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[미국특허] Methods and circuitry for correcting temperature-induced errors in microbolometer focal plane array 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01J-005/20
  • G01J-005/24
출원번호 US-0021714 (1998-02-10)
발명자 / 주소
  • Parrish William J.
  • Woolaway James T.
출원인 / 주소
  • Indigo Systems Corporation
대리인 / 주소
    Skjerven, Morrill, MacPherson, Franklin & Friel LLPSteuber
인용정보 피인용 횟수 : 64  인용 특허 : 5

초록

Correction for temperature-induced non-uniformities in the response characteristics of the microbolometers in an infrared focal plane array (FPA) is performed by applying a non-uniform corrective bias to the individual microbolometers. The corrective bias is applied either before or during the bias

대표청구항

[ We claim:] [1.] A microbolometer detector circuit comprising:a substrate;a first microbolometer detector attached to but substantially thermally isolated from said substrate;a second microbolometer detector thermally shorted to said substrate, said second microbolometer detector being for providin

이 특허에 인용된 특허 (5) 인용/피인용 타임라인 분석

  1. Gates James L. (Lake Oswego OR), Micro-bolometric infrared staring array.
  2. Lung Gerald (Los Angeles CA), Microbolometer unit cell signal processing circuit.
  3. Cole Barrett E. (Bloomington MN), Microstructure design for high IR sensitivity.
  4. Hanson Charles M. (Richardson TX) Dudley Dana (Dallas TX) Robinson James E. (Dallas TX), Thermal imaging system with integrated thermal chopper.
  5. Keenan William F. (Plano TX), Uncooled infrared detector and method for forming the same.

