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Silicon-on-silicon wafer bonding process using a thin film blister-separation method 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H01L-021/30
  • H01L-021/302
출원번호 US-0025967 (1998-02-19)
발명자 / 주소
  • Henley Francois J.
  • Cheung Nathan W.
출원인 / 주소
  • Silicon Genesis Corporation
대리인 / 주소
    Townsend and Townsend and Crew LLP
인용정보 피인용 횟수 : 120  인용 특허 : 100

초록

A method for fabricating silicon-on-silicon substrates. A donor wafer (40) is attached to a target wafer (46) using a low-temperature bonding process. The low-temperature bonding process maintains the integrity of a layer of microbubbles (41). Subsequent processing separates a thin film (45) of mate

대표청구항

[ What is claimed is:] [1.] The process for fabricating a silicon-on-silicon wafer, said process comprising steps of:providing one of a {100}, a {110}, or a {111} crystallographic plane single-crystal silicon donor wafer with a first polished surface;implanting hydrogen or helium ions through said f

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