이 특허를 인용한 특허 (100)

1. Berger,Harvey L.; Friedberg,Samuel J.; Becker,James C., Adaptive decision regions and metrics.

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2. Aronson,Lewis B.; Hosking,Lucy G.; Case,Daniel; Hahin,Jayne Catherine; Dybsetter,Gerald L., Analog to digital signal conditioning in optoelectronic transceivers.

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3. Nelson, Stephen; Hofmeister, Rudolf J.; Aronson, Lewis, Apparatus, system and methods for modifying operating characteristics of optoelectronic devices.

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4. French,John Sargent; Thompson,William Joseph, Automated system and method for determining the sensitivity of optical components.

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5. French,John Sargent; Thompson,William Joseph, Automated system and method for determining the sensitivity of optical components.

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6. French,John Sargent; Thompson,William Joseph, Automated system and method for optical measurement and testing.

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7. French,John Sargent; Thompson,William Joseph, Automated system and method for optical measurement and testing.

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8. Hofmeister, Rudolf J.; Aronson, Lewis B., Automatic selection of data rate for optoelectronic devices.

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9. Hofmeister,Rudolf J.; Aronson,Lewis B., Automatic selection of data rate for optoelectronic devices.

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10. Morito Ohtani JP; Takao Suzuki JP, Bit error measuring device for modem device and bit error measuring method for the same.

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11. Schnizler, Reiner; Brooks, Paul, Bit error pattern analyzer and method.

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12. Fleischer Reumann,Michael; Schinzel,Peter; Tietz,Guenther, Bit error rate measurement.

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13. Das, Soumava; Panda, Sumit; Ganguly, Pratik, Byte by byte received data integrity check.

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14. Ekkizogloy,Luke M.; Hahin,Jayne C.; Dybsetter,Gerald L.; Nelson,Stephen, Calibration of digital diagnostics information in an optical transceiver prior to reporting to host.

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15. Herzog Werner,DEX, Circuit arrangement for sensing errors in bit patterns.

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16. Kim, Dennis; Zerbe, Jared; Horowitz, Mark; Stonecypher, William, Circuit, apparatus and method for capturing a representation of a waveform from a clock-data recovery (CDR) unit.

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17. Dybsetter,Gerald L.; Hahin,Jayne C., Configurable input/output terminals.

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18. Leibowitz, Brian S.; Garlepp, Bruno W., DFE margin test methods and circuits that decouple sample and feedback timing.

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19. Quinlan, Sion C.; Warner, David J., DVI link with circuit and method for test.

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20. Quinlan,Sion C.; Warner,David J., DVI link with circuit and method for test.

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21. Warner, David J.; Hunt, Ken S.; Lever, Andrew M., DVI link with parallel test data.

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22. Warner, David J.; Hunt, Ken S.; Lever, Andrew M., DVI link with parallel test data.

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23. Warner,David J.; Hunt,Ken S.; Lever,Andrew M., DVI link with parallel test data.

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24. Warner,David J.; Hunt,Ken S.; Lever,Andrew M., DVI link with parallel test data.

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25. Kernchen,Wolfgang; Braunstorfinger,Thomas, Device for generating a digitally modulated test signal.

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26. Ray Noble, Gayle Loretta; Gentieu, Paul, Diagnostics for a serial communications device.

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27. Ray Noble, Gayle Loretta; Gentieu, Paul, Diagnostics for serial communication busses.

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28. Ekkizogloy, Luke M.; Dybsetter, Gerald L.; Hahin, Jayne C.; Nelson, Stephen T., Filtering digital diagnostics information in an optical transceiver prior to reporting to host.

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29. Zhang, Junmou; Chen, Nan; Zhong, Guoan, Frequency sensor for side-channel attack.

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30. Standridge, Roger, Generating traffic from a predetermined amount of processed traffic.

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31. Sluz, Joseph E.; Riggins, II, James L.; Juarez, Juan C.; Young, David W., High speed error detector for fading propagation channels.

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32. Abramovitch, Daniel Y.; Weinstein, Michael J.; Plitschka, Heinz R., Identifying and synchronizing permuted channels in a parallel channel bit error rate tester.

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33. Aronson,Lewis B.; Hosking,Lucy G., Integrated memory mapped controller circuit for fiber optics transceiver.

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34. Ho, Andrew; Stojanovic, Vladimir; Garlepp, Bruno W.; Chen, Fred F., Margin test methods and circuits.

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35. Ho, Andrew; Stojanovic, Vladimir; Garlepp, Bruno W.; Chen, Fred F., Margin test methods and circuits.

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36. Ho, Andrew; Stojanovic, Vladimir; Garlepp, Bruno W.; Chen, Fred F., Margin test methods and circuits.

