and methods for determining whether a heat sink is installed.
  8. Roland Frech DE; Erich Klink DE; Jochen Supper DE, Testable on-chip capacity.
  9. Chen, Yang-Xin, Testing device and method for SM memory connector.
  10. Takahiro Nagata JP, Waveform observing jig and waveform observing device.
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