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Method for enhancing chemisorption of material 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • B05D-003/00
출원번호 US-0039439 (1998-03-16)
발명자 / 주소
  • Engelsberg Audrey C.
출원인 / 주소
  • Cauldron Limited Partnership
대리인 / 주소
    Morgan, Lewis & Bockius LLP
인용정보 피인용 횟수 : 43  인용 특허 : 24

초록

An apparatus and method for selectively removing undesired material from the surface of a substrate provides a flow of inert gas over the undesired material substrate surface while irradiating the undesired material with energetic photons. The invention enables removal of undesired material without

대표청구항

[ What is claimed is:] [1.] A method for enhancing chemisorption of a desired material onto the treatment surface of a substrate having bond sites occupied by undesired material comprising the steps of:introducing across the treatment surface a flow of gas substantially inert to the substrate;simult

이 특허에 인용된 특허 (24)

  1. Grant Robert W. (Excelsior MN) Novak Richard E. (Plymouth MN), Cluster tool dry cleaning system.
  2. Cook Lacy G. (El Segundo CA) Wheeler Bryce A. (Mammoth Lakes CA), Contaminant removal from telescope optical elements.
  3. Deml Reinhold (Munich DEX) Giglberger Dieter (Unterhaching DEX) Greis Ulrich (Weyarn DEX), Daylight projection screen and method and apparatus for making the same.
  4. Blum Samuel E. (White Plains NY) Srinivasan Rangaswamy (Ossining NY) Wynne James J. (Mt. Kisco NY), Far ultraviolet surgical and dental procedures.
  5. Wu Jeff C. (Clemmons NC) Cvijanovich George B. (Winston-Salem NC) Williams Richard T. (Winston-Salem NC), Laser cleaning of metal stock.
  6. Russell Stephen D. (San Diego CA) Sexton Douglas A. (San Diego CA) Kelley Eugene P. (Spring Valley CA), Laser texturing.
  7. Boquillon Jean-Pierre (Dijon FRX) Berger Hubert (Saint Apollinaire FRX) Bresson Philippe (Dijon FRX), Method and a device for cleaning a surface with a laser.
  8. Horiike Yasuhiro (10-7-603 Hikarigaoka ; Higashi-ku ; Hiroshima-shi ; Hiroshima-ken JPX) Kawamura Kohei (Tokyo JPX), Method and apparatus for processing surface of semiconductor layer.
  9. Langen Robert (Quienstrasse 29 D-6600 Saarbrcken DEX), Method and apparatus for removing impurities from metallic objects.
  10. Allen Susan D. (Iowa IA), Method and apparatus for removing minute particles from a surface.
  11. Urbnek Peter (Trencn CSX) Farkas Peter (Trencn CSX) Cvopa Rudolf (Trencn CSX) Faskov Mria (BanskBystrica CSX) Drbohlav Jaroslav (Turnov CSX), Method and apparatus for selective creation of a decor on hollow axially-symmetric products by a laser beam.
  12. Cates Michael C. (Solana Beach) Hamm Richard R. (San Diego) Hoogerwerf John D. (San Diego CA), Method and system for control of a material removal process using spectral emission discrimination.
  13. Cates Michael C. (Solana Beach CA) Hamm Richard R. (San Diego CA) Lewis Michael W. (Wichita KS) Schmitz Wayne N. (St. Louis MO), Method and system for removing a coating from a substrate using radiant energy and a particle stream.
  14. Magee Thomas J. (Belmont CA) Leung Charles S. (San Jose CA) Press Richard L. (San Jose CA), Method for cleaning surfaces using UV lasers.
  15. Takemura Kazumi (Tokyo JPX) Toyokawa Fumitoshi (Tokyo JPX) Mikami Masao (Tokyo JPX), Method of gettering semiconductor wafers with an excimer laser beam.
  16. Share Lawrence (Skokie IL) Van Erden Donald L. (Wildwood IL) Hoadley James E. (Palatine IL), Method of making a laser ablated formed cap.
  17. Cates Michael C. (Solana Beach CA) Hamm Richard R. (San Diego CA), Photoacoustic control of a pulsed light material removal process.
  18. Elliott David J. (Wayland MA) Hollman Richard F. (Chelmsford MA) Yans Francis M. (Concord MA) Singer Daniel K. (Natick MA), Photoreactive surface processing.
  19. Hongo Mikio (Yokohama JPX) Nakabayashi Junichi (Yokohama JPX), Processing of photomask.
  20. Mayer Frederick J. (Ann Arbor MI), Pulsed laser microfabrication.
  21. Engelsberg Audrey C. (23 Elmer Pl. Milton VT 05468), Removal of surface contaminants by irradiation from a high-energy source.
  22. Engelsberg Audrey C. (61-B Sherwood Forest Wappingers Falls NY 12590), Removal of surface contaminants by irradiation from a high-energy source.
  23. Engelsberg Audrey C. (Milton VT) Fitzpatrick Donna R. (Washington DC), Selective removal of material by irradiation.
  24. Nagy Robert E. (Xenia OH) Shelton Timothy F. (Xenia OH) Milam Jeffrey L. (Beavercreek OH), System for cleaning molding equipment using a laser.

