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[미국특허] High numerical aperture ring field optical reduction system 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G02B-017/00
  • G02B-021/00
  • G02B-023/00
  • G02B-005/10
출원번호 US-0571081 (1995-12-12)
발명자 / 주소
  • Williamson David M.,GBX
출원인 / 주소
  • SVG Lithography Systems, Inc.
대리인 / 주소
    Fattibene
인용정보 피인용 횟수 : 150  인용 특허 : 0

초록

An optical projection reduction system used in photolithography for the manufacture of semiconductor devices having a first mirror pair, a second field mirror pair, and a third mirror pair. Electromagnetic radiation from a reticle or mask is reflected by a first mirror pair to a second field mirror

대표청구항

[ What is claimed is:] [1.] An optical reduction system for use in photolithography, from the long conjugate end to the short conjugate end, comprising:a first mirror pair;a field mirror pair positioned to receive electromagnetic radiation reflected from said first mirror pair;a third mirror pair po

이 특허를 인용한 특허 (150) 인용/피인용 타임라인 분석

  1. Mann, Hans-J?rgen; Dinger, Udo; M?hlbeyer, Michael, 6-mirror microlithography projection objective.
  2. Shafer, David R., 6-mirror projection objective with few lenses.
  3. Mann, Hans-Jurgen; Ulrich, Wilhelm; Seitz, Gunther, 8-mirror microlithography projection objective.
  4. Mann,Hans Juergen; Ulrich,Wilhelm; Seitz,Guenther, 8-mirror microlithography projection objective.
  5. Mann,Hans Juergen; Ulrich,Wilhelm; Seitz,Guenther, 8-mirror microlithography projection objective.
  6. Mann,Hans J?rgen; Ulrich,Wilhelm; Seitz,G?nther, 8-mirror microlithography projection objective.
  7. Lee, Sang Hun; Goldstein, Michael, Broad-angle multilayer mirror design.
  8. Suenaga,Yutaka; Miyashita,Tomohiro; Yamaguchi,Kotaro, Catadioptric optical system and exposure apparatus equipped with the same.
  9. Shafer, David; Ulrich, Wilhelm; Dodoc, Aurelian; Buenau, Rudolf Von; Mann, Hans-Juergen; Epple, Alexander; Beder, Susanne; Singer, Wolfgang, Catadioptric projection objective.
  10. Shafer, David; Ulrich, Wilhelm; Dodoc, Aurelian; Buenau, Rudolf Von; Mann, Hans-Juergen; Epple, Alexander; Beder, Susanne; Singer, Wolfgang, Catadioptric projection objective.
  11. Shafer, David; Ulrich, Wilhelm; Dodoc, Aurelian; Buenau, Rudolf Von; Mann, Hans-Juergen; Epple, Alexander; Beder, Susanne; Singer, Wolfgang, Catadioptric projection objective.
  12. Shafer, David; Ulrich, Wilhelm; Dodoc, Aurelian; Von Buenau, Rudolf M.; Mann, Hans-Juergen; Epple, Alexander, Catadioptric projection objective.
  13. Shafer, David; Ulrich, Wilhelm; Dodoc, Aurelian; Von Buenau, Rudolf M.; Mann, Hans-Juergen; Epple, Alexander; Beder, Susanne; Singer, Wolfgang, Catadioptric projection objective.
  14. Shafer, David; Ulrich, Wilhelm; Dodoc, Aurelian; Von Buenau, Rudolf M.; Mann, Hans-Juergen; Epple, Alexander; Beder, Susanne; Singer, Wolfgang, Catadioptric projection objective.
  15. Shafer, David; Ulrich, Wilhelm; Dodoc, Aurelian; Von Buenau, Rudolf; Mann, Hans-Juergen; Epple, Alexander, Catadioptric projection objective.
  16. Shafer, David; Ulrich, Wilhelm; Dodoc, Aurelian; Von Buenau, Rudolf; Mann, Hans-Juergen; Epple, Alexander, Catadioptric projection objective.
  17. Shafer, David; Ulrich, Wilhelm; Dodoc, Aurelian; Von Buenau, Rudolf; Mann, Hans-Juergen; Epple, Alexander, Catadioptric projection objective.
  18. Shafer, David; Ulrich, Wilhelm; Dodoc, Aurelian; Von Buenau, Rudolf; Mann, Hans-Juergen; Epple, Alexander, Catadioptric projection objective.
