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[미국특허] Method and system for sensitive detection of molecular species in a vacuum by harmonic detection spectroscopy 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01N-021/00
출원번호 US-0951301 (1997-10-16)
발명자 / 주소
  • McAndrew James
  • Inman Ronald S.
출원인 / 주소
  • American Air Liquide Inc
대리인 / 주소
    Burns, Doane, Swecker & Mathis, L.L.P.
인용정보 피인용 횟수 : 25  인용 특허 : 22

초록

Provided is a novel method and system for harmonic detection spectroscopy. The method comprises providing a cell having a sample region which is circumscribed by at least one wall. The cell has at least one light entry/exit port, with each entry/exit port containing a light transmissive window havin

대표청구항

[ What is claimed is:] [1.] A method for detecting gas phase molecular species in a sample by harmonic detection spectroscopy, comprising:providing a cell having a sample region which is circumscribed by at least one wall, the cell having at least one light entry/exit port therein, each entry/exit p

이 특허에 인용된 특허 (22) 인용/피인용 타임라인 분석

  1. Wieboldt Richard C. (Verona WI) Adams Gregory E. (Madison WI), Cold trapping apparatus for infrared transmission analysis including a method and substrate therefor.
  2. Heinz Tony F. (Chappaqua NY) Selwyn Gary S. (Hopewell Junction NY) Singh Syothi (Hopewell Junction NY) Spinetti ; Jr. John A. (Endicott NY), Detection of interfaces with atomic resolution during material processing by optical second harmonic generation.
  3. Paschedag Hansjoachim (Maennedorf CH), Detection system to determine the transmissivity of a medium with respect to radiation, particularly the light transmiss.
  4. Wong Jacob Y. (Santa Barbara CA), Enhanced pathlength gas sample chamber.
  5. Doyle Walter M. (Laguna Beach CA), Gas sample analysis provided by light pipe radiation structure.
  6. Silver Joel A. (Sante Fe NM) Stanton Alan C. (Sante Fe NM), Laser absorption detection enhancing apparatus and method.
  7. von Redwitz Heribert (Starnberg DEX), Measuring instrument for determining the scattering and absorption coefficient of the atmosphere.
  8. Puumalainen Pertti (Kuopio FIX) Kuusela Reijo (Kuopio FIX), Method and apparatus for measuring of humidity.
  9. Tell Robert (Gteborg SEX) Andersson Torbjrn (Gteborg SEX) Lundqvist Stefan (Askim SEX) Ahlberg Henrik (Gteborg SEX), Method and apparatus for spectroscopic measurement of the concentration of a gas.
  10. Aoki Kazutsugu (Kanagawa JPX), Method for controlling plasma surface-treatments with a plurality of photodetectors and optical filters.
  11. Lee Peter S. (Troy MI) Majkowski Richard F. (Southfield MI) Schreck Richard M. (Bloomfield Hills MI), Method for determining fuel and engine oil comsumption using tunable diode laser spectroscopy.
  12. Tapp Frederick (Hillsborough NC) Berger Henry (Durham NC), Method of performing an instantaneous moisture concentration measurement and for determining the drydown characteristics.
  13. Bien Fritz (Concord MA) Gersh Michael (Bedford MA) Goldstein Neil (Belmont MA) Lee Jamine (Burlington MA), Multi-pass optical cell species concentration measurement system.
  14. Harvey Robert J. (Capistrano Beach CA), Multiple-path gas-absorption cell.
  15. Lee Jamine (Burlington MA) Goldstein Neil (Belmont MA) Richtsmeier Steven (Tewksbury MA) Bien Fritz (Concord MA) Gersh Michael (Bedford MA), Off-line-locked laser diode species monitor system.
  16. Talasek Robert T. (Plano TX) Hogan Jeremiah D. (Dallas TX), On-line monitor for moisture contamination in HCL gas and copper contamination in NH4OH solutions.
  17. Wallin Svante (Bjrred SEX), Optical analysing equipment for determining parameters of gaseous substances flowing through a duct.
  18. Krone-Schmidt Wilfried (Fullerton CA) Slattery Michael J. (Gardena CA) Brandt Werner V. (Redondo Beach CA), Optical sensing apparatus for CO2jet spray devices.
  19. Hagans Karla (Livermore CA) Berzins Leon (Livermore CA) Galkowski Joseph (Livermore CA) Seng Rita (Tracy CA), Self-tuning method for monitoring the density of a gas vapor component using a tunable laser.
  20. Kawada Hiroki (Ishioka JPX) Takahashi Kazue (Kudamatsu JPX) Edamura Manabu (Ibaraki-ken JPX) Kanai Saburo (Hikari JPX) Tamura Naoyuki (Kudamatsu JPX), Semiconductor device manufacturing apparatus and method with optical monitoring of state of processing chamber.
  21. Traina John E. (303 N. Rose Dr. Glenshaw PA 15116), Transmissometer having solid state light source.
  22. Thurtell George (38 University Ave. West Guelph ; Ontario CAX N1G 1N4) Kidd Gary (11 Batterswood Ct. Kitchener ; Ontario CAX N2A 3S3) Edwards Grant (378 Willard Ave. Toronto ; Ontario CAX M6S 3R5), Tunable diode laser gas analyzer.

