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Coating tolerant thermography 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01N-025/72
출원번호 US-0713229 (1996-09-12)
발명자 / 주소
  • Lesniak Jon R.
출원인 / 주소
  • Stress Photonics Inc.
대리인 / 주소
    Lathrop & Clark
인용정보 피인용 횟수 : 15  인용 특허 : 29

초록

Cracks in bridges or other structures are detected by applying a thermal gradient to the test structure in a selected region so heat flows from left to right. A first image of the thermal gradient with heat flowing from left to right is taken and stored for further processing. Next a thermal gradien

대표청구항

[ I claim:] [1.] A method for finding flaws in a structure comprising the steps of:a) selecting a region on the structure to be examined;b) inducing a first flow of heat through the selected region;c) imaging the selected region to form at least a first thermal image after the first flow of heat has

이 특허에 인용된 특허 (29)

  1. Devitt John W. (Loveland OH) Bantel Thomas E. (Cincinnati OH) Sparks Joseph M. (Newport KY) Kania Janet S. (Cincinnati OH), Apparatus and method for detecting fatigue cracks using infrared thermography.
  2. Ishibashi Mitsuru (Chiba-ken JPX) Sasaki Hideyuki (Kanagawa-ken JPX) Nomaki Tatsuo (Kanagawa-ken JPX) Tanaka Akira (Kanagawa-ken JPX) Hasegawa Rei (Kanagawa-ken JPX), Apparatus and method for evaluating orientation film.
  3. Mountain David S. (Waterlooville GBX), Apparatus and method for static stress measurement in an object.
  4. Sapia Mark A. (Canton CT) Clark John G. (Enfield CT), Apparatus for infrared imaging inspections.
  5. Chang David B. (Tustin CA) Shih I-Fu (Los Alamitos CA) Stickney Michael E. (El Toro CA), Automated evaluation of painted surface quality.
  6. Cielo Paolo G. (Montral CAX) Maldague Xavier (Ste-Foy CAX) Krapez Jean C. (Longueuil CAX), Device for subsurface flaw detection in reflective materials by thermal transfer imaging.
  7. Schelten Jakob (Jlich DEX) Kurz Ulrich (Jlich DEX), Device for the reflection of a low-energy ion beam.
  8. Lesniak Jon R. (Madison WI), Differential temperature stress measurement employing array sensor with local offset.
  9. Lesniak Jon R. (Madison WI), Forced-diffusion thermal imaging apparatus and method.
  10. Flint Graham W. (Albuquerque NM) Papazian Harold A. (Littleton CO) Wolfert Ludwig G. (Littleton CO), Infrared scene projector.
  11. Duvent Jean-Louis (Orsay FRX), Infrared thermography system with sensitivity improved by progressive accumulation of image lines.
  12. Murphy John C. (Columbia MD) Cole Raymond C. (Baltimore MD), Laser interferometry detection method/apparatus for buried structure.
  13. Koshihara Toshio (Tokyo JPX) Misawa Rokurou (Tokyo JPX) Sagawa Yuzo (Tokyo JPX) Takehara Kimio (Tokyo JPX), Method for detecting a state of substance existing in pipe.
  14. Matoba Yuji (Tokyo JPX) Koshihara Toshio (Tokyo JPX), Method for detecting thinned out portion on inner surface or outer surface of pipe.
  15. Fishman Iiya M. (558 Cambridge Ave. Palo Alto CA 94306), Method for evaluation of quality of the interface between layer and substrate.
  16. Adams Mark J. (Kennesaw GA) Crisman ; Jr. Elton M. (Blairsville GA), Method of and apparatus for detecting corrosion utilizing infrared analysis.
  17. Adams Mark J. (Kennesaw GA) Crisman ; Jr. Elton M. (St. Cloud FL), Method of and apparatus for thermographic evaluation of spot welds.
  18. Zinkosky Alexander J. (Dearborn MI), Non-destructive method for detecting defects in a workpiece.
  19. Murphy John C. (Columbia MD) Aamodt Leonard C. (Silver Spring MD), Optical beam deflection thermal imaging.
  20. Winschuh Erich (Neu-Insenburg DEX) Petry Harald (Fechingen DEX), Photothermal test process, apparatus for performing the process and heat microscope.
  21. Trotta Patrick A. (Plano TX) McKenney Samuel R. (Dallas TX), Reflective chopper for infrared imaging systems.
  22. Murphy John C. (Ellicott City MD) Aamodt Leonard C. (Silver Spring MD), Self-calibrating photoacoustic apparatus for measuring light intensity and light absorption.
  23. Thomas Robert L. (Huntington Woods MI) Kuo Pao-Kuang (Troy MI) Favro Lawrence D. (Huntington Woods MI), Single beam AC interferometer.
  24. Dautriche Pierre (Claix FRX), Thermal image detector provided with means to eliminate fixed pattern noise.
  25. Thomas Robert L. (Huntington Wood MI) Kuo Pao-Kuang (Troy MI) Favro Lawrence D. (Huntington Wood MI), Thermal wave imaging apparatus.
  26. Thomas Robert L. (Huntington Woods MI) Kuo Pao-Kuang (Troy MI) Favro Lawrence D. (Huntington Woods MI), Thermal wave imaging apparatus.
  27. Crisman ; Jr. Elton M. (Saint Cloud FL), Thermographic evaluation technique.
  28. Faris Gregory W. (Menlo Park CA), Upconverting and time-gated two-dimensional infrared transillumination imaging.
  29. Thomas Robert L. (Huntington Woods MI) Kuo Pao-Kuang (Troy MI) Favro Lawrence D. (Huntington Woods MI), Vector lock-in imaging system.

이 특허를 인용한 특허 (15)

  1. Shepard, Steven; Lhota, James R., Infrared camera measurement correction for pulsed excitation with subframe duration.
  2. Benzerrouk, Souheil; Ludwig, Reinhold; Apelian, Diran, Infrared defect detection system and method for the evaluation of powdermetallic compacts.
  3. Akashi, Yukio; Hashimoto, Kazuaki; Hayashi, Shogo, Infrared-ray thermal image analyzer.
  4. Sun, Jiangang G.; Erdman, Scott M., Method and apparatus for detecting normal cracks using infrared thermal imaging.
  5. Lee, Johnny; Teller, Eric; Patrick, William Graham; Peeters, Eric, Method and apparatus for gesture interaction with a photo-active painted surface.
  6. Lee, Johnny; Teller, Eric; Patrick, William Graham; Peeters, Eric, Method and apparatus for gesture interaction with a photo-active painted surface.
  7. Mahner, Bernward, Method and apparatus for the real time determination of deformation of test pieces.
  8. DiMarzio Don ; Casagrande Louis Gregory ; Clarke James A. ; Silberstein Robert P., Method of spectral nondestructive evaluation.
  9. Lee,Peng, Method to detect termite infestation in a structure.
  10. Lee,Peng; Seddon,Kevin J, Nondestructive residential inspection method and apparatus.
  11. Chang, Tzyy-Shuh, Optical observation device and method for observing articles at elevated temperatures.
  12. Robert R. Alfano ; Ping-Pei Ho, Sub-surface imaging under paints and coatings using early light spectroscopy.
  13. Lee, Johnny; Teller, Eric; Patrick, William G.; Peeters, Eric, System and method of generating images on photoactive surfaces.
  14. Lee,Peng, Termite acoustic detection.
  15. Ringermacher, Harry Israel; Howard, Donald Robert; Knight, Bryon Edward, Thermal imaging method and apparatus for evaluating coatings.
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