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Fast turn-on silicon controlled rectifier (SCR) for electrostatic discharge (ESD) protection 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H02H-003/22
출원번호 US-0845302 (1997-04-25)
발명자 / 주소
  • Watt Jeffrey
출원인 / 주소
  • Cypress Semiconductor Corp.
대리인 / 주소
    Maiorana & Acosta, P.C.
인용정보 피인용 횟수 : 80  인용 특허 : 17

초록

An apparatus for protecting an integrated circuit against damage from electrostatic discharge (ESD) includes an ESD bus that is connected to multiple input pads through a respective diode. The ESD bus--the node to be protected--is coupled to the negative power supply bus (V.sub.ss) by a FET-triggere

대표청구항

[ I claim:] [1.] An apparatus for protecting a semiconductor device from excessive charge, the device including an interface pad selected from the group including an input pad, an output pad, and an input/output pad, comprising:an SCR circuit configured to transfer charge from an electrostatic disch

이 특허에 인용된 특허 (17)

  1. Chen Jerry (Taipei TWX), Apparatus for electro-static discharge protection in a semiconductor device.
  2. Watt Jeffrey T. (Mountain View CA), Apparatus for smart power supply ESD protection structure.
  3. Ker Ming D. (Hsinchu TWX) Lee Chung Y. (Chung-Li TWX) Wu Chung Y. (Hsinchu TWX) Ko Joe (Hsin-chu TWX), CMOS ESD protection circuit with parasitic SCR structures.
  4. Ker Ming-Dou (Hsinchu TWX) Lee Chung-Yuan (Hsinchu TWX) Wu Chung-Yu (Hsinchu TWX), CMOS on-chip ESD protection circuit and semiconductor structure.
  5. Ker Ming-Dou (Hsinchu TWX) Lee Chung-Yuan (Hsinchu TWX) Wu Chung-Yu (Hsinchu TWX), CMOS on-chip ESD protection circuit and semiconductor structure.
  6. Scott David B. (Plano TX) Bosshart Patrick W. (Dallas TX) Gallia James D. (Dallas TX), Circuit to improve electrostatic discharge protection.
  7. Ker Ming-Dou (Tainan Hsien TWX) Wu Chung-Yu (Hsinchu TWX) Chang Hun-Hsien (Taipei Hsien TWX) Lee Chung-Yuan (Chungli TWX) Ko Joe (Hsinchu TWX), Complementary LVTSCR ESD protection circuit for sub-micron CMOS integrated circuits.
  8. Chan Tsiu C. (Carrollton TX) Culver David S. (The Colony TX), ESD protection circuit.
  9. Smooha Yehuda (South Whitehall Twp. ; Lehigh County PA), ESD protection for output buffers.
  10. Leach Jerald G. (Houston TX), Electrostatic discharge protection in integrated circuits, systems and methods.
  11. Leach Jerald G. (Houston TX), Electrostatic discharge protection in integrated circuits, systems and methods.
  12. Croft Gregg D. (Palm Bay FL), High voltage protection using SCRs.
  13. Consiglio Rosario (San Jose CA) Ku Yen-Hui (Cupertino CA), Input-output (I/O) structure with capacitively triggered thyristor for electrostatic discharge (ESD) protection.
  14. Racino Gregory A. (Austin TX) Obuszewski Kenneth (Austin TX), Integrated circuit with electrostatic discharge (ESD) protection and ESD protection circuit.
  15. Avery Leslie R. (Flemington NJ), Low voltage triggered snap-back device.
  16. Chen Hung-Sheng (San Jose CA) Shyu Chin-Miin (San Jose CA) Teng C. S. (San Jose CA), Low voltage triggering silicon controlled rectifier structures for ESD protection.
  17. Roberts Gregory N. (Boise ID), Output ESD protection circuit.

이 특허를 인용한 특허 (80)

