초록 ▼

In one, more specific embodiment, the barrier walls are below the thermal chamber and the platform is below the barrier walls. In other embodiments, the barrier walls are lateral to the thermal chamber and the apparatus includes one or two racks, also lateral to such chamber. One or respective platf

In one, more specific embodiment, the barrier walls are below the thermal chamber and the platform is below the barrier walls. In other embodiments, the barrier walls are lateral to the thermal chamber and the apparatus includes one or two racks, also lateral to such chamber. One or respective platforms are supported on the rack(s).

대표청구항 ▼

[ What is claimed:] [1.] In an improved environmental test apparatus for stress testing electronic products, said improved environmental test chamber comprising:a thermal chamber;a wall separating said thermal chamber from ambient air, said wall comprising a pair of barrier walls having a flexible p

[ What is claimed:] [1.] In an improved environmental test apparatus for stress testing electronic products, said improved environmental test chamber comprising:a thermal chamber;a wall separating said thermal chamber from ambient air, said wall comprising a pair of barrier walls having a flexible partition interposed therebetween, said barrier walls and said flexible partition substantially isolating said ambient air from said thermal chamber;a platform in said ambient air;a feedthrough card extending from said platform through said flexible partition into said thermal chamber; anda conveyor in said ambient air and urging said platform along said flexible partition during testing of said electronic products.