초록 ▼

A dynamic random access memory (DRAM) testing apparatus includes a substantially upright support plate on which at least one elongated feeding chute is provided, having a channel co-extensive therewith for receiving and holding therein an IC bar which contains a number of DRAMs to be tested. The DRA

A dynamic random access memory (DRAM) testing apparatus includes a substantially upright support plate on which at least one elongated feeding chute is provided, having a channel co-extensive therewith for receiving and holding therein an IC bar which contains a number of DRAMs to be tested. The DRAMs are movable downward along the channel by means of gravity. A shifting mechanism, which is controlled by a control unit, sequentially transfers the DRAMs from the feeding chute to a testing device defining a holder for receiving the DRAM to carry out the test. The test is conducted by the control unit and the test result is transmitted thereto for classifying the DRAM being tested. The tested DRAM is then forwarded to a movable member to be conveyed thereby to a particular one of a plurality of out-feeding chutes which are associated with different classifications of the DRAMs. The DRAM is then moved from the out-feeding chute to an empty IC bars to be collected therein.

대표청구항 ▼

[ What is claimed is:] [1.] A DRAM (dynamic random access memory) testing apparatus comprising:a support plate, having a substantially upright surface;at least one feeding device, mounted on the surface of the support plate for receiving a plurality of DRAMs to be test in such a manner to allow the

[ What is claimed is:] [1.] A DRAM (dynamic random access memory) testing apparatus comprising:a support plate, having a substantially upright surface;at least one feeding device, mounted on the surface of the support plate for receiving a plurality of DRAMs to be test in such a manner to allow the DRAMs to sequentially move toward a ready-to-feed position by means of gravity;a test holder located at a position corresponding to the at least one feeding device to receive the DRAMs one by one from the feeding device for performing a desired test operation on the DRAM so as to generate a test result associated with the DRAM that is being tested;a control unit, in electrical connection with the test holder for controlling the test operation;a shifting device comprises first grasping means, selectively engageable with/disengageable from the DRAMs, the shifting device being controlled by the control unit to be movable between a first position where the first grasping means is allowed to engage one of the DRAMs at the ready-to-feed position and a second position where the DRAM is allowed to be disposed into the test holder, the shifting device comprising second grasping means which is arranged to pick up the DRAM that is inside the test holder when the shifting device is at the first position, and to convey the DRAM that is picked up from the test holder to a ready-to-dispense position when the shifting device is at the second position; anda classification device comprising a plurality of out-feed chutes, each having an inlet opening and an outlet opening, the outlet opening being arranged to receive a DRAM collection container therein for receiving and collecting the DRAM that have been tested, a movable member which is movable between the ready-to-dispense position and the inlet openings of the out-feed chutes so as to receive the DRAM that has been tested from the second grasping means of the shifting device and move the DRAM to a specific one of the out-feed chutes which is associated with one of a number of classes of the DRAMs that are tested determined by the test result of the DRAM and thus allowing the DRAM to be collected within the DRAM collection container associated with the specific out-feed chute.