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Computer aided inspection machine 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G06K-009/00
  • G01B-011/24
출원번호 US-0965542 (1997-11-06)
발명자 / 주소
  • Buckley B. Shawn
  • Chen Jihong,CNXITX 430074
  • Yang Dao Shan,CNX
  • Zhou Hui Cheng,CNXITX 430074
대리인 / 주소
    Persson
인용정보 피인용 횟수 : 280  인용 특허 : 6

초록

An automatic inspection method and apparatus using structured light and machine vision cameras to inspect an object in conjunction with the geometric model of the object is disclosed. Camera images of the object are analyzed by computer to produce the location of points on the object's surfaces in t

대표청구항

[ What is claimed is:] [1.] A system for measuring the shape characteristics of a plurality of objects comprising:a first object having a plurality of locations on a plurality of surfaces to be inspected;a structured light source disposed at a first angle to illuminate said first object;a camera dis

이 특허에 인용된 특허 (6)

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