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Systems and methods for detection of labeled materials 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01N-021/64
출원번호 US-0856642 (1997-05-15)
발명자 / 주소
  • Stern David
출원인 / 주소
  • Affymetrix, Inc.
대리인 / 주소
    Townsend&Townsend&Crew
인용정보 피인용 횟수 : 178  인용 특허 : 59

초록

Labeled targets on a support synthesized with polymer sequences at known locations according to the methods disclosed in U.S. Pat. No. 5,143,854 and PCT WO 92/10092 or others, can be detected by exposing marked regions of sample to radiation from a source and detecting the emission therefrom, and re

대표청구항

[ What is claimed is:] [1.] A system for detecting marked regions on a surface of a substrate, the system comprising:an excitation radiation source;a focusing system for focusing radiation from said excitation radiation source onto a selected region of said surface of said substrate, said focusing s

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