$\require{mediawiki-texvc}$

연합인증

연합인증 가입 기관의 연구자들은 소속기관의 인증정보(ID와 암호)를 이용해 다른 대학, 연구기관, 서비스 공급자의 다양한 온라인 자원과 연구 데이터를 이용할 수 있습니다.

이는 여행자가 자국에서 발행 받은 여권으로 세계 각국을 자유롭게 여행할 수 있는 것과 같습니다.

연합인증으로 이용이 가능한 서비스는 NTIS, DataON, Edison, Kafe, Webinar 등이 있습니다.

한번의 인증절차만으로 연합인증 가입 서비스에 추가 로그인 없이 이용이 가능합니다.

다만, 연합인증을 위해서는 최초 1회만 인증 절차가 필요합니다. (회원이 아닐 경우 회원 가입이 필요합니다.)

연합인증 절차는 다음과 같습니다.

최초이용시에는
ScienceON에 로그인 → 연합인증 서비스 접속 → 로그인 (본인 확인 또는 회원가입) → 서비스 이용

그 이후에는
ScienceON 로그인 → 연합인증 서비스 접속 → 서비스 이용

연합인증을 활용하시면 KISTI가 제공하는 다양한 서비스를 편리하게 이용하실 수 있습니다.

Method and apparatus for microlithography 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H01L-021/268
출원번호 US-0581185 (1995-12-29)
발명자 / 주소
  • Baer Stephen C.
인용정보 피인용 횟수 : 29  인용 특허 : 10

초록

In microlithographic systems, adaptedfor economical production of microchips with exceptionally small critical dimensions without exposure of the chip to potentially damaging radiation, wherein a beam of light is focused to a spot in photoresist layer excite a photoactive molecule in the spot, the e

대표청구항

[ I claim:] [1.] In apparatus adapted for photolithography for irradiating a selected region of a radiationally sensitive layer containing a radiationally excitable species, members of said species being adapted, within a brief interval after becoming so excited, to produce a change in at least one

이 특허에 인용된 특허 (10)

  1. Dykes ; Wiley V. ; Oharek ; Frank J., 360.degree. Non-programmed visual system.
  2. Harvey James F. (Maitland FL), Fluorescence quenching technique for scanning visual systems.
  3. Corle Timothy R. (Santa Clara County CA) Kino Gordon S. (Santa Clara County CA) Mansfield Scott M. (San Mateo County CA), Lithography system employing a solid immersion lens.
  4. Swainson Wyn K. (Berkeley CA) Kramer Stephen D. (Oakland CA), Method and media for accessing data in three dimensions.
  5. Strickler James H. (Ithaca NY) Webb Watt W. (Ithaca NY), Method for three dimensional optical data storage and retrieval.
  6. Lewis Aaron (Ithaca NY) Isaacson Michael (Ithaca NY) Betzig R. Eric (Ann Arbor MI) Harootunian Alec (Syracuse NY), Near field scanning optical microscopy.
  7. Spruit Johannes H. M. (Eindhoven NLX) Bouwhuis Gijsbertus (Eindhoven NLX) Holtslag Antonius H. M. (Eindhoven NLX) Van Uijen Cornelis M. J. (Eindhoven NLX), Optical record carrier and method and apparatus for increasing the resolution of information recorded thereon and read t.
  8. De Fornel Frederique (Dijon FRX) Goudonnet Jean-Pierre (Dijon GA FRX) Mantovani James (Stateboro GA), Process and apparatus for optical near field microlithography.
  9. Rentzepis Peter M. (Irvine CA), Three-dimensional optical memory.
  10. Denk, Winfried; Strickler, James P.; Webb, Watt W., Two-photon laser microscopy.

