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Adjustable delay circuit for setting the speed grade of a semiconductor device 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G11C-007/00
출원번호 US-0917651 (1997-08-22)
발명자 / 주소
  • Lee Terry R.
출원인 / 주소
  • Micron Technology, Inc.
대리인 / 주소
    Schwegman, Lundberg, Woessner & Kluth P.A.
인용정보 피인용 횟수 : 44  인용 특허 : 14

초록

An integrated circuit having an adjustable delay circuit such that the timing characteristics of the integrated circuit can be adjusted. A method for adjusting the timing characteristics of the integrated circuit in order to insure that the integrated circuit meets the specifications of a lower spee

대표청구항

[ What is claimed is:] [1.] A memory device, comprising:memory control logic;a memory array having a plurality of memory cells for storing data, wherein the memory array produces a logic signal representing the stored data when addressed by the memory control logic;a delay element receiving the logi

이 특허에 인용된 특허 (14)

  1. Lee Terry R. (Boise ID) Walther Terry R. (Boise ID) Schaefer Scott E. (Boise ID), Circuit for synchronizing refresh cycles in self-refreshing drams having timing circuit shutdown.
  2. Lee Terry R. (Boise ID), DRAM compressed data test mode with expected data.
  3. Kuhara Shigeru (Tokyo JPX) Toyoshima Hideo (Tokyo JPX), High-speed semiconductor memory system.
  4. Lee Terry R. (Boise ID), Low noise output buffer circuit.
  5. Houston Theodore W. (Richardson TX), Memory circuit with extended valid data output time.
  6. Lee Terry R. (Boise ID), Method for performing a split read/write operation in a dynamic random access memory.
  7. Lee Terry R. (Boise ID) Walther Terry R. (Boise ID) Schaefer Scott E. (Boise ID), Method for synchronizing refresh cycles in self-refreshing DRAMs having timing circuit shutdown.
  8. Raad George B. (Boise ID) Casper Stephen L. (Boise ID), Power-up circuit responsive to supply voltage transients with signal delay.
  9. Lee Terry R. (Boise ID), Self-terminating data line driver.
  10. Park Soon-Kyu (Cheonahn KRX), Semiconductor integrated circuit for outputting data with a high reliability.
  11. Kitamura Mamoru,JPX, Semiconductor memory device having extended margin in latching input signal.
  12. Ochoa Roland (Boise ID) Loughmiller Daniel R. (Boise ID), Sense amplifier circuit for detecting degradation of digit lines and method thereof.
  13. Lee Terry R. (Boise ID), Split read/write dynamic random access memory.
  14. Lee Terry R. (Boise ID), Two stage push-pull output buffer circuit with control logic feedback for reducing crossing current, switching noise and.

이 특허를 인용한 특허 (44)