이 특허를 인용한 특허 (25) 인용/피인용 타임라인 분석

  1. Benesch, Robert; Haouchine, Malik; Jacksier, Tracey, Articles of manufacture containing increased stability low concentration gases and methods of making and using the same.
  2. Benesch, Robert; Haouchine, Malik; Jacksier, Tracey, Articles of manufacture containing increased stability low concentration gases and methods of making and using the same.
  3. Benesch, Robert; Haouchine, Malik; Jacksier, Tracey, Articles of manufacture containing increased stability low concentration gases and methods of making and using the same.
  4. James McAndrew ; Hwa-Chi Wang ; Benjamin J. Jurcik, Jr., Chamber effluent monitoring system and semiconductor processing system comprising absorption spectroscopy measurement system, and methods of use.
  5. Grimbergen, Michael N.; Qian, Xue-Yu, Chamber having process monitoring window.
  6. Melvin Paul H. ; Lutrick Terry L. ; Shannon Chris, Dual window optical port for improved end point detection.
  7. Otera, Fumiaki, Gas analyzer.
  8. Jacksier, Tracey; Benesch, Robert, Increased stability low concentration gases, products comprising same, and methods of making same.
  9. Smith,Stevie Horton, Measuring trace components of complex gases using gas chromatography/absorption spectrometry.
  10. Zhou, Xin, Measuring water vapor in hydrocarbons.
  11. Thomas Nowak ; Sebastien Raoux ; Dave Silvetti ; Stefan Wolff ; Russ Newman ; Imad Yousif ; Ned Matthew, Method and apparatus for optical detection of effluent composition.
  12. M?ller, Holger; Schmala, Udo, Method and device for the quantitative gas analysis.
  13. Docquier, Nicolas, Method for monitoring by absorption spectroscopy during the forming of flat glass and monitoring device.
  14. Carlson, David K.; Kuppurao, Satheesh, Methods and apparatus for insitu analysis of gases in electronic device fabrication systems.
  15. Tsai, Kenneth; Bach, Tung; Pham, Quyen, Monitoring an effluent from a chamber.
  16. Liu,Xiang; Zhou,Xin; Feitisch,Alfred; Sanger,Greg, Pressure-invariant trace gas detection.
  17. Ludviksson,Audunn, Process monitoring using infrared optical diagnostics.
  18. Zhou, Xin; Liu, Xiang; Feitisch, Alfred; Sanger, Gregory M., Reactive gas detection in complex backgrounds.
  19. Jacksier, Tracey; Benesch, Robert; Haouchine, Malik, Reactive gases with concentrations of increased stability and processes for manufacturing same.
  20. Jacksier, Tracey; Benesch, Robert; Haouchine, Malik, Reactive gases with concentrations of increased stability and processes for manufacturing same.
  21. Jacksier,Tracey; Benesch,Robert; Kuhn,John, Reduced moisture compositions comprising an acid gas and a matrix gas, articles of manufacture comprising said compositions, and processes for manufacturing same.
  22. Jacksier,Tracey; Benesch,Robert; Kuhn,John, Reduced moisture compositions comprising an acid gas and a matrix gas, articles of manufacture comprising said compositions, and processes for manufacturing same.
  23. May,Randy Dean, System and method for detecting water vapor within natural gas.
  24. May,Randy Dean, System and method for detecting water vapor within natural gas.
  25. May,Randy Dean, System and method for detecting water vapor within natural gas.

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