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37. Ho, Andrew; Stojanovic, Vladimir; Garlepp, Bruno W.; Chen, Fred F., Margin test methods and circuits.

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38. Ho, Andrew; Stojanovic, Vladimir; Garlepp, Bruno W.; Chen, Fred F., Margin test methods and circuits.

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39. Bauman, Donald R., Measuring an error rate in a communication link.

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40. Miller, Martin; Habot, Yaron; Schachner, Joseph; Schnecker, Michael; Pupalaikis, Peter J., Method and apparatus for analyzing serial data streams.

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41. Miller,Martin; Habot,Yaron; Schachner,Joseph; Schnecker,Michael; Pupalaikis,Peter J., Method and apparatus for analyzing serial data streams.

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42. Salant, Lawrence; Campiche, Thierry; Miller, Martin; Schnecker, Michael, Method and apparatus for bit error rate analysis.

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43. Zerbe, Jared; Chau, Pak Shing; Stonecypher, William Franklin, Method and apparatus for evaluating and calibrating a signaling system.

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44. Zerbe, Jared; Chau, Pak Shing; Stonecypher, William Franklin, Method and apparatus for evaluating and optimizing a signaling system.

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45. Zerbe, Jared; Chau, Pak Shing; Stonecypher, William Franklin, Method and apparatus for evaluating and optimizing a signaling system.

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46. Zerbe, Jared; Chau, Pak Shing; Stonecypher, William Franklin, Method and apparatus for evaluating and optimizing a signaling system.

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47. Zerbe, Jared; Chau, Pak Shing; Stonecypher, William Franklin, Method and apparatus for evaluating and optimizing a signaling system.

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48. Zerbe, Jared; Chau, Pak Shing; Stonecypher, William Franklin, Method and apparatus for evaluating and optimizing a signaling system.

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49. Zerbe,Jared; Chau,Pak Shing; Stonecypher,William Franklin, Method and apparatus for evaluating and optimizing a signaling system.

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50. Zerbe,Jared; Chau,Pak Shing; Stonecypher,William Franklin, Method and apparatus for evaluating and optimizing a signaling system.

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51. Zerbe,Jared; Chau,Pak Shing; Stonecypher,William Franklin, Method and apparatus for evaluating and optimizing a signaling system.

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52. Whitby-Strevens, Colin, Method and apparatus for generating jitter test patterns on a high performance serial bus.

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53. Whitby-Strevens, Colin, Method and apparatus for generating jitter test patterns on a high performance serial bus.

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54. Lehmann, Erwin, Method and system for bit error structure measurements of data transmission channels.

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55. Barford, Lee A., Method and system for minimal-time bit-error-rate testing.

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56. Evans,Andrew C., Method for automated at-speed testing of high serial pin count multiple gigabit per second devices.

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57. Huysmans, Marc; Defoort, Frank Cyriel Michel, Method for bit error rate measurements in a cell-based telecommunication system.

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58. Huysmans, Marc; Defoort, Frank Cyriel Michel, Method for bit error rate measurements in a cell-based telecommunication system.

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59. Miller,Martin; Habot,Yaron; Schachner,Joseph; Schnecker,Michael; Pupalaikis,Peter J, Method of analyzing serial data streams.

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60. Aronson, Lewis B.; Hosking, Lucy G., Method of monitoring an optoelectronic transceiver with multiple flag values for a respective operating condition.

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61. Aronson, Lewis B.; Hosking, Lucy G., Method of monitoring an optoelectronic transceiver with multiple flag values for a respective operating condition.

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62. Aronson, Lewis B.; Hosking, Lucy G., Method of monitoring an optoelectronic transceiver with multiple flag values for a respective operating condition.

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63. Hirschmann, Susanne; Zimmermann, Franz-Josef, Method, system and computer program for synchronizing pseudorandom binary sequence modules.

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64. Asmanis, Georgios S., Methods and apparatus for estimating a bit error rate for a communication system.

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65. Evans,Andrew C, Methods used to simultaneously perform automated at-speed testing of multiple gigabit per second high serial pin count devices.

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66. Aronson, Lew; Hosking, Lucy; Matuszkiewicz, Marcin; Hofmeister, Rudy, Network data transmission and diagnostic methods using out-of-band data.

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67. Hofmeister,Rudolf J.; Light,Greta, Optical and electrical channel feedback in optical transceiver module.

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68. Light,Greta L.; Aronson,Lewis B.; Hosking,Lucy G.; Hofmeister,Rudolf J., Optical transceiver and host adapter with memory mapped monitoring circuitry.

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69. Levinson,Frank H.; Farley,Mark, Optoelectronic device capable of participating in in-band traffic.

