$\require{mediawiki-texvc}$

연합인증

연합인증 가입 기관의 연구자들은 소속기관의 인증정보(ID와 암호)를 이용해 다른 대학, 연구기관, 서비스 공급자의 다양한 온라인 자원과 연구 데이터를 이용할 수 있습니다.

이는 여행자가 자국에서 발행 받은 여권으로 세계 각국을 자유롭게 여행할 수 있는 것과 같습니다.

연합인증으로 이용이 가능한 서비스는 NTIS, DataON, Edison, Kafe, Webinar 등이 있습니다.

한번의 인증절차만으로 연합인증 가입 서비스에 추가 로그인 없이 이용이 가능합니다.

다만, 연합인증을 위해서는 최초 1회만 인증 절차가 필요합니다. (회원이 아닐 경우 회원 가입이 필요합니다.)

연합인증 절차는 다음과 같습니다.

최초이용시에는
ScienceON에 로그인 → 연합인증 서비스 접속 → 로그인 (본인 확인 또는 회원가입) → 서비스 이용

그 이후에는
ScienceON 로그인 → 연합인증 서비스 접속 → 서비스 이용

연합인증을 활용하시면 KISTI가 제공하는 다양한 서비스를 편리하게 이용하실 수 있습니다.

Global planarization method and apparatus 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • B30B-005/02
출원번호 US-0287502 (1999-04-07)
발명자 / 주소
  • Blalock Guy
출원인 / 주소
  • Micron Technology, Inc.
대리인 / 주소
    Trask, Britt & Rossa
인용정보 피인용 횟수 : 36  인용 특허 : 37

초록

An apparatus for performing a global planarization of a surface of a deformable layer of a wafer on a production scale. The apparatus includes a chamber having a pressing surface and containing a rigid plate and a flexible pressing member or "puck" disposed between the rigid plate and the pressing s

대표청구항

[ What is claimed is:] [31.] A method for globally planarizing a surface of a semiconductor wafer comprising:providing a pressing surface;placing said wafer on one side of a pressing puck; andapplying a force to a rigid plate adjacent to another side of said pressing puck to cause said surface of sa

이 특허에 인용된 특허 (37)

