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Method and apparatus for providing ESD protection 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H02H-003/22
출원번호 US-0224766 (1999-01-04)
발명자 / 주소
  • Pequignot James P.
  • Rahman Tariq
  • Sloan Jeffrey H.
  • Stout Douglas W.
  • Voldman Steven H.
출원인 / 주소
  • International Business Machines Corporation
대리인 / 주소
    Schmeiser, Olsen & WattsShkurko
인용정보 피인용 횟수 : 30  인용 특허 : 22

초록

A novel ESD protection circuit for multiple power supplies, having both inventive inter-rail ESD circuitry and inventive single-rail ESD circuitry. The inter-rail ESD circuitry is scaleable and comprises one or more diode strings for interconnecting a pair of power rails. The ESD trigger voltage for

대표청구항

[ What is claimed is:] [1.] A structure comprising:a first power rail;a second power rail;a third power rail;a first single-rail Electrostatic-Discharge (ESD) protection circuit connected between the first power rail and the third power rail;a second single-rail ESD protection circuit connected betw

이 특허에 인용된 특허 (22)

  1. Ker Ming-Dou,TWX, Area-efficient VDD-to-VSS ESD protection circuit.
  2. Lien Chuen-Der (Los Altos Hills CA), Bipolarity electrostatic discharge protection device and method for making same.
  3. Ker Ming-Dou (Hsin-Chu TWX) Wu Chung-Yu (Hsin-Chu TWX) Cheng Tao (Kaohsiung Hsien TWX) Wu Chau-Neng (Kaohsiung Hsien TWX) Yu Ta-Lee (Hsin-Chu Hsien TWX), Capacitor-couple electrostatic discharge protection circuit.
  4. Lien Chuen-Der, Changed device model electrostatic discharge protection circuit for output drivers and method of implementing same.
  5. Meunier Philippe (Aix-en-Provence FRX) Pavlin Antoine (Puyricard FRX), Circuit and method for protecting power components against forward overvoltages.
  6. Orchard-Webb Jonathan H. (Kanata CAX), ESD protection circuit.
  7. Wu Chau-Neng,TWX ; Ker Ming-Dou,TWX, Electrostatc discharge protection network.
  8. English Stephen T. ; Wolfe Edward L., Electrostatic discharge protection circuit for protecting CMOS transistors on integrated circuit processes.
  9. Wu Chau-Neng (Kaohsiung Hsien TWX), Electrostatic discharge protection circuit triggered by capacitive-coupling.
  10. Maloney Timothy J. (Palo Alto CA), Electrostatic discharge protection circuits using biased and terminated PNP transistor chains.
  11. Strauss Mark S. (Allentown PA), Enhanced RC coupled electrostatic discharge protection.
  12. Sakamoto Kozo (Hachiouji JPX) Yoshida Isao (Hinode-machi JPX) Otaka Shigeo (Takasaki JPX) Iijima Tetsuo (Maebashi JPX) Shono Harutora (Gunma-machi JPX) Uchid Ken (Higashiyamato JPX) Kobayashi Masayos, Insulated gate semiconductor device and driving circuit device and electronic system both using the same.
  13. Maloney Timothy J. ; Eiles Travis M., MOSFET-based power supply clamps for electrostatic discharge protection of integrated circuits.
  14. Worley Eugene R. (Ivine CA) Nguyen Chilan T. (Fullerton CA) Kjar Raymond A. (Costa Mesa CA) Tennyson Mark R. (Irvine CA), Method and apparatus for coupling multiple independent on-chip Vdd busses to an ESD core clamp.
  15. Staab David R. (San Jose CA) Li Sheau-Suey (Cupertino CA), Method and structure for providing ESD protection for silicon on insulator integrated circuits.
  16. Lee Kwok Fai V. (Irvine CA), Power rail ESD protection circuit.
  17. Voldman Steven H. (Burlington VT), Power sequence independent electrostatic discharge protection circuits.
  18. Krakauer David B. (Cambridge MA) Mistry Kaizad (Lincoln MA) Butler Steven (Marlboro MA) Partovi Hamid (Sunnyvale CA), Self-referencing modulation circuit for CMOS integrated circuit electrostatic discharge protection clamps.
  19. Narita Kaoru,JPX, Semiconductor device having an ESD protective circuitry.
  20. Tamba Yuko (Ohme JPX) Nagatani Akihiro (Ogose-machi JPX) Okazaki Takao (Hamura JPX), Semiconductor integrated circuit.
  21. Furuta Hiroshi (Tokyo JPX), Semiconductor integrated circuit device.
  22. Voldman Steven H. (South Burlington VT), Voltage regulator bypass circuit.

