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Semiconductor thermal conditioning apparatus and method 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • F25B-021/02
  • F25B-029/00
출원번호 US-0972312 (1997-11-18)
발명자 / 주소
  • Gower Roger
  • Kingery John
  • Guthrie J. Cameron
  • Frost Kevin
  • Miller Steve
  • Uekert Ken
출원인 / 주소
  • Micro Component Technology, Inc.
대리인 / 주소
    Merchant & Gould P.C.
인용정보 피인용 횟수 : 35  인용 특허 : 17

초록

An apparatus for thermally conditioning a semiconductor unit is provided which includes a surface plate for receiving the semiconductor unit thereon which is connected to a thermoelectric device and a closed loop heat exchanger. At least one temperature sensor is disposed adjacent the surface plate

대표청구항

[ What is claimed is:] [1.] An apparatus for thermal conditioning of a semiconductor unit comprising:a surface plate for receiving the semiconductor unit thereon;at least one temperature sensor for sensing the temperature of the surface plate;a thermoelectric device having first and second sides wit

이 특허에 인용된 특허 (17)

  1. Baert Victor R. (Ramsey MN) Elfstrom Scott D. (North St. Paul MN) Williams Teddy P. (St. Paul MN), Apparatus and method for automatically calibrating for temperature an input tray of an integrated circuit handler.
  2. Peters Alfred C. (Garland TX), Apparatus for controlling the temperature of an integrated circuit package.
  3. Jones Elmer R. (North Reading MA), Burn-in module.
  4. Jones Elmer R. (North Reading MA), Burn-in tower.
  5. Falk Ronald J. (Scotts Valley CA) Lee John S. (Coon Rapids MN), Centering mechanism.
  6. Ahmann Gerald L. (St. Paul MN) Carlson Douglas M. (Anoka MN) Marquardt Warren B. (Stillwater MN) Offerdahl Richard E. (Shoreview MN) Paulson Roger A. (New Brighton MN) Vacca Anthony A. (New Brighton , Circuit packaging and cooling.
  7. Higgins Robert W. (San Jose CA), Compact replaceable temperature control module.
  8. Polkinghorne John D.,CAX ITX L7T 2B6, Compact thermoelectric refrigeration drive assembly.
  9. Amundson Arlon J. (St. Paul MN) Wurscher Robert J. (Shoreview MN) Buesing Jonathan P. (St. Paul MN), Integrated circuit component handler movement and heating system.
  10. Amundson Arlon J. (St. Paul MN) Wurscher Robert J. (Shoreview MN), Integrated circuit component handler singulation apparatus.
  11. , Integrated circuit handler heating and singulation apparatus.
  12. Swiatosz Edmund (Maitland FL), Integrated circuit temperature gradient and moisture regulator.
  13. Cesaroni Anthony J. (9 Heathmore Court Unionville ; Ontario CAX L3R 8J1), Panel heat exchanger with integral thermoelectric device.
  14. Jones Elmer R., Test handler for DUT's.
  15. Jones Elmer R. (North Reading MA), Thermal control system for a semi-conductor burn-in.
  16. Jones Elmer R. (North Reading MA), Thermal control system for a semi-conductor burn-in.
  17. Kerner James M. (779 Hillgrove Chico CA 95926), Thermoelectric closed-loop heat exchange system.

이 특허를 인용한 특허 (35)