  19. Shafer, David; Ulrich, Wilhelm; Dodoc, Aurelian; Von Buenau, Rudolf; Mann, Hans-Juergen; Epple, Alexander; Beder, Susanne; Singer, Wolfgang, Catadioptric projection objective.
  20. Shafer,David; Ulrich,Wilhelm; Dodoc,Aurelian; Von Buenau,Rudolf; Mann,Hans Juergen; Epple,Alexander, Catadioptric projection objective.
  21. Shafer, David; Ulrich, Wilhelm; Dodoc, Aurelian; Von Buenau, Rudolf M.; Mann, Hans-Juergen; Epple, Alexander, Catadioptric projection objective including an aspherized plate.
  22. Dodoc, Aurelian; Ulrich, Wilhelm; Epple, Alexander, Catadioptric projection objective with intermediate images.
  23. Dodoc, Aurelian; Ulrich, Wilhelm; Epple, Alexander, Catadioptric projection objective with intermediate images.
  24. Dodoc, Aurelian; Ulrich, Wilhelm; Epple, Alexander, Catadioptric projection objective with intermediate images.
  25. Dodoc, Aurelian; Ulrich, Wilhelm; Epple, Alexander, Catadioptric projection objective with intermediate images.
  26. Epple, Alexander; Ulrich, Wilhelm; Dodoc, Aurelian; Mann, Hans-Juergen; Shafer, David, Catadioptric projection objective with mirror group.
  27. Shafer, David; Ulrich, Wilhelm; Dodoc, Aurelian; von Buenau, Rudolf Murai; Mann, Hans-Juergen; Epple, Alexander, Catadioptric projection objective with parallel, offset optical axes.
  28. Omura, Yasuhiro, Catadioptric projection optical system, exposure apparatus, and exposure method.
  29. Hudyma,Russell, Catadioptric projection system for 157 nm lithography.
  30. Hudyma,Russell, Catadioptric projection system for 157 nm lithography.
  31. Takahashi,Tomowaki, Catadioptric system and exposure device having this system.
  32. Mann, Hans-Juergen, Catoptric imaging optical system with an arc-shaped object field.
  33. Mann, Hans-Juergen; Shafer, David; Ulrich, Wilhelm, Catoptric objectives and systems using catoptric objectives.
  34. Mann, Hans-Juergen; Shafer, David; Ulrich, Wilhelm, Catoptric objectives and systems using catoptric objectives.
  35. Mann, Hans-Juergen; Shafer, David; Ulrich, Wilhelm, Catoptric objectives and systems using catoptric objectives.
  36. Mann, Hans-Juergen; Shafer, David; Ulrich, Wilhelm, Catoptric objectives and systems using catoptric objectives.
  37. Mann, Hans-Juergen; Ulrich, Wilhelm; Pretorius, Marco, Catoptric objectives and systems using catoptric objectives.
  38. Mann, Hans-Juergen; Ulrich, Wilhelm; Pretorius, Marco, Catoptric objectives and systems using catoptric objectives.
  39. Mann, Hans-Jurgen; Shafer, David; Ulrich, Wilhelm, Catoptric objectives and systems using catoptric objectives.
  40. Sunaga, Toshihiro; Hatakeyama, Koshi; Sasaki, Takahiro, Catoptric projection optical system and exposure apparatus.
  41. Terasawa, Chiaki, Catoptric projection optical system, exposure apparatus and device fabrication method using same.
  42. Takahashi Tomowaki,JPX, Catoptric reduction projection optical system.
  43. Takahashi Tomowaki,JPX ; Suenaga Yutaka,JPX, Catoptric reduction projection optical system and exposure apparatus and method using same.
  44. Takahashi Tomowaki,JPX ; Suenaga Yutaka,JPX, Catoptric reduction projection optical system and exposure apparatus and method using same.
  45. Suzuki,Masayuki; Terasawa,Chiaki, Catoptric reduction projection optical system and exposure apparatus using the same.
  46. Takahashi Tomowaki,JPX, Catoptric reduction projection optical system and projection exposure apparatus and method using same.
