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Solid state temperature measurement 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H01L-035/00
출원번호 US-0047633 (1998-03-25)
발명자 / 주소
  • Kunst David J.
출원인 / 주소
  • Mosaic Design Labs, Inc.
대리인 / 주소
    Ryan
인용정보 피인용 횟수 : 122  인용 특허 : 11

초록

In a temperature measuring circuit suitable for implementation on an integrated circuit (IC) a plurality, M, nominally unit value current sources are individually and collectively applied to a sensor such as a diode or transistor. The resulting individual V.sub.BE voltages are measured and used to f

대표청구항

[ What is claimed is:] [1.] A temperature measurement system comprisingM>1 current sources having respective current outputs I.sub.j, j=1,2, . . . , M, where each I.sub.j =I.sub.u +e.sub.j, I.sub.u being a fixed-valued current and e.sub.j an error current representing a deviation from said I.sub.u,m

이 특허에 인용된 특허 (11)

  1. Johnston Craig E. (Woodinville WA) Goyal Ramesh C. (Mountlake Terrace WA), Auto-zero amplifier circuit with wide dynamic range.
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  8. Kornblum John J. (Indialantic FL) Ugarte Carlos A. (Palm Bay FL) Ma Fan Y. (Girang SGX), Sigma Delta analog to digital converter with three point calibration apparatus and method.
  9. Seaberg C. Eric (Austin TX), Sigma-delta analog-to-digital converter (ADC) with feedback compensation and method therefor.
  10. Rabaey Dirk H. L. C. (Borgerhout BEX), Switched capacitance feedback control circuit and sigma-delta modulator using same.
  11. Kalthoff Timothy V. (Tucson AZ) Wang Binan (Tucson AZ) Wu Miaochen (Tucson AZ), Switched capacitor input sampling circuit and method for delta sigma modulator.

이 특허를 인용한 특허 (122)

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