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Polishing apparatus having a material for adjusting a surface of a polishing pad and method for adjusting the surface of the polishing pad 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • B24B-029/00
출원번호 US-0338609 (1999-06-23)
우선권정보 JP-0182926 (1998-06-29)
발명자 / 주소
  • Torii Kouzi,JPX
출원인 / 주소
  • NEC Corporation, JPX
대리인 / 주소
    Young & Thompson
인용정보 피인용 횟수 : 28  인용 특허 : 8

초록

In a polishing apparatus, a polishing pad 102 is fixed on top of a circular platen 101. The platen 101 is rotated. A carrier 103 holds either a wafer product or an adjusting wafer. The material of the adjusting wafer is equivalent to the principle component which makes up the surface layer of the wa

대표청구항

[ What is claimed is:] [1.] A polishing apparatus, comprising:a polishing pad for polishing an object;an adjusting tool for adjusting a surface of said polishing pad, said adjusting tool composed entirely of a main ingredient of a surface layer of said object;a first unit for holding said object and

이 특허에 인용된 특허 (8)

  1. Chen Lai-Juh,TWX, Chemical-mechanical polish (CMP) pad conditioner.
  2. Burke Peter A. (Austin TX) Freeman Eric H. (Underhill Center VT) Ross Gilbert H. (Burlington VT), Chemical-mechanical polishing tool with end point measurement station.
  3. Jackson Paul D. (Scottsdale AZ) Schultz Stephen C. (Gilbert AZ) Sanford James E. (Mesa AZ) Ong Glen (Tempe AZ) Rice Richard B. (Chandler AZ) Modi Parag S. (Phoenix AZ) Baca John G. (Tempe AZ), Conditioner for a polishing pad and method therefor.
  4. Cesna Joseph V. (Niles IL) Van Woerkom Anthony G. (Gilbert AZ), Device for conditioning polishing pads.
  5. Ravkin Michael A. ; Ravkin Ilya A. ; Verhovsky Yuli, Method and apparatus for improved conditioning of polishing pads.
  6. Winebarger Paul (Austin TX), Method for polishing a substrate.
  7. Gill ; Jr. Gerald L. (9040 S. 47th Pl. Phoenix AZ 85044), Polishing apparatus.
  8. Appel Andrew T. (Dallas TX) Chisholm Michael F. (Plano TX), Semiconductor substrate conditioning head having a plurality of geometries formed in a surface thereof for pad condition.

이 특허를 인용한 특허 (28)

  1. Moore Scott E., Apparatus and method for conditioning and monitoring media used for chemical-mechanical planarization.
  2. Moore, Scott E., Apparatus and method for conditioning and monitoring media used for chemical-mechanical planarization.
  3. Moore, Scott E., Apparatus and method for conditioning and monitoring media used for chemical-mechanical planarization.
  4. Moore, Scott E., Apparatus and method for conditioning and monitoring media used for chemical-mechanical planarization.
  5. Moore, Scott E., Apparatus and method for conditioning and monitoring media used for chemical-mechanical planarization.
  6. Moore, Scott E., Apparatus and method for conditioning and monitoring media used for chemical-mechanical planarization.
  7. Moore, Scott E., Apparatus and method for conditioning and monitoring media used for chemical-mechanical planarization.
  8. Moore,Scott E., Apparatus and method for conditioning and monitoring media used for chemical-mechanical planarization.
  9. Moore,Scott E., Apparatus and method for conditioning and monitoring media used for chemical-mechanical planarization.
  10. Jeong,In Kwon, Apparatus and method for polishing semiconductor wafers using one or more polishing surfaces.
  11. Cooper, Ivan George; Chaplin, Mark Charles, Method and apparatus for reconditioning digital discs.
  12. Rodriguez,Jose Omar; Storey,Charles A.; Garcia,Andres B.; Seputro,Margareth; Miceli,Frank, Method and system of using offset gage for CMP polishing pad alignment and adjustment.
  13. Beaucage, Jacey Robert; Goddu, Paul Arthur; Tzeng, Huey-Ming, Method of predicting plate lapping properties to improve slider fabrication yield.
  14. Carpenter, Craig M., Microelectronic substrate assembly planarizing machines and methods of mechanical and chemical-mechanical planarization of microelectronic substrate assemblies.
  15. Carpenter, Craig M., Microelectronic substrate assembly planarizing machines and methods of mechanical and chemical-mechanical planarization of microelectronic substrate assemblies.
  16. Ruoh-Haw Chang TW; Hung-Yu Kuo TW; Yao-Hung Liu TW; De-Can Liao TW, Multi-conditioner arrangement of a CMP system.
  17. Chen,Hung Chih; Zuniga,Steven M., Paired pivot arm.
  18. Hisanori Matsuo JP; Hirokuni Hiyama JP; Yutaka Wada JP; Kazuto Hirokawa JP, Polishing apparatus.
  19. Feng, Chung-Chih; Yao, I-Peng; Wang, Lyang-Gung; Hung, Yung-Chang; Tsai, Chao-Yuan, Polishing material having polishing particles and method for making the same.
  20. Feng, Chung-Chih; Yao, I-Peng; Wang, Lyang-Gung; Hung, Yung-Chang; Tsai, Chao-Yuan, Polishing material having polishing particles and method for making the same.
  21. Kawasaki, Tetsu; Iwashita, Mitsuaki, Polishing system and polishing method.
  22. Strahm, Adrian L.; Erdley, Keith A.; VanDalsem, Scott E.; Hinton, Adam S.; Clark, Douglas S., Product drying apparatus and methods.
  23. Strahm, Adrian L.; Erdley, Keith A.; VanDalsem, Scott E.; Hinton, Adam S.; Clark, Douglas S., Product drying apparatus and methods.
  24. Katrina A. Mikhaylich ; John M. Boyd, Sacrificial retaining ring CMP system and methods for implementing the same.
  25. Beaucage, Jacey Robert; Goddu, Paul Arthur; Tzeng, Huey-Ming, System and apparatus for predicting plate lapping properties to improve slider fabrication yield.
  26. Rodriguez, Jose Omar; Storey, Charles A.; Garcia, Andres B.; Seputro, Margareth; Miceli, Frank, System of using offset gage for CMP polishing pad alignment and adjustment.
  27. Janzen, John W., Ultrasonic conditioning device cleaner for chemical mechanical polishing systems.
  28. Janzen, John W., Ultrasonic conditioning device cleaner for chemical mechanical polishing systems.
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