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Device and method for injecting fuels into compressed gaseous media 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • F23C-005/00
출원번호 US-0691674 (1996-08-02)
우선권정보 DE-0036837 (1995-10-02)
발명자 / 주소
  • Eroglu Adnan,CHX
  • Knopfel Hans Peter,CHX
  • Senior Peter,GB3
출원인 / 주소
  • ABB Research Ltd., CHX
대리인 / 주소
    Burns, Doane, Swecker & Mathis, L.L.P.
인용정보 피인용 횟수 : 77  인용 특허 : 0

초록

A device for injecting fuels (4) into compressed gaseous media essentially comprises a cylindrical hollow body (24) with at least one fuel feed passage (2) and means for the introduction of compressed atomization air (5). A swirl chamber (1) is arranged in the interior of the hollow body (24), this

대표청구항

[ What is claimed as new and desired to be secured by Letters Patent of the United States is:] [1.] A method for operating a fuel injector for atomization of the fuel, the fuel injector having a cylindrical hollow body having an outlet port, the outlet opening forming an atomization edge, the body d

이 특허를 인용한 특허 (77)

  1. Strid, Eric; Gleason, K. Reed, Active wafer probe.
  2. Strid,Eric; Gleason,K. Reed, Active wafer probe.
  3. Marino, John A.; Feese, James J.; Baum, Raymond F., Aggregate dryer burner with compressed air oil atomizer.
  4. Strid, Eric; Campbell, Richard, Calibration structures for differential signal probing.
  5. Campbell, Richard; Strid, Eric W.; Andrews, Mike, Differential signal probe with integral balun.
  6. Strid, Eric; Campbell, Richard, Differential signal probing system.
  7. Campbell, Richard L.; Andrews, Michael, Differential waveguide probe.
  8. Burcham, Terry; McCann, Peter; Jones, Rod, Double sided probing structures.
  9. Burcham,Terry; McCann,Peter; Jones,Rod, Double sided probing structures.
  10. Tackels Guy,FRX ; Rouchy Patrick,FRX ; Vernaz Joseph,FRX, Fuel injection burner.
  11. Hawie, Eduardo; Davenport, Nigel; Wang, Yen-Wen, Fuel nozzle.
  12. Wang, Yen-Wen; Davenport, Nigel, Fuel nozzle.
  13. Wang, Yen-Wen; Davenport, Nigel; Hawie, Eduardo, Fuel nozzle.
  14. Andrews, Peter; Hess, David; New, Robert, Interface for testing semiconductors.
  15. Tervo,Paul A.; Cowan,Clarence E., Low-current pogo probe card.
  16. Tervo,Paul A.; Cowan,Clarence E., Low-current pogo probe card.
  17. Schwindt,Randy J., Low-current probe card.
  18. Gleason, K. Reed; Bayne, Michael A.; Smith, Kenneth; Lesher, Timothy; Koxxy, Martin, Membrane probing method using improved contact.
  19. Gleason, Reed; Bayne, Michael A.; Smith, Kenneth; Lesher, Timothy; Koxxy, Martin, Membrane probing method using improved contact.
  20. Gleason, K. Reed; Smith, Kenneth R.; Bayne, Mike, Membrane probing structure with laterally scrubbing contacts.
  21. Gleason, Reed; Bayne, Michael A.; Smith, Kenneth; Lesher, Timothy; Koxxy, Martin, Membrane probing system.
  22. Gleason, Reed; Bayne, Michael A.; Smith, Kenneth; Lesher, Timothy; Koxxy, Martin, Membrane probing system.
  23. Gleason,Reed; Bayne,Michael A.; Smith,Kenneth; Lesher,Timothy; Koxxy,Martin, Membrane probing system.
  24. Gleason,Reed; Bayne,Michael A.; Smith,Kenneth; Lesher,Timothy; Koxxy,Martin, Membrane probing system.
  25. Smith,Kenneth; Gleason,Reed, Membrane probing system.
  26. Smith,Kenneth; Gleason,Reed, Membrane probing system.
  27. Tervo, Paul A.; Smith, Kenneth R.; Cowan, Clarence E.; Dauphinais, Mike P.; Koxxy, Martin J., Membrane probing system.
  28. Tervo, Paul A.; Smith, Kenneth R.; Cowan, Clarence E.; Dauphinais, Mike P.; Koxxy, Martin J., Membrane probing system.
  29. Tervo,Paul A.; Smith,Kenneth R.; Cowan,Clarence E.; Dauphinais,Mike P.; Koxxy,Martin J., Membrane probing system.
  30. Tervo,Paul A.; Smith,Kenneth R.; Cowan,Clarence E.; Dauphinais,Mike P.; Koxxy,Martin J., Membrane probing system.
  31. Gleason, K. Reed; Smith, Kenneth R.; Bayne, Mike, Membrane probing system with local contact scrub.
  32. Gleason, K. Reed; Smith, Kenneth R.; Bayne, Mike, Membrane probing system with local contact scrub.
  33. Gleason,K. Reed; Smith,Kenneth R.; Bayne,Mike, Membrane probing system with local contact scrub.
  34. K. Reed Gleason ; Kenneth R. Smith ; Mike Bayne, Membrane probing system with local contact scrub.