  47. Kuo, Shih-Zheng, Concave mirror optical system for scanner.
  48. Kuo, Shih-Zheng, Concave mirror optical system for scanner.
  49. Phillips,Alton; Sogard,Michael, Deformable mirror actuation system.
  50. Watson, Douglas C., Deformable mirror with passive and active actuators.
  51. Fischer Edgar,CHX ; Sanvido Saverio,CHX ; Herren Andreas,CHX, Device for the directional transmission and the directional reception of modulated light waves.
  52. Oshino, Tetsuya, Devices and methods for holding an optical element with reduced stress in an optical column and while performing an out-of-column procedure on the element.
  53. Takahashi, Tomowaki, Dual-imaging optical system.
  54. McGuire, Jr., James P., EUV condenser with non-imaging optics.
  55. McGuire, Jr., James P., EUV condenser with non-imaging optics.
  56. McGuire,James P., EUV condenser with non-imaging optics.
  57. Kazuya Ota JP, Exposure apparatus and method.
  58. Claude L. Davis, Jr. ; Kenneth E. Hrdina ; Robert Sabia ; Harrie J. Stevens, Extreme ultraviolet soft x-ray projection lithographic method and mask devices.
  59. Davis, Jr., Claude L.; Hrdina, Kenneth E.; Sabia, Robert; Stevens, Harrie J., Extreme ultraviolet soft x-ray projection lithographic method and mask devices.
  60. Dahan, Andre; Thornbury, Tom; Harris, Steven Brian, Facilitating a transaction in electronic commerce.
  61. Cohen Simon J ; Jeong Hwan J ; Shafer David R, Four-mirror extreme ultraviolet (EUV) lithography projection system.
  62. Hudyma Russell, High numerical aperture ring field projection system for extreme ultraviolet lithography.
  63. Hudyma Russell, High numerical aperture ring field projection system for extreme ultraviolet lithography.
  64. Hudyma Russell, High numerical aperture ring field projection system for extreme ultraviolet lithography.
  65. Hudyma Russell ; Shafer David, High numerical aperture ring field projection system for extreme ultraviolet lithography.
  66. Hudyma Russell ; Shafer David R., High numerical aperture ring field projection system for extreme ultraviolet lithography.
  67. Hideki Komatsuda JP, Illumination system and exposure apparatus and method.
  68. Komatsuda, Hideki, Illumination system and exposure apparatus and method.
  69. Komatsuda,Hideki, Illumination system and exposure apparatus and method.
  70. Singer,Wolfgang; Hainz,Joachim; Frasch,Hans Joachim; Wangler,Johannes; Wietzorrek,Joachim; Schultz,J철rg, Illumination system with field mirrors for producing uniform scanning energy.
  71. Hazelton,Andrew J., Image shift optic for optical system.
  72. Komatsuda, Hideki, Imaging optical system and exposure apparatus.
  73. Mann, Hans-Juergen; Shafer, David, Imaging optical system and projection exposure installation for microlithography with an imaging optical system of this type.
  74. Mann, Hans-Juergen; Shafer, David, Imaging optical system and projection exposure installation for microlithography with an imaging optical system of this type.
  75. Kim,Hyung su, Imaging optical system, image forming apparatus having the same, and a method therefor.
  76. Epple, Alexander; Mueller, Ralf; Rostalski, Hans-Juergen, Imaging optical unit and projection exposure apparatus for projection lithography, having such imaging optical unit.
  77. Mann, Hans-Juergen; Menke, Christoph; Beder, Susanne, Imaging optical unit for a projection exposure apparatus.
  78. Shafer, David R.; Ulrich, Wilhelm; Dodoc, Aurelian; von Buenau, Rudolf M.; Mann, Hans-Juergen; Epple, Alexander; Beder, Susanne; Singer, Wolfgang, Immersion catadioptric projection objective having two intermediate images.
  79. Bal, Matthieu Frederic; Bociort, Florian; Braat, Josephus Johannes Maria, Lithographic apparatus, device manufacturing method, and device manufactured thereby.
  80. Li, Yanqiu; Liu, Fei, Method of extreme ultraviolet lithography projection objective.
  81. Best, Michael E.; Davis, Jr., Claude L.; Edwards, Mary J.; Hobbs, Thomas W.; Murray, Gregory L., Method to avoid striae in EUV lithography mirrors.
  82. Cerrina, Francesco; Sussman, Michael R.; Blattner, Frederick R.; Singh-Gasson, Sangeet; Green, Roland, Methods for the synthesis of arrays of DNA probes.
