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[미국특허] SiC single crystal and method for growth thereof 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • C30B-023/06
출원번호 US-0856248 (1997-05-14)
우선권정보 JP-0056036 (1994-03-25)
발명자 / 주소
  • Takahashi Jun,JPX
  • Kanaya Masatoshi,JPX
  • Fujiwara Yuichiro,JPX
  • Ohtani Noboru,JPX
출원인 / 주소
  • Nippon Steel Corporation, JPX
대리인 / 주소
    Wenderoth, Lind & Ponack, L.L.P.
인용정보 피인용 횟수 : 29  인용 특허 : 4

초록

A method for the growth of a SiC single crystal comprising

대표청구항

[ We claim:] [8.] A method for the production of an SiC single crystal which is substantially free from defects corresponding to hexagonal etch pits and dislocations corresponding to shell-like etch pits, and which has a retarded density of pits and void defects caused by thermal etching, and which

이 특허에 인용된 특허 (4) 인용/피인용 타임라인 분석

  1. Kong Hua-Shuang (Raleigh NC) Glass Jeffrey T. (Apex NC) Davis Robert F. (Raleigh NC), Homoepitaxial growth of Alpha-SiC thin films and semiconductor devices fabricated thereon.
  2. Kong Hua-Shuang (Raleigh NC) Carter ; Jr. Calvin H. (Cary NC), Method of improving mechanically prepared substrate surfaces of alpha silicon carbide for deposition of beta silicon car.
  3. Addamiano, Arrigo, Method of preparing single crystalline cubic silicon carbide layers.
  4. Davis Robert F. (Raleigh NC) Carter ; Jr. Calvin H. (Raleigh NC) Hunter Charles E. (Durham NC), Sublimation of silicon carbide to produce large, device quality single crystals of silicon carbide.

이 특허를 인용한 특허 (29) 인용/피인용 타임라인 분석

  1. Neudeck, Philip G.; Powell, J. Anthony, Lateral movement of screw dislocations during homoepitaxial growth and devices yielded therefrom free of the detrimental effects of screw dislocations.
  2. Powell, Adrian; Brady, Mark; Mueller, Stephan G.; Tsvetkov, Valeri F.; Leonard, Robert T., Low 1C screw dislocation 3 inch silicon carbide wafer.
  3. Powell, Adrian; Brady, Mark; Mueller, Stephan G.; Tsvetkov, Valeri F.; Leonard, Robert T., Low 1C screw dislocation 3 inch silicon carbide wafer.
  4. Powell, Adrian; Brady, Mark; Mueller, Stephan G.; Tsvetkov, Valeri F.; Leonard, Robert T., Low 1C screw dislocation 3 inch silicon carbide wafer.
  5. Powell,Adrian; Brady,Mark; Mueller,Stephen G.; Tsvetkov,Valeri F.; Leonard,Robert T., Low 1c screw dislocation 3 inch silicon carbide wafer.
  6. Urakami, Yasushi; Adachi, Ayumu; Gunjishima, Itaru, Manufacturing method of silicon carbide single crystal.
  7. Tsvetkov,Valeri F.; Malta,David P., Method and apparatus for the production of silicon carbide crystals.
  8. Yury Alexandrovich Vodakov RU; Mark Grigorievich Ramm ; Evgeny Nikolaevich Mokhov RU; Alexandr Dmitrievich Roenkov RU; Yury Nikolaevich Makarov ; Sergei Yurievich Karpov RU; Mark Spiridonovich , Method for growing low defect density silicon carbide.
  9. Oyanagi,Naoki, Method for growth of silicon carbide single crystal, silicon carbide seed crystal, and silicon carbide single crystal.
  10. Danno, Katsunori, Method for producing sic single crystal having low defects by solution process.
  11. Oyanagi, Naoki; Syounai, Tomohiro; Sakaguchi, Yasuyuki, Method for producing silicon carbide single crystal.
  12. Kimoto, Tsunenobu; Shiomi, Hiromu; Saitoh, Hiroaki, Method of SiC single crystal growth and SiC single crystal.
  13. Urakami, Yasushi; Gunjishima, Itaru; Adachi, Ayumu, Method of manufacturing homogeneous silicon carbide single crystal with low potential of generating defects.
  14. Watanabe, Hiroki; Kitou, Yasuo; Naito, Masami, Method of manufacturing silicon carbide single crystal.
  15. Okamoto Atsuto,JPX ; Sugiyama Naohiro,JPX ; Tani Toshihiko,JPX ; Kamiya Nobuo,JPX ; Wakayama Hiroaki,JPX ; Fukushima Yoshiaki,JPX ; Hara Kazukuni,JPX ; Hirose Fusao,JPX ; Onda Shoichi,JPX ; Hara Kuni, Method of manufacturing silicon carbide single crystal and silicon carbide single crystal manufactured by the same.
  16. Wang, Shaoping; Kopec, Aneta; Ware, Rodd Mitchell; Holmes, Sonia, Method of silicon carbide monocrystalline boule growth.
  17. Mueller, Stephan, Methods of fabricating silicon carbide crystals.
  18. Mueller,Stephan, Methods of fabricating silicon carbide crystals.
  19. Mueller,Stephan, Methods of fabricating silicon carbide crystals.
  20. Colin Alan Warwick, Mitigation of deleterious effects of micropipes in silicon carbide devices.
  21. Leonard, Robert T.; Brady, Mark; Powell, Adrian, One hundred millimeter SiC crystal grown on off-axis seed.
  22. Mueller,Stephan; Powell,Adrian; Tsvetkov,Valeri F., Seed and seedholder combinations for high quality growth of large silicon carbide single crystals.
  23. Mueller,Stephan; Powell,Adrian; Tsvetkov,Valeri F., Seed and seedholder combinations for high quality growth of large silicon carbide single crystals.
  24. Nakamura, Daisuke; Ito, Tadashi; Kondo, Hiroyuki; Naito, Masami, SiC single crystal, method for manufacturing SiC single crystal, SiC wafer having an epitaxial film, method for manufacturing SiC wafer having an epitaxial film, and SiC electronic device.
  25. Peters Dethard,DEX ; Schorner Reinhold,DEX ; Stephani Dietrich,DEX, Silicon carbide semiconductor configuration with a high degree of channel mobility.
  26. Nakayama, Koji; Sugawara, Yoshitaka; Asano, Katsunori; Tsuchida, Hidekazu; Kamata, Isaho; Miyanagi, Toshiyuki; Nakamura, Tomonori, Silicon carbide semiconductor device and manufacturing method therefor.
  27. Fujibayashi, Hiroaki; Naito, Masami; Ooya, Nobuyuki, Single crystal compound semiconductor substrate.
  28. Fujibayashi, Hiroaki; Naito, Masami; Ooya, Nobuyuki, Stacked single crystal compound semiconductor substrates.
  29. Shaheen, Mohamad A.; Rachmady, Willy; Tolchinsky, Peter, Ultra-thin oxide bonding for S1 to S1 dual orientation bonding.

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