초록 ▼

An apparatus and test method for determining the cleanliness (based on corrosivity) of a specific area on an electronic circuit assembly, such as the area between holes or pads on a single side of an assembly. The apparatus includes: (1) an extraction cell for providing an extraction fluid to an ele

An apparatus and test method for determining the cleanliness (based on corrosivity) of a specific area on an electronic circuit assembly, such as the area between holes or pads on a single side of an assembly. The apparatus includes: (1) an extraction cell for providing an extraction fluid to an electronic circuit assembly ("ECA") area to be measured; (2) an extraction fluid for extracting residue from the ECA area to be measured; (3) a test cell with two or more electrodes and a voltage source for providing a voltage to the electrodes; and (4) a timer for measuring the time between the application of the voltage and an electrical short between the electrodes. The method includes: (1) positioning an extraction cell over an electronic circuit assembly area to be measured; (2) dispensing an extraction fluid into the extraction cell; (3) contacting the ECA area to be measured with the extraction fluid for a time sufficient to extract residue from the ECA area; (4) transferring the extraction fluid to a test cell made of two or more electrodes; (5) applying a voltage to the electrodes; and (6) measuring the time between the application of the voltage and an electrical short between the electrodes.

대표청구항 ▼

[ What is claimed is:] [1.] A method for quantitatively measuring the corrosivity effect of residues present on the surface of an electronic circuit assembly, the method comprising:a. positioning an extraction cell over an electronic circuit assembly ("ECA") area to be measured;b. dispensing an extr

[ What is claimed is:] [1.] A method for quantitatively measuring the corrosivity effect of residues present on the surface of an electronic circuit assembly, the method comprising:a. positioning an extraction cell over an electronic circuit assembly ("ECA") area to be measured;b. dispensing an extraction fluid into said extraction cell;c. contacting the ECA area to be measured with said extraction fluid for a time sufficient to extract residue from the ECA area and create a residue-containing fluid;d. providing said residue-containing fluid to a test cell comprising two or more electrodes, wherein the residue-containing fluid is provided at least to the space between the electrodes;e. applying a voltage to at least one of the electrodes;f. measuring the time between the application of the voltage and an electrical short between the electrodes.