  83. Deguenther, Markus; Layh, Michael; Gerhard, Michael; Thome, Bruno; Singer, Wolfgang, Microlithographic illumination system.
  84. Deguenther, Markus; Layh, Michael; Gerhard, Michael; Thome, Bruno; Singer, Wolfgang, Microlithographic illumination system.
  85. Shafer, David R., Microlithographic reduction projection catadioptric objective.
  86. Shafer, David R.; Hudyma, Russell; Ulrich, Wilhelm, Microlithographic reduction projection catadioptric objective.
  87. Shafer, David R.; Hudyma, Russell; Ulrich, Wilhelm, Microlithographic reduction projection catadioptric objective.
  88. Shafer,David R.; Hudyma,Russell; Ulrich,Wilhelm, Microlithographic reduction projection catadioptric objective.
  89. Udo Dinger DE, Microlithography projection objective and projection exposure apparatus.
  90. Schuster, Karl-Heinz; Clauss, Wilfried, Microlithography projection objective with crystal lens.
  91. Mann, Hans-Juergen; Ulrich, Wilhelm, Microlithography projection optical system, tool and method of production.
  92. Mann, Hans-Juergen; Ulrich, Wilhelm, Microlithography projection optical system, tool and method of production.
  93. Dinger, Udo, Microlithography reduction objective and projection exposure apparatus.
  94. Dinger, Udo, Microlithography reduction objective and projection exposure apparatus.
  95. Udo Dinger DE, Microlithography reduction objective and projection exposure apparatus.
  96. Braat Josephus J. M.,NLX, Mirror projection system for a scanning lithographic projection apparatus, and lithographic apparatus comprising such a system.
  97. Braat Josephus J. M.,NLX, Mirror projection system for a scanning lithographic projection apparatus, and lithographic apparatus comprising such a system.
  98. Josephus J. M. Braat NL, Mirror projection system for a scanning lithographic projection apparatus, and lithographic apparatus comprising such a system.
  99. Josephus J. M. Braat NL, Mirror projection system for a scanning lithographic projection apparatus, and lithographic apparatus comprising such a system.
  100. Braat Josephus J. M.,NLX, Mirror projector system for a scanning lithographic projection apparatus, and lithographic apparatus comprising such a system.
  101. Kandaka, Noriaki; Yamamoto, Masaki, Multi-layered film reflector manufacturing method.
  102. Murakami, Katsuhiko; Ichihara, Yutaka, Multilayer-film reflective mirrors, extreme UV microlithography apparatus comprising same, and microelectronic-device manufacturing methods utilizing same.
  103. Schuster, Karl-Heinz, Objective with crystal lenses and projection exposure equipment for microlithography.
  104. Schuster, Karl-Heinz, Objective with crystal lenses and projection exposure equipment for microlithography.
  105. Mann, Hans-J?rgen; Ulrich, Wilhelm, Objective with pupil obscuration.
  106. Mann,Hans Jurgen; Ulrich,Wilhelm, Objective with pupil obscuration.
  107. Gerhard, Michael, Optical element and illumination optics for microlithography.
  108. Omura, Yasuhiro, PROJECTION OPTICAL SYSTEM, PROJECTION EXPOSURE APPARATUS HAVING THE PROJECTION OPTICAL SYSTEM, PROJECTION METHOD THEREOF, EXPOSURE METHOD THEREOF AND FABRICATING METHOD FOR FABRICATING A DEVICE USING.
  109. Kamenow,Vladimir; Kraehmer,Daniel; Totzeck,Michael; Gruner,Toralf; Dodoc,Aurelian; Shafer,David; Ulrich,Wilhelm; von Buenau,Rudolf; Mann,Hans Juergen; Epple,Alexander, Projection exposure apparatus.
  110. Mann, Hans-Juergen; Singer, Wolfgang, Projection objective and projection exposure apparatus with negative back focus of the entry pupil.
  111. Mann, Hans-Juergen; Singer, Wolfgang, Projection objective and projection exposure apparatus with negative back focus of the entry pupil.
  112. Mann, Hans-Juergen; Singer, Wolfgang, Projection objective and projection exposure apparatus with negative back focus of the entry pupil.