이 특허를 인용한 특허 (43)

  1. Garner,Stuart, Anti-fouling apparatus and method.
  2. Cindy J. Hayden ; David H. Peterson, Apparatus and method of cleaning reticles for use in a lithography tool.
  3. Allen,Susan Davis, Apparatus for removal of minute particles from a surface using thermophoresis to prevent particle redeposition.
  4. Welty,Richard P., Article with scandium compound decorative coating.
  5. Saylor, Stephen D.; Pralle, Martin U., Biometric imaging devices and associated methods.
  6. Wong, Alan, Characterization of induced shift on an overlay target using post-etch artifact wafers.
  7. Pan, Zhengda; Xuan, Jialuo Jack; Shih, Chung Y., Crystal zone texture of glass-ceramic substrates for magnetic recording disks.
  8. Mazur, Eric; Winkler, Mark, Engineering flat surfaces on materials doped via pulsed laser irradiation.
  9. Tanabe, Masayuki; Fukuda, Yasuaki; Tsukamoto, Masami, Exposure apparatus, and device manufacturing method.
  10. Mazur, Eric; Shen, Mengyan, Femtosecond laser-induced formation of submicrometer spikes on a semiconductor substrate.
  11. Mazur, Eric; Shen, Mengyan, Femtosecond laser-induced formation of submicrometer spikes on a semiconductor substrate.
  12. Uziel, Yoram; Yogev, David; Poles, Ehud; Wachs, Amir, In situ module for particle removal from solid-state surfaces.
  13. Lowry,Robert K., Laser decapsulation apparatus and method.
  14. Lowry, Robert K., Laser decapsulation method.
  15. Lowry,Robert K., Laser decapsulation method.
  16. Robert K. Lowry, Laser decapsulation method.
  17. Yamazaki,Shunpei; Tanaka,Koichiro, Laser irradiating apparatus and method of manufacturing semiconductor apparatus.
  18. Miyairi, Hidekazu, Laser irradiation apparatus.
  19. Matsuura, Yuuto, Laser processing system.
  20. Mazur, Eric; Shen, Mengyan, Laser-induced structuring of substrate surfaces.
  21. Mazur, Eric; Shen, Mengyan, Laser-induced structuring of substrate surfaces.
  22. Miyairi, Hidekazu; Kokubo, Chiho; Inoue, Koki, Manufacturing method of semiconductor device.
  23. Allen, Susan Davis, Method and apparatus for removal of minute particles from a surface using thermophoresis to prevent particle redeposition.
  24. Straw, Marcus; Samsavar, Amin; Toth, Milos; Utlaut, Mark, Method for laser machining a sample having a crystalline structure.
  25. Umetsu,Kazushige; Yoshimura,Kazuto; Funasaka,Tsukasa; Kitamura,Fumitaka, Method for manufacturing a piezoelectric resonator.
  26. Nakajima, Setsuo, Method for manufacturing a semiconductor device.
  27. Nakajima, Setsuo, Method for manufacturing a semiconductor device.
  28. Nakajima, Setsuo, Method for manufacturing a semiconductor device with a crystallized semiconductor film leveled by radiating with laser beams.
  29. Yamazaki, Shunpei; Tanaka, Koichiro; Shoji, Hironobu; Kawamata, Ikuko, Method for manufacturing display device including laser irradiation and selective removing of a light absorber layer.
  30. Arai, Yasuyuki; Tanaka, Koichiro; Suzuki, Yukie, Method for manufacturing semiconductor device.
  31. Miyairi, Hidekazu; Higa, Eiji, Method for manufacturing semiconductor device.
  32. Leon Fong, Betty Mireya; Pan Cabo, Aldara; Chiussi, Stefano; Rebollar Gonzalez, Esther; Serra Rodriguez, Julia De La Asuncion; Gonzalez Fernandez, Pio Manuel, Method for removal of wax from porous stones in historical monuments.
  33. Yamazaki,Shunpei; Tanaka,Koichiro, Method of flattening a crystallized semiconductor film surface by using a plate.
  34. Yamazaki, Shunpei; Nakajima, Setsuo; Miyairi, Hidekazu, Method of manufacturing a semiconductor device.
  35. Yamazaki, Shunpei; Nakajima, Setsuo; Miyairi, Hidekazu, Method of manufacturing a semiconductor device.
  36. Yamazaki,Shunpei; Nakajima,Setsuo; Miyairi,Hidekazu, Method of manufacturing a semiconductor device.
  37. Yamazaki,Shunpei; Nakajima,Setsuo; Miyairi,Hidekazu, Method of manufacturing a semiconductor device.
  38. Miyairi, Hidekazu; Shoji, Hironobu; Shimomura, Akihisa; Higa, Eiji; Moriwaka, Tomoaki; Yamazaki, Shunpei, Method of manufacturing semiconductor device.
  39. Miyairi, Hidekazu; Shoji, Hironobu; Shimomura, Akihisa; Higa, Eiji; Moriwaka, Tomoaki; Yamazaki, Shunpei, Method of manufacturing semiconductor device.
  40. Anton, Bryce; Welty, Richard P.; Sullivan, Patrick, Method of producing an article having patterned decorative coating.
  41. Eason, Robert William; Brown, Paul; Mailis, Sakellaris, Methods of microstructuring ferroelectric materials.
  42. Jiang, Jutao; McKee, Jeffrey; Pralle, Martin U., Photosensitive imaging devices and associated methods.
  43. Gerlach, Robert L.; Utlaut, Mark W.; Tesch, Paul P.; Young, Richard J.; Chandler, Clive D.; van der Mast, Karl D., Shaped and low density focused ion beams.
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