이 특허를 인용한 특허 (30)

  1. Coolbaugh, Douglas D.; Voldman, Steven H., Carbon-modulated breakdown voltage SiGe transistor for low voltage trigger ESD applications.
  2. Smith, Jeremy Charles, Circuit for ESD protection including dynamically terminated diode strings comprised of bipolar devices.
  3. Verhaege, Koen Gerard Maria; Avery, Leslie Ronald, Circuits for dynamic turn off of NMOS output drivers during EOS/ESD stress.
  4. Smith, Jeremy Charles, Circuits including a diode string comprised of bipolar stages having an adjustable pseudo beta for ESD protection.
  5. Chapman, Phillip F.; Collins, David S.; Voldman, Steven H., Design methodology of guard ring design resistance optimization for latchup prevention.
  6. Leroux, Charles, Device providing protection against electrostatic discharges for microelectronic components on a SOI-type substrate.
  7. Tsai, Chia-Ku; Tsai, Fu-Yi; Peng, Yan-Hua, ESD protection circuit.
  8. Shih, Jiaw-Ren; Lee, Jian-Hsing, ESD protection structure.
  9. Sutardja, Pantas, Electrostatic discharge protection circuit for magneto-resistive read elements.
  10. Sutardja, Pantas, Electrostatic discharge protection circuit for magneto-resistive read elements.
  11. Sutardja, Pantas, Electrostatic discharge protection circuit for magneto-resistive read elements.
  12. Sutardja,Pantas, Electrostatic discharge protection circuit for preamps connected to magneto-resistive read elements.
  13. Smith, Jeremy Charles, Electrostatic discharge protection circuit including a distributed diode string.
  14. Ta-Lee Yu TW, Electrostatic discharge protection device for mixed voltage application.
  15. Mergens, Markus Paul Josef; Russ, Cornelius Christian; Armer, John; Verhaege, Koen Gerard Maria, Electrostatic discharge protection structures for high speed technologies with mixed and ultra-low voltage supplies.
  16. Mergens, Markus Paul Josef; Russ, Cornelius Christian; Armer, John; Verhaege, Koen Gerard Maria, Electrostatic discharge protection structures for high speed technologies with mixed and ultra-low voltage supplies.
  17. Chang,Chyh Yih; Chen,Kuo Ching, Level shifter ESD protection circuit with power-on-sequence consideration.
  18. Sutardja, Pantas, Magnetic storage systems with transistors and limiting circuits for limiting voltages across terminals of read and write devices.
  19. Rodov, Vladimir; Tworzydlo, Wlodzimierz Woytek, Method and apparatus for preventing microcircuit dynamic thermo-mechanical damage during an ESD event.
  20. Rodov,Vladimir; Tworzydlo,Wlodzimierz Woytek, Method and apparatus for preventing microcircuit thermo-mechanical damage during an ESD event.
  21. Culler,Jason Harold; Moldauer,Peter Shaw, Method and structure for external control of ESD protection in electronic circuits.
  22. Sutardja, Pantas, Method of providing electrostatic discharge protection for a read element in a magnetic storage system.
  23. Gauthier, Jr., Robert J.; Kontos, Dimitrios K.; Li, Junjun; Mitra, Souvick; Putnam, Christopher S., RC-triggered power clamp suppressing negative mode electrostatic discharge stress.
  24. Parris, Patrice M.; Chen, Weize; De Souza, Richard J.; Hoque, Mazhar Ul, Semiconductor device and related protection methods.
  25. Arai,Katsuya; Kogami,Toshihiro; Yabu,Hiroaki, Semiconductor integrated circuit device.
  26. Chen, Weize; Parris, Patrice M., Stacked protection devices and related fabrication methods.
  27. Chen, Weize; Bode, Hubert M.; Laudenbach, Andreas; Neugebauer, Kurt U.; Parris, Patrice M., Stacked protection devices with overshoot protection and related fabrication methods.
  28. Voldman, Steven Howard, Variable voltage threshold ESD protection.
  29. Loiseau, Alain F.; Mittl, Steven W.; Stricker, Andreas D., Voltage balanced stacked clamp.
  30. Loiseau, Alain F.; Mittl, Steven W.; Stricker, Andreas D., Voltage balanced stacked clamp.
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