  1. Dean Gans ; Eric J. Stave ; Joseph Thomas Pawlowski, Adjustable I/O timing from externally applied voltage.
  2. Lee Terry R., Adjustable delay circuit for setting the speed grade of a semiconductor device.
  3. Lee Terry R., Adjustable delay circuit for setting the speed grade of a semiconductor device.
  4. Blodgett,Greg A., DLL measure initialization circuit for high frequency operation.
  5. Bell,Debra M.; Silvestri,Paul A., Delay locked loop with frequency control.
  6. Zerbe, Jared LeVan; Donnelly, Kevin S.; Sidiropoulos, Stefanos; Stark, Donald C.; Horowitz, Mark A.; Yu, Leung; Vu, Roxanne; Kim, Jun; Garlepp, Bruno W.; Ho, Tsyr-Chyang; Lau, Benedict Chung-Kwong, Flash memory controller with calibrated data communication.
  7. Gomm, Tyler J.; Bell, Debra M., Measure-controlled circuit with frequency control.
  8. Gomm,Tyler J.; Bell,Debra M., Measure-controlled circuit with frequency control.
  9. Gomm,Tyler J.; Bell,Debra M., Measure-controlled circuit with frequency control.
  10. Zerbe, Jared LeVan; Donnelly, Kevin S.; Sidiropoulos, Stefanos; Stark, Donald C.; Horowitz, Mark A.; Yu, Leung; Vu, Roxanne; Kim, Jun; Garlepp, Bruno W.; Ho, Tsyr-Chyang; Lau, Benedict Chung-Kwong, Memory controller that calibrates a transmit timing offset.
  11. Zerbe, Jared LeVan; Donnelly, Kevin S.; Sidiropoulos, Stefanos; Stark, Donald C.; Horowitz, Mark A.; Yu, Leung; Vu, Roxanne; Kim, Jun; Garlepp, Bruno W.; Ho, Tsyr-Chyang; Lau, Benedict Chung-Kwong, Memory controller with circuitry to set memory device-specific reference voltages.
  12. Bell, Debra M.; Silvestri, Paul A., Memory device having a delay locked loop with frequency control.
  13. Zerbe, Jared LeVan; Donnelly, Kevin S.; Sidiropoulos, Stefanos; Stark, Donald C.; Horowitz, Mark A.; Yu, Leung; Vu, Roxanne; Kim, Jun; Garlepp, Bruno W.; Ho, Tsyr-Chyang; Lau, Benedict Chung-Kwong, Memory system with calibrated data communication.
  14. Zerbe, Jared LeVan; Donnelly, Kevin S.; Sidiropoulos, Stefanos; Stark, Donald C.; Horowitz, Mark A.; Yu, Leung; Vu, Roxanne; Kim, Jun; Garlepp, Bruno W.; Ho, Tsyr-Chyang; Lau, Benedict Chung-Kwong, Memory system with calibrated data communication.
  15. Zerbe, Jared LeVan; Donnelly, Kevin S.; Sidiropoulos, Stefanos; Stark, Donald C.; Horowitz, Mark A.; Yu, Leung; Vu, Roxanne; Kim, Jun; Garlepp, Bruno W.; Ho, Tsyr-Chyang; Lau, Benedict Chung-Kwong, Memory system with calibrated data communication.
  16. Douglas A. Guddat ; Glenn F. King ; Tim Lambert ; Navin Saxena ; Peter J. DesRosier, Method and apparatus for software controlled timing of embedded memory.
  17. Kishimoto, Yoshihiro; Miki, Yoichiro; Sekiguchi, Yuji, Method and apparatus for timing adjustment.
  18. Kishimoto, Yoshihiro; Miki, Yoichiro; Sekiguchi, Yuji, Method and apparatus for timing adjustment.
  19. Kishimoto, Yoshihiro; Miki, Yoichiro; Sekiguchi, Yuji, Method and apparatus for timing adjustment.
  20. Kishimoto, Yoshihiro; Miki, Yoichiro; Sekiguchi, Yuji, Method and apparatus for timing adjustment.
  21. Kishimoto, Yoshihiro; Sekiguchi, Yuji; Miki, Yoichiro, Method and apparatus for timing adjustment.
  22. Kishimoto, Yoshihiro; Sekiguchi, Yuji; Miki, Yoichiro, Method and apparatus for timing adjustment.
  23. Kishimoto, Yoshihiro; Sekiguchi, Yuji; Miki, Yoichiro, Method and apparatus for timing adjustment.
  24. Kishimoto, Yoshihiro; Sekiguchi, Yuji; Miki, Yoichiro, Method and apparatus for timing adjustment.
  25. Kishimoto,Yoshihiro; Sekiguchi,Yuji; Miki,Yoichiro, Method and apparatus for timing adjustment.
  26. Kishimoto,Yoshihiro; Sekiguchi,Yuji; Miki,Yoichiro, Method and apparatus for timing adjustment.
  27. Rosno, Patrick Lee; Strom, James David, Optimizing performance of a clocked system by adjusting clock control settings and clock frequency.
  28. Lee Sang-bo,KRX ; Lee Jae-hyoong,KRX, Phase locked loop integrated circuits having dynamic phase locking characteristics and methods of operating same.
  29. Lee Sang-bo,KRX, Phase locked loop integrated circuits having fuse-enabled and fuse-disabled delay devices therein.
  30. Lee, Seong-Hoon; Ahn, Jun-Hong; Choi, Joo-Sun, Ring-resister controlled DLL with fine delay line and direct skew sensing detector.
  31. Fagan, John L.; Bossard, Mark, Selectable delay pulse generator.
  32. Kim, Kang Y., Self-timed fine tuning control.
  33. Kim, Kang Y., Self-timed fine tuning control.
  34. Kim,Kang Y., Self-timed fine tuning control.
  35. Kim,Kang Y., Self-timed fine tuning control.
  36. Miyanishi Atsushi,JPX ; Yamazaki Akira,JPX, Semiconductor device and method of fabricating the same.
  37. Eguchi, Fumio, Semiconductor device having PLL-circuit.
  38. Bell,Debra M.; Silvestri,Paul A., Semiconductor memory device capable of controlling clock cycle time for reduced power consumption.
  39. Stark, Donald C., Single-clock, strobeless signaling system.
  40. Van De Graaff, Scott, Synchronous mirror delay with reduced delay line taps.
  41. Van De Graaff, Scott, Synchronous mirror delay with reduced delay line taps.
  42. Van De Graaff, Scott, Synchronous mirror delay with reduced delay line taps.
  43. Van De Graaff, Scott, Synchronous mirror delay with reduced delay line taps.
  44. Pelley, Perry H., System and method for testing and providing an integrated circuit having multiple modules or submodules.
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