  1. Choinski Edward J. (Wayland MA), Apparatus and method for temporarily sealing holes in printed circuit boards.
  2. Kishii Sadahiro (Kawasaki JPX) Arimoto Yoshihiro (Kawasaki JPX), Apparatus and method for uniformly polishing a wafer.
  3. Inselmann Jrgen (Lhne DEX), Apparatus for bonding textile sheet-like structures.
  4. Shendon Norman (San Carlos CA), Chemical mechanical polishing apparatus with improved carrier and method of use.
  5. Shimomura Mariko (Yokohama JPX) Miyashita Naoto (Yokohama JPX) Ohashi Hiroyuki (Kamakura JPX), Chemical-mechanical polishing (CMP) method for controlling polishing rate using ionized water, and CMP apparatus.
  6. Chen Lai-Juh (Hsin-Chu TWX), Chemical/mechanical polish (CMP) thickness monitor.
  7. Bunch Jesse C. (Silver Spring MD), Cube press.
  8. Prybyla Judith Ann ; Taylor Gary Newton, Device fabrication involving planarization.
  9. Weling Milind G. (San Jose CA) Bothra Subhas (San Jose CA) Gabriel Calvin T. (Cupertino CA), Dummy underlayers for improvement in removal rate consistency during chemical mechanical polishing.
  10. Miyashita Akimi (Toride JPX) Fujii Mutsumasa (Ibaraki-ken JPX) Mishina Haruo (Ushiku JPX), Hot press with pressure vessels to uniformly distribute pressure to the work piece.
  11. Sandhu Gurtej S. (Boise ID) Yu Chris C. (Austin TX), IC chemical mechanical planarization process incorporating slurry temperature control.
  12. Lee Ruojia (Boise ID) Gonzalez Fernando (Boise ID), Insulated-gate vertical field-effect transistor with high current drive and minimum overlap capacitance.
  13. Lee Ruojia (Boise ID) Gonzalez Fernando (Boise ID), Insulated-gate vertical field-effect transistor with high current drive and minimum overlap capacitance.
  14. Yu Chris C. (Boise ID) Sandhu Gurtej S. (Boise ID) Doan Trung T. (Boise ID), Integrated circuit polishing method.
  15. Tuttle Mark E. (Boise ID) Doan Trung T. (Boise ID) Fox Angus C. (Boise ID) Sandhu Gurtej S. (Boise ID) Stroupe Hugh E. (Boise ID), Method and apparatus for improving planarity of chemical-mechanical planarization operations.
  16. Hamamura Fumio (Kanagawa JPX) Oka Yukio (Yamaguchi JPX), Method and apparatus for pressure sticking a thin film to a base plate.
  17. Reavill Joseph A. (Mira Loma CA) Arachi John M. (Riverside CA), Method and apparatus for vacuum lamination of flex circuits.
  18. Tsunoda Kazuyoshi (Yuki JPX) Tonoki Kenji (Yuki JPX) Yokono Haruki (Yuki JPX) Kono Hisao (Yuki JPX) Yokoyama Ryoji (Musashino JPX) Kobayashi Kazuo (Shimodate JPX), Method and device for manufacturing a laminated material.
  19. Paranjpe Ajit P. (Plano TX), Method for planarization.
  20. Kim Sung C. (Boise ID) Meikle Scott (Boise ID), Method for shaping features of a semiconductor structure using chemical mechanical planarization (CMP).
  21. Hayashi Yoshihiro (Tokyo JPX), Method of flattening the surface of a semiconductor device by polishing.
  22. Blalock Guy (Boise ID) Wald Phillip G. (Boise ID), Method of forming a stacked capacitor with striated electrode.
  23. Tola Jeffry (Morrison IL), Method of making diaphragm-type pressure transducers.
  24. Matsuda Tetsuo (Poughkeepsie NY) Okumura Katsuya (Poughkeepsie NY), Method of planarizing a semiconductor workpiece surface.
  25. Schwarzbauer Herbert (Munich DEX), Method of securing electronic components to a substrate.
  26. Doan Trung T. (Boise ID) Yu Chris C. (Boise ID), Multiple step method of chemical-mechanical polishing which minimizes dishing.
  27. Stroupe Hugh (Boise ID) Sharan Sujit (Boise ID) Sandhu Gurtej S. (Boise ID), Polishing apparatus, a polishing wafer carrier apparatus, a replacable component for a particular polishing apparatus an.
  28. Katakabe Ichiro (Kanagawa-ken JPX) Miyashita Naoto (Kanagawa-ken JPX) Akiyama Tatsuo (Tokyo JPX), Polishing method and apparatus for detecting a polishing end point of a semiconductor wafer.
  29. Robinson Karl M. (Boise ID), Polishing pad and a method for making a polishing pad with covalently bonded particles.
  30. Talieh Homayoun (San Jose CA) Weldon David E. (Los Gatos CA), Polishing pad cluster for polishing a semiconductor wafer.
  31. Karlsrud Chris (Chandler AZ), Polishing pad conditioning.
  32. Namysl Edmond (1907 Frederick Placentia CA 92670), Printed circuit board laminating machine.
  33. Jacob Adir (23 Juniper La. Framingham MA 01701), Process for dry sterilization of medical devices and materials.
  34. Blalock Guy (Boise ID) Wald Phillip G. (Boise ID), Stacked capacitor construction.
  35. Iijima Nobuo (Kawasaki JPX) Hayashida Akihisa (Kawasaki JPX), Tape-on-wafer mounting apparatus and method.
  36. Pasch Nicholas F. (Pacifica CA) Mallon Thomas G. (Santa Clara CA) Franklin Mark A. (Scott\s Valley CA), Techniques for assembling polishing pads for chemi-mechanical polishing of silicon wafers.
  37. Clover Richmond B. (1199 W. Vanderbilt Ct. Sunnyvale CA 94087), Vertically stacked planarization machine.

이 특허를 인용한 특허 (36)

