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Serial analog-to-digital converter using successive comparisons 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H03M-001/38
출원번호 US-0795497 (1997-02-05)
발명자 / 주소
  • Fowler Boyd
  • Yang David
  • El Gamal Abbas
출원인 / 주소
  • Stanford University
대리인 / 주소
    Skjerven, Morrill, MacPherson, Franklin & FrielOgonowsky
인용정보 피인용 횟수 : 211  인용 특허 : 2

초록

A method for simultaneously performing bit serial analog to digital conversion (ADC) for a potentially very large number of signals is described. The method is ideally suited for performing on chip ADC in area image sensors. In one embodiment, to achieve N-bit precision, the method employs a one-bit

대표청구항

[ What is claimed is:] [1.] A circuit comprising:an analog-to-digital (A/D) converter comprising:a first signal generator for generating a first signal having a plurality of levels;a comparator having a first input connected to receive said first signal, said comparator having a second input connect

이 특허에 인용된 특허 (2)

  1. Fowler Boyd (Santa Clara CA) El Gamal Abbas (Palo Alto CA), CMOS image sensor with pixel level A/D conversion.
  2. Murden Frank (Greensboro NC) Moreland Carl W. (Greensboro NC), n-bit analog-to-digital converter with n-1 magnitude amplifiers and n comparators.

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