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[미국특허] Test system with robot arm for delivering a device under test 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01R-001/04
출원번호 US-0940315 (1997-09-30)
발명자 / 주소
  • Miller James K.
  • Crawford Robin J.
출원인 / 주소
  • Motorola, Inc.
대리인 / 주소
    Patrick
인용정보 피인용 횟수 : 81  인용 특허 : 9

초록 ▼

A test system (100) for testing electronic devices includes a conveyor (130) to convey the electronic devices, a test fixture (112) to test the electronic devices, and a robot apparatus (102). The robot apparatus (102) has a robot arm (118) positionable within an accessible region (216) to deliver e

대표청구항 ▼

[ What is claimed is:] [1.] A test system for testing electronic devices, the test system comprising:a frame comprising a base, a canopy, and a test area positioned therebetween;a plurality of test equipment housed in the base and the canopy;a conveyor system housed in the test area to convey the el

이 특허에 인용된 특허 (9) 인용/피인용 타임라인 분석

  1. Best Norman D. (63 Glenflow Ct. Glendale CA 91206), Apparatus for assembling and processing small parts using a robot.
    상세보기
  2. Yamazaki Mitsuru (Itami JPX) Yashiro Masakazu (Itami JPX) Ijichi Toshiya (Itami JPX), Apparatus for inspecting characteristics of semiconductor chips.
    상세보기
  3. Van Durrett William (Charlotte NC) Hieronymus Gerald W. (Charlotte NC) Pond Marguerite A. (Charlotte NC) Price Todd D. (Charlotte NC) Scurry Margaret L. S. (Charlotte NC) Steene William C. (Gastonia , Automated palletizing system.
    상세보기
  4. Okuda Hiroshi,JPX ; Nemoto Shin,JPX ; Hayama Hisao,JPX ; Kojima Katsumi,JPX, Automatic test handler system for IC tester.
    상세보기
  5. Karasawa Wataru (Yokohama JPX), Electrical characteristics measurement method and measurement apparatus therefor.
    상세보기
  6. Pearson Thomas E. (Grosse Ile MI) Panyard James R. (Westland MI), Method and system for loading panels into shipping containers at a work station and end effector for use therein.
    상세보기
  7. Baba Minoru (Saitama JPX), Pick and place for automatic test handler.
    상세보기
  8. Matrone John L. (Schenectady NY) Stamp Ronald L. (Averill Park NY) Babcock Douglas M. (Latham NY), System for configuring, automating and controlling operations performed on PCBS and other products.
    상세보기
  9. Liken Peter A. (West Olive) Holmes Robert J. (Grand Rapids) Bouwman George J. (Saugatuck MI), Unitized test system with bi-directional transport feature.
    상세보기