  1. Melvin,Jason; Suh,Nam P.; Oh,Hilario L., Apparatus and method for chemical mechanical polishing of substrates.
  2. Melvin,Jason; Suh,Nam P.; Oh,Hilario L., Apparatus and method for chemical mechanical polishing of substrates.
  3. Tan,Hua; Kong,Linshu; Li,Mingtao; Chou,Stephen Y., Apparatus for fluid pressure imprint lithography.
  4. McCutcheon, Jeremy; Lamb, III, James E., Automated process and apparatus for planarization of topographical surfaces.
  5. McCutcheon, Jeremy W.; Brown, Robert D., Contact planarization apparatus.
  6. Endisch, Denis H.; Drage, James S., Contact planarization using nanoporous silica materials.
  7. Endisch, Denis H.; Drage, James S., Contact planarization using nanoporous silica materials.
  8. Feist,Thomas P.; Bushko,Wit C.; Dal,Kevin H.; Furlano,Daniel; Hariharan,Ramesh; Kubotera,Kazunao; Landa,Bernard P.; Subramanian,Suresh; Woods,Joseph T., Data storage media utilizing a substrate including a plastic resin layer, and method thereof.
  9. Blalock Guy T. ; Stroupe Hugh E. ; Gordon Brian F., Deadhesion method and mechanism for wafer processing.
  10. Blalock, Guy T.; Stroupe, Hugh E.; Gordon, Brian F., Deadhesion method and mechanism for wafer processing.
  11. Blalock, Guy T.; Stroupe, Hugh E.; Gordon, Brian F., Deadhesion method and mechanism for wafer processing.
  12. Davis, John E., Embossing methods.
  13. Blalock Guy, Global planarization method and apparatus.
  14. Blalock, Guy, Global planarization method and apparatus.
  15. Wu, Wei; Tong, William M.; Gao, Jun; Picciotto, Carl, Imprint lithography apparatus and method employing an effective pressure.
  16. Saka, Nannaji; Nam, Jamie; Oh, Hilario L., In-situ method and apparatus for end point detection in chemical mechanical polishing.
  17. Blalock, Guy T.; Stroupe, Hugh E.; Carroll, Lynn J., Method for applying uniform pressurized film across wafer.
  18. Blalock, Guy T.; Stroupe, Hugh E.; Carroll, Lynn J., Method for applying uniform pressurized film across wafer.
  19. Blalock, Guy T.; Stroupe, Hugh E.; Carroll, Lynn J., Method for applying uniform pressurized film across wafer.
  20. Joseph A Levert ; Daniel Lynne Towery ; Denis Endisch, Method for integrated circuit planarization.
  21. Kessel, Carl R.; Boardman, Larry D.; Webb, Richard J., Method for manufacturing thin substrate using a laminate body.
  22. Feist, Thomas P.; Bushko, Wit C.; Cole, Herbert S.; Davis, John E.; Gorczyca, Thomas B.; Woods, Joseph T., Methods for making data storage media.
  23. Feist,Thomas P.; Bushko,Wit C.; Cole,Herbert S.; Davis,John E.; Gorczyca,Thomas B.; Woods,Joseph T., Methods for making data storage media and the resultant media.
  24. Marsh, Eugene P., Methods for planarization of non-planar surfaces in device fabrication.
  25. Chen, Shou Ren; Chen, Chuan Feng; Ho, Yu Lun; Wu, Jen Hua; Wang, Wei Han; Chen, Lai Sheng, Microimprint/nanoimprint uniform pressing apparatus.
  26. George, Gregory A.; Johnson, Hale L.; Meyer, David T., Nanoimprinting apparatus and method.
  27. Murdoch,Steven; Blomgren,Timothy, Pin lift chuck assembly for warped substrates.
  28. Shih,Wu Sheng; Lamb, III,James E.; Minzey Snook,Juliet Ann; Daffron,Mark G., Planarization method for multi-layer lithography processing.
  29. Eugene P. Marsh, Planarization of non-planar surfaces in device fabrication.
  30. Doan, Trung T.; Blalock, Guy T.; Durcan, Mark; Meikle, Scott G., Planarization process for semiconductor substrates.
  31. Feist,Thomas Paul; Dai,Kevin Hsingtao; Merfeld,Glen David, Poly(arylene ether) data storage media.
  32. Menard, Etienne, Printing semiconductor elements by shear-assisted elastomeric stamp transfer.
  33. Noda, Kazuki, Semiconductor surface protecting method.
  34. Chung,Yong Chen; Lin,Chia Hung; Hsu,Chia Chun; Chen,Chuan Feng; Feng,Wen Hung; Chen,Ming Chi, Uniform pressing apparatus.
  35. Menard, Etienne, Vacuum coupled tool apparatus for dry transfer printing semiconductor elements.
  36. Blalock, Guy T.; Stroupe, Hugh E.; Gordon, Brian F., Wafer planarization using a uniform layer of material and method for forming uniform layer of material used in semiconductor processing.
섹션별 컨텐츠 바로가기

AI-Helper ※ AI-Helper는 오픈소스 모델을 사용합니다.

AI-Helper 아이콘
AI-Helper
안녕하세요, AI-Helper입니다. 좌측 "선택된 텍스트"에서 텍스트를 선택하여 요약, 번역, 용어설명을 실행하세요.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.

선택된 텍스트

맨위로