  1. Walker, Andrew; Puchner, Helmut, Capacitor triggered silicon controlled rectifier.
  2. Walker, Andrew; Puchner, Helmut; Dhanraj, Sai; Jang, Kevin, Circuit with electrostatic discharge protection.
  3. Walker, Andrew; Puchner, Helmut; Dhanraj, Sai; Jang, Kevin, Circuit with electrostatic discharge protection.
  4. Walker, Andrew; Puchner, Helmut; Jang, Kevin, Circuit with electrostatic discharge protection.
  5. Walker, Andrew J.; Puchner, Helmut; Kutz, Harold M.; Shutt, James H., Circuits providing ESD protection to high voltage laterally diffused metal oxide semiconductor (LDMOS) transistors.
  6. Peng, Kuo-Reay; Lee, Jian-Hsing, Depletion mode SCR for low capacitance ESD input protection.
  7. Jang, Kevin; Phan, Bill; Puchner, Helmut, Drain extended MOS transistor with increased breakdown voltage.
  8. Woo,Agnes Neves; Chen,Chun Ying, ESD configuration for low parasitic capacitance I/O.
  9. Steven H. Voldman ; Richard Q. Williams, ESD network with capacitor blocking element.
  10. Watt Jeffrey ; Walker Andrew, ESD protection apparatus having floating ESD bus and semiconductor structure.
  11. Chu, Charles Y.; Watt, Jeffrey T., ESD protection circuit.
  12. Chu, Charles Y.; Watt, Jeffrey T., ESD protection circuit.
  13. Liang, Yung-Chih; Yeh, Chih-Ting, ESD protection circuit.
  14. Liang, Yung-Chih; Yeh, Chih-Ting, ESD protection circuit.
  15. Tsai, Chia-Ku; Tsai, Fu-Yi; Peng, Yan-Hua, ESD protection circuit.
  16. Liu, Yowjuang; Huang, Cheng, ESD protection device for high performance IC.
  17. Lai, Tai-Hsiang; Fan, Kuei-Chih; Tang, Tien-Hao, ESD protection device structure.
  18. Walker, Andrew J., ESD protection device with charge collections regions.
  19. Woo, Agnes Neves, ESD protection for high voltage applications.
  20. Woo,Agnes Neves, ESD protection for high voltage applications.
  21. Fujio Takeda ; James W. Miller, Electrostatic discharge (ESD) protection circuit.
  22. Stockinger, Michael A.; Khazhinsky, Michael G.; Miller, James W., Electrostatic discharge circuit and method therefor.
  23. Miller, James W.; Hall, Geoffrey B.; Krasin, Alexander; Stockinger, Michael; Akers, Matthew D; Kamat, Vishnu G., Electrostatic discharge protection circuitry and method of operation.
  24. Walker, Andrew; Puchner, Helmut, Electrostatic discharge protection device.
  25. Quax, Guido Wouter Willem; Lai, Da-Wei, Electrostatic discharge protection device comprising a silicon controlled rectifier.
  26. Kawazoe, Hidechika; Aoki, Eiji; Hsu, Sheng Teng; Fujii, Katsumasa, Electrostatic discharge protection device for semiconductor integrated circuit, method for producing the same, and electrostatic discharge protection circuit using the same.
  27. Van Camp, Benjamin, Electrostatic discharge protection structures with reduced latch-up risks.
  28. O,Hugh Sung Ki; Shih,Chih Ching; Liu,Yow Juang Bill; Huang,Cheng Hsiung; Wu,Wei Guang; Kwong,Billy Jow Tai; Gao,Yu Cheng Richard, Fast trigger ESD device for protection of integrated circuits.
  29. Watt,Jeffrey, Gate triggered ESD clamp.
  30. Van Wijmeersch, Sven, High holding voltage clamp.
  31. Peng, James Jeng-Jie; Chen, Chih-Hao; Jiang, Ryan Hsin-Chin, High voltage open-drain electrostatic discharge (ESD) protection device.
  32. Miller,James W.; Khazhinsky,Michael G.; Stockinger,Michael; Weldon,James C., I/O cell ESD system.
  33. Roberto Sung ; Jau-Wen Chen, Input and power protection circuit implemented in a complementary metal oxide semiconductor process using salicides.
  34. Paul Cooper Davis, Input stage ESD protection for an integrated circuit.
  35. Duncan, Ralph; Kwan, Tom W., Integrated VCO having an improved tuning range over process and temperature variations.
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  37. Vo, Nhat D.; Tran, Tu-Anh N.; Carpenter, Burton J.; Hong, Dae Y.; Miller, James W.; Phillips, Kendall D., Integrated circuit having pads and input/output (I/O) cells.
  38. Chang, James Y. C., Integrated spiral inductor.
  39. Li, Xianxin, Internet ESD-shunt diode protected by delayed external MOSFET switch.
  40. Behzad, Arya R., Large gain range, high linearity, low noise MOS VGA.
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  43. Bixby, Bryan, Low conducted emission solid state switch.
  44. Farzan, Bahman; Le, Hung Pham, Low-voltage CMOS space-efficient 15 KV ESD protection for common-mode high-voltage receivers.
  45. Bermingham Michael ; MacLellan Christopher S. ; Walton John K., Method and apparatus for hot-plugging circuit boards having low voltage logic parts into a higher voltage backplane.
  46. Scarpa, Andrea; Cappon, Paul H.; De Jong, Peter C.; Smedes, Taede, Method and apparatus for testing integrated circuits for susceptibility to latch-up.
  47. Ng William ; Schroter Bernhard, Methods and apparatus for controlling a power supply with improved techniques for providing protection limits.
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  52. Dreps, Daniel M., Overvoltage protection circuit.
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  61. Marr, Kenneth W., Setpoint silicon controlled rectifier (SCR) electrostatic discharge (ESD) core clamp.
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  78. Ralph Duncan ; Tom W. Kwan, System and method for narrow band PLL tuning.
  79. Jian-Hsing Lee TW; Kuo-Chio Liu TW; Bing-Lung Liao TW; Jiaw-Ren Shih TW, Uniform current distribution SCR device for high voltage ESD protection.
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