이 특허를 인용한 특허 (81) 인용/피인용 타임라인 분석

  1. Uzelac, Aleksandar; Batchvarov, Andrey B., Acoustic touch sensitive testing.
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  2. Zhao, Weidong; Stevens, David A.; Uzelac, Aleksandar; Shigemitsu, Takahiro; Wilson, Andrew David; Keam, Nigel Stuart, Angular contact geometry.
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  3. Butler, Brian D., Automated domain reflectometry testing system.
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  4. Noble, Scott; Garcia, Edward; Polyakov, Evgeny; Truebenbach, Eric L.; Merrow, Brian S., Bulk feeding disk drives to disk drive testing systems.
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  5. Noble, Scott; Garcia, Edward; Polyakov, Evgeny; Truebenbach, Eric L.; Merrow, Brian S., Bulk feeding disk drives to disk drive testing systems.
    상세보기
  6. Truebenbach, Eric L., Bulk transfer of storage devices using manual loading.
    상세보기
  7. Truebenbach, Eric L., Bulk transfer of storage devices using manual loading.
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  8. Co, Ramon S.; Lai, Tat Leung; Leong, Calvin G., Chip handler with a buffer traveling between roaming areas for two non-colliding robotic arms.
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  9. Uzelac, Aleksandar; Stevens, David A.; Zhao, Weidong; Shigemitsu, Takahiro; Willoughby, Briggs A.; Pierce, John Graham; Santiago, Pravin Kumar; Ranta, Craig S.; Wright, Timothy Allen; Maier, Jeffrey C.; Perry, Robert T.; Kirilov, Stanimir Naskov, Contact geometry tests.
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  10. Rogel-Favila, Ben; Nalluri, Padmaja; Allison, Kirsten, Controlling automated testing of devices.
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  11. Rogel-Favila, Ben; Fishman, James, Customizable tester having testing modules for automated testing of devices.
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  12. Martino, Peter, Damping vibrations within storage device testing systems.
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  13. Merrow, Brian S.; Truebenbach, Eric L.; Smith, Marc Lesueur, Dependent temperature control within disk drive testing systems.
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  14. Hennekes, Willem Antonie; Pothoven, Antoon Willem, Device, assembly and method for testing electronic components, and calibrating method therefor.
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  15. Merrow, Brian S.; Garcia, Edward; Polyakov, Evgeny, Disk drive transport, clamping and testing.
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  17. Merrow, Brian S.; Garcia, Edward; Polyakov, Evgeny, Disk drive transport, clamping and testing.
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  18. Arena, John Joseph; Suto, Anthony J., Electronic assembly test system.
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  19. Merrow, Brian S., Enclosed operating area for disk drive testing systems.
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  20. Merrow, Brian S., Enclosed operating area for storage device testing systems.
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  21. Campbell, Philip; Wrinn, Joseph F., Engaging test slots.
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  22. Bednar, Thomas Richard; Gould, Scott Whitney; Lackey, David E.; Stout, Douglas Willard; Zuchowski, Paul Steven, Global voltage buffer for voltage islands.
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  23. Fleming,Timothy J.; Hohn,Jeffrey J.; Holloman,Christopher R.; Wheeler,Steven E.; Miller,Charles N., Goniometer.
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  24. Merrow, Brian S.; Akers, Larry W., Heating storage devices in a testing system.
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  25. Welch, Steven Andrew; Shigemitsu, Takahiro; Wright, Timothy Allen; Vance, Mark D.; Wittenberg, Steven E., Input testing tool.
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  26. Dougherty, Thomas Eugene; Wang, Hongyu; Gu, Hongbing; Omidfar, Bahram, Intelligent mobile device test fixture.
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  27. Uzelac, Aleksandar; Stevens, David A.; Batchvarov, Andrey B.; Lee, Changsin; Shigemitsu, Takahiro, Latency measurement.
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  28. Uzelac, Aleksandar; Stevens, David A.; Zhao, Weidong; Shigemitsu, Takahiro; Willoughby, Briggs A.; Pierce, John Graham; Santiago, Pravin Kumar; Ranta, Craig S.; Wright, Timothy Allen; Maier, Jeffrey C.; Perry, Robert T.; Kirilov, Stanimir Naskov, Latency measurement.
    상세보기
  29. Fleming,Timothy J.; Hohn,Jeffrey J.; Holloman,Christopher R.; Wheeler,Steven E.; Miller,Charles N., Method and apparatus for calibrating a vision system to a parts handling device.
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  30. Melikian, Simon, Method for picking up an article using a robot arm and associated system.
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  31. Lee, Robin; Conti, Chris, Moving light table.
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  32. Lee, Robin; Conti, Chris, Moving light table.
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  33. Rogel-Favila, Ben; Fishman, James, Multi-configurable testing module for automated testing of a device.
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  34. Zhao, Weidong; Stevens, David A.; Uzelac, Aleksandar, Multi-finger detection and component resolution.
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  35. Zhao, Weidong; Stevens, David A.; Uzelac, Aleksandar, Multi-pass touch contact tracking.
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  36. Ogino, Kazuhito; Iijima, Toshihiko; Arai, Kaori, Pre-alignment method of semiconductor wafer and computer-readable recording medium having pre-alignment program recorded thereon.
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  37. Zhao, Weidong; Stevens, David A.; Uzelac, Aleksandar; Benko, Hrvoje; Miller, John L., Prediction-based touch contact tracking.
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  38. Uzelac, Aleksandar; Stevens, David A.; Zhao, Weidong; Shigemitsu, Takahiro; Willoughby, Briggs A.; Pierce, John Graham; Santiago, Pravin Kumar; Ranta, Craig S.; Wright, Timothy Allen; Maier, Jeffrey C.; Perry, Robert T.; Kirilov, Stanimir Naskov; Batchvarov, Andrey B., Probabilistic latency modeling.