이 특허를 인용한 특허 (64) 인용/피인용 타임라인 분석

  1. Wand Martin A. ; Rachels Kenneth ; Brady John F. ; Weinstein Michael ; Ratcliff David D., Ambient temperature micro-bolometer control, calibration, and operation.
  2. Parrish, William J., Bolometer array compensation.
  3. Simolon, Brian B.; Aziz, Naseem Y.; Högasten, Nicholas, Bolometer circuitry and methods for difference imaging.
  4. Vilain, Michel; Robert, Patrick, Bolometric detector with a temperature-adaptive biasing.
  5. Salmon, Neil A, Calibrating radiometers.
  6. Granneman, Russell; Nagahawatte, Nuwan; Goeden, Richard M.; Takagi, Ted; Ernst, Robert; Hughes, Gary B.; Kostrzewa, Joseph; Graff, John; Speake, George; Kent, Michael; Nalam, Neela; Lyon, Stephen; Sharp, Barbara; Boulanger, Pierre; Cutcliffe, Neil; Martin, Tim; Hoelter, Ted, Calibration systems and methods for infrared cameras.
  7. Lee,Hee Chul; Hwang,Chi Ho; Lee,Yong Soo; Kang,Sang Gu, Compensation circuit for compensating non-uniformity according to change of operating temperature of bolometer.
  8. Huppertz, Juergen, Concept for determining a measurement value at a component.
  9. Le Noc, Loic; Tremblay, Bruno, Detection and correction of a loss of calibration of microbolometer thermal imaging radiometers.
  10. Kostrzewa, Joseph; Araki, Leonard; Grannemann, Russell D., Detection and mitigation of burn-in for thermal imaging systems.
  11. Woolaway, James T.; Schlesselmann, John D., Detector array for high speed sampling of an optical pulse.
  12. Robert,Patrick, Device for detecting electromagnetic radiations.
  13. Butler, Neal R., Digital offset corrector.
  14. Chalk, Chris; Thorne, Peter, IR detector system and method.
  15. Boulanger, Pierre; Tremblay, Marcel; Goodland, Jim; Sharp, Barbara; Mirbod, Farhad; Hoelter, Theodore R., Infrared camera architecture systems and methods.
  16. Boulanger, Pierre; Tremblay, Marcel; Goodland, Jim; Sharp, Barbara; Mirbod, Farhad; Hoelter, Theodore R., Infrared camera architecture systems and methods.
  17. Barton, Jeffrey B.; Hoelter, Theodore R., Infrared detector array with improved spectral range and method for making the same.
  18. Shigenaka,Keitaro; Iida,Yoshinori, Infrared image sensor.
  19. Martin, Jean-Luc; Mottin, Eric; Laflaquiere, Arnaud, Infrared radiation detection device.
  20. D'Souza,Arvind I; Stapelbroek,Maryn G.; Dawson,Larry C.; Molyneux,Dale E., Infrared radiation image having sub-pixelization and detector interdigitation.
  21. D'Souza, Arvind I; Stapelbroek, Maryn G; Dawson, Larry C; Molyneux, Dale E, Infrared radiation imager having sub-pixelization and detector interdigitation.
  22. Denham, Martin S., Infrared thermal imaging system and method.
  23. Kuiken, Matthew T.; Black, Stephen H., Infrared thermal imaging system and method.
  24. Simolon, Brian B.; Aziz, Naseem Y.; Nussmeier, Mark T.; Cannata, Robert F., Low cost and high performance bolometer circuitry and methods.
  25. Nussmeier, Mark; Kurth, Eric A.; Högasten, Nicholas; Hoelter, Theodore R.; Strandemar, Katrin; Boulanger, Pierre; Sharp, Barbara, Low power and small form factor infrared imaging.
  26. Nussmeier, Mark; Kurth, Eric A.; Högasten, Nicholas; Hoelter, Theodore R.; Strandemar, Katrin; Boulanger, Pierre; Sharp, Barbara, Low power and small form factor infrared imaging.
  27. Nussmeier, Mark; Kurth, Eric A.; Högasten, Nicholas; Hoelter, Theodore R.; Strandemar, Katrin; Boulanger, Pierre; Sharp, Barbara, Low power and small form factor infrared imaging.
  28. Alacoque, Laurent, Measurement circuit for bolometric detector.
  29. Charles S. Kaufman ; Randolph S. Carson ; William B. Hornback, Method and apparatus for temperature compensation of an uncooled focal plane array.
  30. Kaufman, Charles S.; Carson, Randolph S.; Hornback, William B., Method and apparatus for temperature compensation of an uncooled focal plane array.
  31. Kennedy, Adam M.; Ray, Michael; Wyles, Richard H.; Wyles, Jessica K.; Radford, William A., Method and apparatus providing focal plane array active thermal control elements.
  32. Minassian, Christophe; Pistre, Claire; Chiappa, Jean-Marc, Method for correcting images output by a detector without temperature regulation and detector implementing such a method.
  33. Porter, Stephen George; Fox, John; Singh, Bhajan, Method of multiplexing column amplifiers in a resistive bolometer array.
  34. Butler, Neal R., Methods and apparatus for compensating a radiation sensor for temperature variations of the sensor.
  35. Kurth, Eric A.; Franklin, Patrick, Microbolometer contact systems and methods.
  36. Kurth, Eric A.; Franklin, Patrick, Microbolometer contact systems and methods.
  37. Petraitis, Yaroslava; Bornfreund, Richard E.; Durham, Joseph H.; Cannata, Robert F., Microbolometer detector layer.
  38. Parrish, William J.; Heath, Jeffrey L.; Aziz, Naseem Y.; Kostrzewa, Joseph; Poe, George H., Microbolometer focal plane array methods and circuitry.
  39. Parrish,William J.; Aziz,Naseem Y.; Kurth,Eric A.; Schlesselmann,John D., Microbolometer focal plane array systems and methods.
  40. McManus, Timothy J.; Anderson, Shane M., Microbolometer focal plane array with controlled bias.
  41. Timothy J. McManus ; Shane M. Anderson, Microbolometer focal plane array with controlled bias.
  42. Anderson,Shane M.; McManus,Timothy J., Microbolometer focal plane array with temperature compensated bias.
  43. Anderson,Shane M.; McManus,Timothy J., Microbolometer focal plane array with temperature compensated bias.
  44. Woolaway, James T.; Richards, Austin A., Microbolometer optical cavity tuning and calibration systems and methods.
  45. Cannata, Robert F.; Petraitis, Yaroslava; Franklin, Patrick; Simes, Robert; Bornfreund, Richard E., Multilayered microbolometer film deposition.
  46. Fukui, Suguru; Hatatani, Teruki, Object detection device.
  47. Lv, Jian; Que, Longcheng; Zhou, Yun; Wei, Linhai; Jiang, Yadong, Readout circuit for uncooled infrared focal plane array.
  48. Wood, Roland A., Readout technique for microbolometer array.
  49. Allen,Thomas P.; Butler,Neal R., Real-time radiation sensor calibration.
  50. Leddy, Christopher; Coda, Robert J.; Lee, Johnny Y.; Nash, Stephen R., Responsivity correction for electro-optical imagers.
  51. Lingren, Clinton L.; Friesenhahn, Stanley J.; Butler, Jack F.; Dory, F. Patrick; Ashburn, William L.; Augustine, Frank L.; Apotovsky, Boris, Semiconductor gamma-ray camera and medical imaging system.
  52. Bluzer, Nathan, Sensitive silicon sensor and test structure for an ultra-sensitive silicon sensor.
  53. Speake, George; Nagahawatte, Nuwan; Goeden, Richard M.; Takagi, Ted; Ernst, Robert; Hughes, Gary B.; Kostrzewa, Joseph; Graff, John; Granneman, Russell; Kent, Michael; Nalam, Neela; Lyon, Stephen; Sharp, Barbara; Boulanger, Pierre; Cutcliffe, Neil; Martin, Tim; Hoelter, Ted, Sensor calibration systems and methods for infrared cameras.
  54. Herrmann, Ingo; Reinhart, Karl-Franz; Herrmann, Daniel; Freund, Frank, Sensor system and method for operating a sensor system.
  55. Aziz, Naseem Y.; Cannata, Robert F., Switched capacitor filter systems and methods.
  56. Aziz, Naseem Y.; Cannata, Robert F., Systems and methods for selecting microbolometers within microbolometer focal plane arrays.
  57. Cope, Richard D., Thermal imaging calibration systems and methods.
  58. Cryder, Michael E.; Tatko, Henry J; Woolaway, James T.; Schlesselmann, John D., Three dimensional ladar imaging and methods using voxels.
  59. Bluzer,Nathan, Ultra sensitive silicon sensor readout circuitry.
  60. Ratiff,Bradley M.; Hayat,Majeed M.; Tyo,J. Scott; Turner, Jr.,Theodore S., Uniform, non-disruptive, and radiometrically accurate calibration of infrared focal plane arrays using global scene motion.
  61. Woolaway, James T.; Schlesselmann, John D., Unit cells with avalanche photodiode detectors.
  62. Carlson, Gregory A.; Matson, Alex; Sharpe, Andrew; Beard, Davey; Schweikert, Paul; Simes, Robert, Wafer level packaging of infrared camera detectors.
  63. Carlson, Gregory A.; Matson, Alex; Sharpe, Andrew; Beard, Davey; Schweikert, Paul; Simes, Robert, Wafer level packaging of infrared camera detectors.
  64. Schweikert, Paul; Sharpe, Andrew; Carlson, Gregory A.; Matson, Alex; Vilander, Scott; Zahuta, Bob; Goeden, Richard M., Wafer level packaging of microbolometer vacuum package assemblies.

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