  1. Tustaniwskyj, Jerry Ihor; Babcock, James Wittman, Abrupt power change method of preventing an integrated circuit chip from being thermally destroyed, in a tester, due to a defective pressed joint.
  2. Novotny, Shlomo; Dunn, John; Vogel, Marlin, Active temperature gradient reducer.
  3. Lubomirsky, Dmitry; Shanmugasundram, Arulkumar; Ellwanger, Russell; Pancham, Ian A.; Cheboli, Ramakrishna; Weidman, Timothy W., Apparatus for electroless deposition of metals onto semiconductor substrates.
  4. Lubomirsky, Dmitry; Shanmugasundram, Arulkumar; Pancham, Ian A., Apparatus for electroless deposition of metals onto semiconductor substrates.
  5. Lubomirsky,Dmitry; Shanmugasundram,Arulkumar; Ellwanger,Russell; Pancham,Ian A.; Cheboli,Ramakrishna, Apparatus for electroless deposition of metals onto semiconductor substrates.
  6. Pancham,Ian A.; Nguyen,Son T.; Rosen,Gary J., Apparatus to improve wafer temperature uniformity for face-up wet processing.
  7. Savelli, Guillaume; Coronel, Philippe, Cooling device equipped with a thermoelectric sensor.
  8. Brija, Francis Thomas, Food server.
  9. Burns Doreen DePalma, Full coverage thermal couple.
  10. Maeda, Masami; Shimojima, Toshioki, Handler provided with a temperature control unit.
  11. Zuo, Jon, Heat spreader with oscillating flow.
  12. Brija, Francis Thomas, Heating and cooling unit with canopy light.
  13. Brija, Francis Thomas; Wu, Ping, Heating and cooling unit with semiconductor device and heat pipe.
  14. Nguyen,Son T.; Rosen,Gary J.; Pancham,Ian A., Heating apparatus to heat wafers using water and plate with turbolators.
  15. Yamazaki,Koichi, Heating medium circulating device and thermal, treatment equipment using the device.
  16. Kainuma Tadashi,JPX ; Masuda Noboru,JPX ; Nakajima Haruki,JPX ; Igarashi Noriyuki,JPX ; Nansai Yuichi,JPX, IC testing apparatus.
  17. Tustaniwskyj, Jerry Ihor; Babcock, James Wittman, Initial contact method of preventing an integrated circuit chip from being thermally destroyed, in a tester, due to a defective pressed joint.
  18. Rennies Jos,BEX ; Noels Barts,BEX, Method and apparatus for temperature-controlled testing of integrated circuits.
  19. Pfahnl, Andreas C.; Dunn, Jr., John J., Methods and apparatus for testing a semiconductor structure using improved temperature desoak techniques.
  20. Roy,Shambhu N., Micro thermal chamber having proximity control temperature management for devices under test.
  21. Wah, Sum Kai; Boon, Tan Wee; Jin, Yap Liop, Multi-package conversion kit for a pick and place handler.
  22. Sugiyama,Masahiko; Inoue,Yoshinori, Prober and probe testing method for temperature-controlling object to be tested.
  23. Sugiyama,Masahiko; Inoue,Yoshinori, Prober and probe testing method for temperature-controlling object to be tested.
  24. Pfahnl, Andreas C.; Moore, John D., Semiconductor handler for rapid testing.
  25. Bandoh, Kenichi; Ohsawa, Akihiro; Minonishi, Mikio, Substrate temperature control plate and substrate temperature control apparatus comprising same.
  26. Yip,Tsunwai Gary; Nguyen,David, System for controlling the temperature of electronic devices.
  27. Emoto,Keiji, Temperature adjustment apparatus, exposure apparatus having the temperature adjustment apparatus, and semiconductor device manufacturing method.
  28. Emoto,Keiji, Temperature adjustment apparatus, exposure apparatus having the temperature adjustment apparatus, and semiconductor device manufacturing method.
  29. Atlas, Boris, Temperature control system for electrostatic chucks and electrostatic chuck for same.
  30. Huang Yun,SGXITX 760610, Temperature control system for test heads.
  31. Oh, Jea-Muk; Kim, Sangil; Min, Byoungjun; Park, Jongpil, Test handler that rapidly transforms temperature and method of testing semiconductor device using the same.
  32. Ghoshal, Uttam Shyamalindu, Thermoelectric spot coolers for RF and microwave communication integrated circuits.
  33. Uttam Shyamalindu Ghoshal, Thermoelectric spot coolers for RF and microwave communication integrated circuits.
  34. Wallach, John M., Thermoelectric system to directly regulate the temperature of intravenous solutions and bodily fluids.
  35. Melgaard, Hans L.; Bell, Jeffrey A., Wafer-level burn-in oven.
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