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  39. Uzelac, Aleksandar; Stevens, David A.; Zhao, Weidong; Shigemitsu, Takahiro; Willoughby, Briggs A.; Pierce, John Graham; Santiago, Pravin Kumar; Ranta, Craig S.; Wright, Timothy Allen; Maier, Jeffrey C.; Perry, Robert T.; Kirilov, Stanimir Naskov; Batchvarov, Andrey B., Probabilistic latency modeling.
    상세보기
  40. Lee, Bobby; Jenkinson, David Ross, Radio frequency shielded robotic telecommunication device testing platform.
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  41. Tieman, Craig Arnold, Remote control button actuation module, system, and method.
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  42. Tieman, Craig Arnold, Remote control button actuation module, system, and method.
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  43. Yamaguchi, Yukihiro, Robot, robot system, and robot control apparatus.
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  44. Jenkinson, David Ross; Lee, Bobby; Liaw, Gavin, Robotic device tester.
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  49. Jenkinson, David; Lee, Bobby; Liaw, Gavin; Frederick, Hans, Robotic device tester.
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  50. Kantor, Arcadiy G.; Bockelman, Jonathan A.; Steinbok, Jeffrey E.; Filman, Sarah M., Shared item account selection.
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  51. Kantor, Arcadiy G.; Bockelman, Jonathan A.; Steinbok, Jeffrey E.; Filman, Sarah M., Shared item account selection.
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  52. Merrow, Brian S.; Akers, Larry W., Storage device temperature sensing.
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  53. Merrow, Brian S.; Akers, Larry W., Storage device temperature sensing.
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  54. Merrow, Brian S., Storage device testing system cooling.
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  55. Merrow, Brian S., Storage device testing system cooling.
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  56. Merrow, Brian S.; Akers, Larry W., Storage device testing system with a conductive heating assembly.
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  57. Rogel-Favila, Ben; Fishman, James, Supporting automated testing of devices in a test floor system.
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  58. Merrow, Brian S., Temperature control within disk drive testing systems.
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  59. Merrow, Brian S., Temperature control within disk drive testing systems.
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  60. Merrow, Brian S., Temperature control within storage device testing systems.
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  61. Merrow, Brian S.; Krikorian, Nicholas C., Test slot cooling system for a storage device testing system.
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  62. Merrow, Brian S.; Krikorian, Nicholas C., Test slot cooling system for a storage device testing system.
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  63. Su, Mei-Mei; Rogel-Favila, Ben, Test system and method.
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  64. Merrow, Brian S., Thermal control system for test slot of test rack for disk drive testing system with thermoelectric device and a cooling conduit.
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  65. Park, Young Bu, Touch quality test robot.
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  66. Jenkinson, David Ross, Touch screen testing platform.
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  67. Jenkinson, David Ross, Touch screen testing platform for engaging a dynamically positioned target feature.
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  68. Jenkinson, David Ross, Touch screen testing platform having components for providing conductivity to a tip.
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  69. Uzelac, Aleksandar; Stevens, David A.; Zhao, Weidong; Shigemitsu, Takahiro; Willoughby, Briggs A.; Pierce, John Graham, Touchscreen testing.
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  70. Uzelac, Aleksandar; Stevens, David A.; Zhao, Weidong; Shigemitsu, Takahiro; Willoughby, Briggs A.; Pierce, John Graham, Touchscreen testing.
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  71. Polyakov, Evgeny; Garcia, Edward; Truebenbach, Eric L.; Merrow, Brian S.; Whitaker, Brian J., Transferring disk drives within disk drive testing systems.
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  72. Polyakov, Evgeny; Garcia, Edward; Truebenbach, Eric L.; Merrow, Brian S.; Whitaker, Brian J., Transferring disk drives within disk drive testing systems.
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  73. Polyakov, Evgeny; Garcia, Edward; Truebenbach, Eric L.; Merrow, Brian S.; Whitaker, Brian J., Transferring storage devices within storage device testing systems.
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  74. Toscano, John; Polyakov, Evgeny; Garcia, Edward; Truebenbach, Eric L.; Merrow, Brian S.; Whitaker, Brian J., Transferring storage devices within storage device testing systems.
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  75. Toscano, John; Polyakov, Evgeny; Garcia, Edward; Truebenbach, Eric L.; Merrow, Brian S.; Whitaker, Brian J., Transferring storage devices within storage device testing systems.
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  76. Rogel-Favila, Ben; Wolff, Roland; Kushnick, Eric; Fishman, James, Universal container for device under test.
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  77. Rogel-Favila, Ben; Wolff, Roland; Kushnick, Eric; Fishman, James, Universal test cell.
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  78. Rogel-Favila, Ben; Wolff, Roland; Kushnick, Eric; Fishman, James; Su, Mei-Mei, Universal test floor system.
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  79. Merrow, Brian S., Vibration isolation within disk drive testing systems.
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  80. Yang, Wen-Kun, Wafer level board/card assembly apparatus.
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  81. Boss, Gregory J.; Moore, Jr., John E.; Rakshit, Sarbajit K., Wearable device testing.
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