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III-V aresenide-nitride semiconductor materials and devices 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H01L-029/205
출원번호 US-0724321 (1996-10-01)
발명자 / 주소
  • Major Jo S. (San Jose CA) Welch David F. (Menlo Park CA) Scifres Donald R. (San Jose CA)
출원인 / 주소
  • SDL, Inc. (San Jose CA 02)
인용정보 피인용 횟수 : 123  인용 특허 : 13

초록

III-V arsenide-nitride semiconductor crystals, methods for producing such crystals and devices employing such crystals. Group III elements are combined with group V elements, including at least nitrogen and arsenic, in concentrations chosen to lattice match commercially available crystalline substra

대표청구항

A III-V compound semiconductor material having at least nitrogen and arsenic disposed at Group V lattice sites wherein concentration of nitrogen to arsenic in said material is either less than about 5% or greater than about 90% comprising misicible regions for said material when utilizing MOCVD, sai

이 특허에 인용된 특허 (13)

  1. Ohba Yasuo (Yokohama JPX) Izumiya Toshihide (Tokyo JPX) Hatano Ako (Tokyo JPX), AlGaN compound semiconductor material.
  2. Khan Muhammad A. (White Bear Lake MN) VanHove James M. (Eagan MN) Olson Donald T. (Circle Pines MN), Aluminum gallium nitride laser.
  3. Arimoto Satoshi (Itami JPX), Crystal growth method.
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  5. Khan Muhammad A. (White Bear Lake MN) Kuznia Jonathon N. (Bloomington MN) Van Hove James M. (Eagan MN), Narrow band algan filter.
  6. Ruehrwein Robert Arthur (181 Hudson Ave. Tenafly NJ 07670), Process for III-V compound epitaxial crystals utilizing inert carrier gas.
  7. Hatano Ako (Tokyo JPX) Izumiya Toshihide (Tokyo JPX) Ohba Yasuo (Yokohama JPX), Semiconductor laser using five-element compound semiconductor.
  8. Ota Hiroyuki (Iruma JPX) Watanabe Atsushi (Iruma JPX), Semiconductor light emitting device.
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  12. Van de Walle Chris (Menlo Park CA) Bour David P. (Cupertino CA), TM-polarized laser emitter using III-V alloy with nitrogen.
  13. Khan M. Asif (Burnsville MN) Schulze Richard G. (Hopkins MN) Skogman Richard A. (Plymouth MN), Tunable cut-off UV detector based on the aluminum gallium nitride material system.

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