이 특허를 인용한 특허 (29)

  1. Markle, David A.; Jeong, Hwan J.; Petersen, John S., Apparatus and methods for microscopy having resolution beyond the Abbe limit.
  2. Allen, Mark; Book, Wayne J.; Ebert-Uphoff, Imme; Glezer, Ari; Rosen, David W.; Rossignac, Jaroslaw R., Digital clay apparatus and method.
  3. Allen,Mark; Book,Wayne J.; Ebert Uphoff,Imme; Glezer,Ari; Rosen,David W.; Rossignac,Jaroslaw R., Digital clay apparatus and method.
  4. Daniel Pinkel ; Joe Gray ; Donna G. Albertson, High density array fabrication and readout method for a fiber optic biosensor.
  5. Cox, James A.; Chen, Bo Su, High speed optical system.
  6. Daniel, Claus; Blue, Craig A.; Ott, Ronald D., High throughput parallel backside contacting and periodic texturing for high-efficiency solar cells.
  7. Kleppe, Ingo; Netz, Ralf; Kalkbrenner, Thomas; Wolleschensky, Ralf; Novikau, Yauheni, High-resolution scanning microscopy.
  8. Rice Robert Rex ; Zediker Mark Steven ; Hollister Jack Herbert, Incoherent fiber optic laser system.
  9. Kakui, Motoki; Nakamae, Kazuo; Tamaoki, Shinobu, Laser processing method and laser processing device.
  10. Miyanishi, Shintaro; Kojima, Kunio; Katayama, Hiroyuki; Fuji, Hiroshi, Magnetic recording head and magnetic recording device.
  11. Almogy, Gilad, Maskless photon-electron spot-grid array printer.
  12. Hurley, Neil Francis; Zhang, Tuanfeng, Method for characterizing a geological formation traversed by a borehole.
  13. Dirksen,Peter; Juffermans,Casparus Anthonius Henricus; Janssen,Augustus Josephus Elizabeth Maria, Method of and system for determining the aberration of an imaging system test object and detector for use with the method.
  14. Hell, Stefan; Westphal, Volker; Quaas, Norbert, Method of producing spatial fine structures.
  15. Zhang, Tuanfeng; Hurley, Neil Francis; Zhao, Weishu, Method to generate numerical pseudocores using borehole images, digital rock samples, and multi-point statistics.
  16. Hurley, Neil Francis; Zhang, Tuanfeng; Xu, Guangping; Xu, Lili; Slim, Mirna, Method to quantify discrete pore shapes, volumes, and surface areas using confocal profilometry.
  17. Cox,James A.; Chen,Bo Su, Methods for signal transmission in optical fiber.
  18. Iketaki, Yoshinori, Microscopy method and microscope.
  19. Ulrich, Heinrich; Borlinghaus, Rolf, Optical arrangement for transmitting short laser pulses in optical fibers.
  20. Almogy, Gilad, Optical spot grid array printer.
  21. Chen,Bo Su, Optical system with reduced back reflection.
  22. Baer, Stephen C., Single wavelength stimulated emission depletion microscopy.
  23. Baer, Stephen C., Superresolution in microlithography and fluorescence microscopy.
  24. Baer, Stephen C., Superresolution in microlithography and fluorescence microscopy.
  25. Baer,Stephen C., Superresolution in microlithography and fluorescence microscopy.
  26. Baer Stephen C., Superresolution in optical microscopy and microlithography.
  27. Iketaki, Yoshinori, Ultra-high resolution microscope.
  28. Zemel Marc I. ; Dunn Thomas J., Ultraviolet-based, large-area scanning system for photothermal processing of composite structures.
  29. Samant, Mahesh Govind; Stohr, Joachim, Vertically aligned liquid crystal displays and methods for their production.
섹션별 컨텐츠 바로가기

AI-Helper ※ AI-Helper는 오픈소스 모델을 사용합니다.

AI-Helper 아이콘
AI-Helper
안녕하세요, AI-Helper입니다. 좌측 "선택된 텍스트"에서 텍스트를 선택하여 요약, 번역, 용어설명을 실행하세요.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.

선택된 텍스트

맨위로