  35. Jakob Keller CH, Method and device for injecting a fuel/liquid mixture into the combustion chamber of a burner.
  36. Eroglu Adnan,CHX ; McMillan Robin,GBX ; Policke Jens,CHX, Method and device for operating a premix burner.
  37. Gleason,Reed; Bayne,Michael A.; Smith,Kenneth, Method for constructing a membrane probe using a depression.
  38. Gleason, Reed; Bayne, Michael A.; Smith, Kenneth; Lesher, Timothy; Koxxy, Martin, Method for probing an electrical device having a layer of oxide thereon.
  39. Hayden, Leonard; Martin, John; Andrews, Mike, Method of assembling a wafer probe.
  40. Gleason, Reed; Bayne, Michael A.; Smith, Kenneth, Method of constructing a membrane probe.
  41. Smith, Kenneth R., Method of replacing an existing contact of a wafer probing assembly.
  42. Strid,Eric; Campbell,Richard, On-wafer test structures for differential signals.
  43. Tervo,Paul A.; Cowan,Clarence E., POGO probe card for low current measurements.
  44. Feldermann, Christian J., Particulate injection burner.
  45. Gleason, Reed; Bayne, Michael A.; Smith, Kenneth; Lesher, Timothy; Koxxy, Martin, Probe construction using a recess.
  46. Hayden,Leonard; Rumbaugh,Scott; Andrews,Mike, Probe for combined signals.
  47. Hayden,Leonard; Rumbaugh,Scott; Andrews,Mike, Probe for combined signals.
  48. Hayden,Leonard; Rumbaugh,Scott; Andrews,Mike, Probe for combined signals.
  49. Hayden,Leonard; Rumbaugh,Scott; Andrews,Mike, Probe for combined signals.
  50. Hayden,Leonard; Rumbaugh,Scott; Andrews,Mike, Probe for combined signals.
  51. Campbell,Richard L.; Andrews,Michael; Bui,Lynh, Probe for high frequency signals.
  52. Gleason, K. Reed; Lesher, Tim; Strid, Eric W.; Andrews, Mike; Martin, John; Dunklee, John; Hayden, Leonard; Safwat, Amr M. E., Probe for testing a device under test.
  53. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Probe for testing a device under test.
  54. Smith, Kenneth; Jolley, Michael; Van Syckel, Victoria, Probe head having a membrane suspended probe.
  55. Smith,Kenneth; Jolley,Michael; Van Syckel,Victoria, Probe head having a membrane suspended probe.
  56. Schwindt,Randy, Probe holder for testing of a test device.
  57. Smith, Kenneth R.; Hayward, Roger, Probing apparatus with impedance optimized interface.
  58. Smith, Kenneth R., Replaceable coupon for a probing apparatus.
  59. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Shielded probe for high-frequency testing of a device under test.
  60. Gleason, K. Reed; Lesher, Tim; Strid, Eric W.; Andrews, Mike; Martin, John; Dunklee, John; Hayden, Leonard; Safwat, Amr M. E., Shielded probe for testing a device under test.
  61. Gleason,K. Reed; Lesher,Tim; Andrews,Mike; Martin,John, Shielded probe for testing a device under test.
  62. Gleason,K. Reed; Lesher,Tim; Andrews,Mike; Martin,John, Shielded probe for testing a device under test.
  63. Gleason,K. Reed; Lesher,Tim; Andrews,Mike; Martin,John, Shielded probe for testing a device under test.
  64. Gleason,K. Reed; Lesher,Tim; Andrews,Mike; Martin,John, Shielded probe for testing a device under test.
  65. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Shielded probe for testing a device under test.
  66. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Shielded probe for testing a device under test.
  67. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Shielded probe with low contact resistance for testing a device under test.
  68. Dobbeling Klaus,CHX ; Paikert Bettina,CHX, Supersonic centrifugal compression and separation of liquid and gas mixture.
  69. Andrews, Peter; Hess, David, System for testing semiconductors.
  70. Campbell, Richard, Test structure and probe for differential signals.
  71. Campbell,Richard, Test structure and probe for differential signals.
  72. Feese,James J.; Wartluft,Bruce A., Three stage low NOburner and method.
  73. Hayden, Leonard; Martin, John; Andrews, Mike, Wafer probe.
  74. Hayden,Leonard; Martin,John; Andrews,Mike, Wafer probe.
  75. Hayden,Leonard; Martin,John; Andrews,Mike, Wafer probe.
  76. Hayden,Leonard; Martin,John; Andrews,Mike, Wafer probe.
  77. Campbell, Richard, Wideband active-passive differential signal probe.
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