  113. Mann, Hans-Juergen; Singer, Wolfgang, Projection objective and projection exposure apparatus with negative back focus of the entry pupil.
  114. Beder, Susanne; Singer, Wolfgang; Schuster, Karl-Heinz, Projection objective having a high aperture and a planar end surface.
  115. Beder,Susanne; Singer,Wolfgang; Schuster,Karl Heinz, Projection objective having a high aperture and a planar end surface.
  116. Mann,Hans Juergen; Hudyma,Russell; Epple,Alexander, Projection objectives including a plurality of mirrors with lenses ahead of mirror M3.
  117. Mann,Hans Jurgen; Hudyma,Russell; Epple,Alexander, Projection objectives including a plurality of mirrors with lenses ahead of mirror M3.
  118. Takahashi, Tomowaki, Projection optical system and exposure apparatus with the same.
  119. Terasawa,Chiaki; Ishii,Hiroyuki; Kato,Takashi, Projection optical system and projection exposure apparatus.
  120. Terasawa,Chiaki; Ishii,Hiroyuki; Kato,Takashi, Projection optical system and projection exposure apparatus.
  121. Terasawa,Chiaki; Ishii,Hiroyuki; Kato,Takashi, Projection optical system and projection exposure apparatus.
  122. Terasawa,Chiaki; Ishii,Hiroyuki; Kato,Takashi, Projection optical system and projection exposure apparatus.
  123. Kato,Takashi; Terasawa,Chiaki, Projection optical system, exposure apparatus, and device manufacturing method.
  124. Kato,Takashi; Terasawa,Chiaki, Projection optical system, exposure apparatus, and device manufacturing method.
  125. Suzuki,Masayuki, Projection optical system, exposure apparatus, and device manufacturing method.
  126. Suzuki,Masayuki, Projection optical system, exposure apparatus, and device manufacturing method.
  127. Omura, Yasuhiro, Projection optical system, exposure apparatus, and exposure method.
  128. Omura, Yasuhiro, Projection optical system, exposure apparatus, and exposure method.
  129. Omura, Yasuhiro, Projection optical system, exposure apparatus, and exposure method.
  130. Omura, Yasuhiro, Projection optical system, exposure apparatus, and exposure method.
  131. Omura, Yasuhiro, Projection optical system, exposure apparatus, and exposure method.
  132. Omura, Yasuhiro, Projection optical system, exposure apparatus, and exposure method.
  133. Hudyma, Russell; Mann, Hans-Jûrgen; Dinger, Udo, Projection system for EUV lithography.
  134. Hudyma,Russell; Mann,Hans J체rgen; Dinger,Udo, Projection system for EUV lithography.
  135. Hudyma,Russell; Mann,Hans J?rgen; Dinger,Udo, Projection system for EUV lithography.
  136. Hudyma,Russell; Mann,Hans J��rgen; Dinger,Udo, Projection system for EUV lithography.
  137. Hudyma,Russell; Mann,Hans J��rgen; Dinger,Udo, Projection system for EUV lithography.
  138. Kubiak, Glenn D.; Sweatt, William C., Radiation source with shaped emission.
  139. Omura, Yasuhiro, Reducing immersion projection optical system.
  140. Omura, Yasuhiro, Reducing immersion projection optical system.
  141. Dinger, Udo; Mann, Hans-Jurgen, Reduction objective for extreme ultraviolet lithography.
  142. Omura, Yasuhiro, Reduction projection optical system, exposure apparatus, and exposure method.
  143. Omura, Yasuhiro, Reduction projection optical system, exposure apparatus, and exposure method.
  144. Omura, Yasuhiro, Reduction projection optical system, exposure apparatus, and exposure method.
  145. Kiyoto Mashima JP, Reflection reduction projection optical system.
  146. Koch Donald G. ; McGuire James P. ; Kunick Joseph M., Reflective fly's eye condenser for EUV lithography.
  147. Takahashi,Tomowaki, Reflective-type projection optical system and exposure apparatus equipped with said reflective-type projection optical system.
  148. Golovkina, Viktoriya N.; Cerrina, Franco, Synthesis of arrays of oligonucleotides and other chain molecules.
  149. Braat Josephus J. M.,NLX, Three-mirror system for lithographic projection, and projection apparatus comprising such a mirror system.
  150. Stipe,Barry Cushing, Ultra low-cost solid-state memory.

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