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Rapid X-ray inspection system 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01V-005/00
출원번호 US-0898165 (1997-07-22)
발명자 / 주소
  • Grodzins Lee
출원인 / 주소
  • American Science and Engineering, Inc.
대리인 / 주소
    Bromberg & Sunstein LLP
인용정보 피인용 횟수 : 158  인용 특허 : 3

초록

An inspection system for automatically detecting the presence of a concealed item within an enclosure. A beam of penetrating radiation is incident on the enclosure and detected by a detector disposed on the side of the enclosure opposite to the incident beam. By scanning the relative orientation of

대표청구항

[ I claim:] [1.] An inspection system for inspecting an enclosure having a spatial frame of reference, comprising:(a) a source of penetrating radiation;(b) a collimator for forming the penetrating radiation into a beam having an orientation with respect to the enclosure;(c) a scanner arrangement for

이 특허에 인용된 특허 (3)

  1. Bermbach Rainer (Mainz-Laubenheim DEX) Doenges Gerhard (Heidenrod-Kemel DEX) Geus Georg (Wiesbaden DEX) Koch Cornelius (Wiesbaden DEX), Apparatus for the transillumination of articles with a fan-shaped radiation beam.
  2. Kotowski Andreas F. (2315 Sunnyside Ridge Rd. Rancho Palos Verdes CA 90274), Luggage inspection device.
  3. Kotowski Andreas F. (Covina CA), X-Ray line scan system for use in baggage inspection.

이 특허를 인용한 특허 (158)

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  81. Gray, Stephen; Hughes, Ronald, Personnel screening system.
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  88. Morton, Edward James, Portable security inspection system.
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  91. Kotowski, Andreas; Agrawal, Neeraj, Radiation source apparatus.
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