$\require{mediawiki-texvc}$
  • 검색어에 아래의 연산자를 사용하시면 더 정확한 검색결과를 얻을 수 있습니다.
  • 검색연산자
검색연산자 기능 검색시 예
() 우선순위가 가장 높은 연산자 예1) (나노 (기계 | machine))
공백 두 개의 검색어(식)을 모두 포함하고 있는 문서 검색 예1) (나노 기계)
예2) 나노 장영실
| 두 개의 검색어(식) 중 하나 이상 포함하고 있는 문서 검색 예1) (줄기세포 | 면역)
예2) 줄기세포 | 장영실
! NOT 이후에 있는 검색어가 포함된 문서는 제외 예1) (황금 !백금)
예2) !image
* 검색어의 *란에 0개 이상의 임의의 문자가 포함된 문서 검색 예) semi*
"" 따옴표 내의 구문과 완전히 일치하는 문서만 검색 예) "Transform and Quantization"

특허 상세정보

Probe secondary seal

국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판) G01D-021/00   
미국특허분류(USC) 73/866.5 ; 73/290R ; 73/304C ; 73/432.1
출원번호 US-0955270 (1997-10-21)
발명자 / 주소
출원인 / 주소
대리인 / 주소
    Wood, Phillips, VanSanten, Clark & Mortimer
인용정보 피인용 횟수 : 10  인용 특허 : 14
초록

A secondary seal assembly is used with a process instrument including a probe assembly and an electric housing assembly. The probe assembly includes an adaptor receivable in an opening of a process vessel, a probe extending through the adaptor into the process vessel, and a primary seal between the probe and the adaptor. A probe terminal provides an electrical connection between the probe and the electric housing assembly. The secondary seal comprises an elongate extension housing adapted to be mechanically connected at one end to the adaptor and at anot...

대표
청구항

[ I claim:] [1.] A secondary seal assembly for use with a process instrument and adapted to be disposed between a probe assembly, that is normally mechanically connected to an electric housing assembly, and the housing assembly, the probe assembly including an adaptor receivable in an opening of a process vessel, a probe extending through the adaptor into the process vessel and having a primary seal between the probe and the adaptor, and a probe terminal providing an electrical connection between the probe and the electric housing assembly, the secondary...

이 특허에 인용된 특허 (14)

  1. Asmundsson Einar (Middle Haddam CT). Capacitance probe for liquid level measuring system. USP1986064594892.
  2. Ishikawa Yoichi (Tokyo JPX). Detection of the surface of a liquid or foam including moisture inhibiting. USP1990024902962.
  3. Lang Hugo (Pfeffingen CHX) Alznauer Miroslaw (Wies DEX). Device for the electrically insulated attachment of a metallic probe electrode in the opening of a housing. USP1995025391839.
  4. Mayer Peter (Burlington CA) Murthy M. Krishna (Toronto CA) Brooks Albert H. (Agincourt CA) Topping John A. (Oakville CA). Glass seal. USP1977064029897.
  5. Paterek F. Dieter (Cincinnati OH). Hermetic assembly arrangement for a current conducting pin passing through a housing wall. USP1993075227587.
  6. Goellner Allan R. (Parma Heights OH). High pressure electrical conductivity probe. USP1985034507521.
  7. Beaman Norman V. (La Habra CA). Instrument probe assembly having continuous probe insulation. USP1979014137558.
  8. Hansen ; III Charles C. (Hinsdale IL) Yencho John A. (Elmhurst IL) Barbier William J. (Hazelwood MO) Knapp Curtis H. (Aurora IL) Kuhn ; Jr. Orval J. (Warrenville IL). Liquid level control system for refrigeration apparatus. USP1989024809129.
  9. Cost Evan (Philadelphia PA). Material level probe having crimp seal. USP1994055307678.
  10. Catheline Marc (Chatillon Sous Bagneux FRX) Dody Jean-Nol (Plaisir FRX) Maquaire Jean-Pierre (Louveciennes FRX). Method for brazing an element transversely to a wall, a brazed-joint assembly for carrying out said method, and a packag. USP1993125267684.
  11. Fleckenstein Phillip P. (Port Huron MI). Method of manufacturing capacitance-type material level indicator probe. USP1985024499641.
  12. Fller Werner (Stuhr DEX) Willenbrock Helmut (Achim DEX) Behnken Wolfgang (Delmenhorst DEX). Probe for monitoring liquid. USP1993125272921.
  13. Borchers Kerstin (Bremen DEX) Politt Joachim-Christian (Bremen DEX) Schroter Holger (Achim DEX). Probe for monitoring liquid with protection against leakage. USP1997095669263.
  14. Beaman Norman Vane (La Habra CA). Seal for an instrument probe assembly. USP1977104054744.