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70. Hosking,Lucy G.; Stewart,James; Ho,Anthony, Optoelectronic transceiver having dual access to onboard diagnostics.

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71. Hosking,Lucy G.; Stewart,James; Ho,Anthony, Optoelectronic transceiver having dual access to onboard diagnostics.

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72. Aronson, Lewis B.; Hosking, Lucy G., Optoelectronic transceiver with multiple flag values for a respective operating condition.

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73. Aronson, Lew; Hosking, Lucy; Matuszkiewicz, Marcin; Mason, Beck, Out-of-band data communication between network transceivers.

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74. Carlson, Arthur J., PRBS generator selection in modem communication.

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75. De Ruijter, Hendricus, Performing testing in a radio device.

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76. Knopf, Jochen, Position measuring system.

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77. Chen,Angus; Chen,Ray; Chen,Glen, Pre-stored digital word generator.

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78. Ho, Andrew; Stojanovic, Vladimir; Garlepp, Bruno W.; Chen, Fred F., Receiver circuit architectures.

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79. Bristow, Steven R.; Magliocco, Paul; Craighead, Seth W., Semiconductor test system having double data rate pin scrambling.

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80. Fiedler, Alan S., Serial data communication receiver having adaptively minimized capture latch offset voltage.

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81. Rottacker,Markus; Laquai,Bernd; Behrens,Klaus Peter, Source synchronous sampling.

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82. Garlepp,Bruno W., Statistical margin test methods and circuits.

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83. Aronson,Lewis B.; Hosking,Lucy G., System and method for protecting eye safety during operation of a fiber optic transceiver.

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84. Aronson,Lewis B.; Hosking,Stephen G., System and method for protecting eye safety during operation of a fiber optic transceiver.

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85. Fishman,Alex; Haritos,Konstantinos G.; Sung,Paul; Bannikov,Dmitri; Dorofeev,Serguei, System and method of detecting a bit processing error.

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86. Fishman,Alex; Dorofeev,Serguei; Bannikov,Dmitri; Fennelly,Robert Lee; Weber,Andreas; Nagarajan,Subra, System and method of measuring a signal propagation delay.

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87. Fishman, Alex; Haritos, Konstantinos G.; Sung, Paul; Bannikov, Dmitri; Dorofeev, Serguei, System and method of processing a data signal.

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88. Fishman,Alex; Dorofeev,Serguei; Bannikov,Dmitri; Fennelly,Robert Lee; Weber,Andreas; Nagarajan,Subra, System and method of testing a transceiver.

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89. Evans,Andrew C, System for at-speed automated testing of high serial pin count multiple gigabit per second devices.

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90. Aronson, Lewis B., Systems and methods for providing diagnostic information using EDC transceivers.

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91. Chieng,Yew Tai; Ho,Anthony; Hsieh,John; Lei,Chun; Lipson,Jan; Price,Jeff; Weber,Andreas, Systems, devices and methods for temperature-based control of laser performance.

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92. Hofmeister,Rudolf J.; Bench,Samantha R.; Bannikov,Dmitri, Temperature and jitter compensation controller circuit and method for fiber optics device.

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93. Hofmeister,Ruldolf J.; Bench,Samantha R.; Bannikov,Dmitri, Temperature and jitter compensation controller circuit and method for fiber optics device.

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94. Evans,Andrew C, Test head utilized in a test system to perform automated at-speed testing of multiple gigabit per second high serial pin count devices.

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95. Hofmeister, Rudolf J.; Aronson, Lewis B., Transceiver module and integrated circuit with clock and data recovery clock diplexing.

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96. Aronson, Lewis B.; Hofmeister, Rudy; Madden, Christopher; Farley, Mark; Case, Dan; Lenosky, Tom, Transceiver module and integrated circuit with dual eye openers.

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97. Aronson,Lewis B.; Hofmeister,Rudy; Madden,Christopher; Farley,Mark; Case,Dan; Lenosky,Tom, Transceiver module and integrated circuit with dual eye openers.

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98. Aronson, Lewis B.; Hofmeister, Rudy; Madden, Christopher; Farley, Mark; Case, Dan; Lenosky, Tom, Transceiver module and integrated circuit with dual eye openers and integrated loopback and bit error rate testing.

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99. Aronson, Lewis B.; Hofmeister, Rudy; Madden, Christopher; Farley, Mark; Case, Dan; Lenosky, Tom, Transceiver module and integrated circuit with multi-rate eye openers and bypass.

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100. Aronson, Lewis B.; Mason, Thomas Gordon Beck; Zhou, Yuxin; Vu, Huy Anh; Giaretta, Giorgio; Chen, Jiashu, XFP transceiver with 8.5G CDR bypass.

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