초록 ▼

An electronic integrated circuit includes a signal path for carrying a functional signal between functional logic (15) and an external terminal, which signal path includes a memory element (121, 123, 127). When a test signal is applied to the signal path, a switch (S) of the memory element isolates

An electronic integrated circuit includes a signal path for carrying a functional signal between functional logic (15) and an external terminal, which signal path includes a memory element (121, 123, 127). When a test signal is applied to the signal path, a switch (S) of the memory element isolates the test signal from the functional signal.

대표청구항 ▼

[ What is claimed is:] [1.] An electronic integrated circuit, comprising:A. functional core logic;B. a terminal accessible externally of the integrated circuit;C. a signal path connected between the functional logic and the terminal for carrying a functional signal;D. a latch circuit having an input

[ What is claimed is:] [1.] An electronic integrated circuit, comprising:A. functional core logic;B. a terminal accessible externally of the integrated circuit;C. a signal path connected between the functional logic and the terminal for carrying a functional signal;D. a latch circuit having an input and an output and having at least two portions connected in series in the signal path; andE. a serial scan path including:i. a serial input lead,ii. a multiplexer circuit having an output, a first input connected to the serial input lead and a second input connected to the signal path at one of the input and output of the latch circuit,iii. a serial output lead,iv. a memory circuit having an input connected to the output of the multiplexer circuit and an output connected to the serial output lead, andv. a test switch connected between the serial output lead and the signal path between the two portions of the latch circuit.