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Equipment for UV wafer heating and photochemistry 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • C23C-016/00
출원번호 US-0955355 (1997-10-21)
발명자 / 주소
  • Fayfield Robert T.
  • Schwab Brent
출원인 / 주소
  • FSI International Inc.
대리인 / 주소
    Vidas, Arrett & Steinkraus
인용정보 피인용 횟수 : 25  인용 특허 : 26

초록

The present invention also provides a method for processing a substrate by heating the substrate to a temperature above ambient via UV radiation at a first power level and conditioning the substrate by exposing the substrate to a photochemically (UV) reactive chemical, or a reactive chemical that ca

대표청구항

[ What is claimed is as follows:] [1.] An apparatus for performing UV heating and phototreating steps on a substrate having a front side and a back side comprising:a reaction chamber for receiving and holding the substrate, the reaction chamber comprising a front side and a back side;a UV radiation

이 특허에 인용된 특허 (26)

  1. Liu Yung S. (Schenectady NY) Grubb Willard T. (Schenectady NY), Apparatus and method for photoetching of polyimides, polycarbonates and polyetherimides.
  2. Panico C. Richard (Medford MA), Apparatus for rapid curing of resinous materials and method.
  3. Hayashi Noriyuki (Shiga JPX) Murayama Hiromi (Kyoto JPX) Ishino Yukihiko (Kyoto JPX), Apparatus for removing organic substance from substrate.
  4. Hiatt C. Fred (Burnsville MN) Gray David C. (Sunnyvale CA) Butterbaugh Jeffery W. (Chanhassen MN), Apparatus for surface conditioning.
  5. Grant Robert W. (Excelsior MN) Novak Richard E. (Plymouth MN), Cluster tool dry cleaning system.
  6. Grant Robert W. (Allenstown PA) Ruzyllo Jerzy (State College PA) Torek Kevin (State College PA), Controlled etching of oxides via gas phase reactions.
  7. Haigh John (Ipswich GB2) Aylett Martin R. (Felixstowe GB2), Etching method.
  8. Yamazaki Shunpei (Tokyo JPX), Etching method for the manufacture of a semiconductor integrated circuit.
  9. Bersin Richard L. (Orange CT), Method and apparatus for dry processing of substrates.
  10. Bender Jim, Method and apparatus for removal of material utilizing near-blackbody radiator means.
  11. Fukuda Hisashi (Tokyo JPX), Method and device for cleaning substrates.
  12. Itoh Hiromi (Hyogo JPX) Iwasaki Masanobu (Hyogo JPX) Tokui Akira (Hyogo JPX) Tsukamoto Katsuhiro (Hyogo JPX), Method for pretreating semiconductor substrate by photochemically removing native oxide.
  13. Vig John R. (Colts Neck NJ) LeBus John W. (Farmingdale NJ), Method of cleaning surfaces by irradiation with ultraviolet light.
  14. Tsujii Kanji (Nishitama JPX) Yajima Yusuke (Musashino JPX) Murayama Seiichi (Kokubunji JPX), Method of dry etching.
  15. Nishizawa, Jun-ichi, Method of fabricating semiconductor device by dry process utilizing photochemical reaction, and apparatus therefor.
  16. Murayama Seiichi (Kokubunji JPX) Tsujii Kanji (Tokyo JPX) Yajima Yusuke (Musashino JPX), Method of photochemical surface treatment.
  17. McMillan Larry D. (Colorado Springs CO) Paz de Araujo Carlos A. (Colorado Springs CO), Methods and apparatus for material deposition.
  18. Morishige Yukio (Tokyo JPX), Optical CVD method with a strong optical intensity used during an initial period and device therefor.
  19. Blum Samuel E. (White Plains NY) Holloway Karen L. (Bronx NY) Srinivasan Rangaswamy (Ossining NY), Patterning of polyimide films with far ultraviolet light.
  20. Yamazaki Shunpei (Tokyo JPX) Imatoh Shinji (Kanagawa JPX) Hayashi Shigenori (Kanagawa JPX), Photochemical vapor phase reaction apparatus and method of causing a photochemical vapor phase reaction.
  21. Elliott David J. ; Hollman Richard F., Photoreactive surface cleaning.
  22. Panico C. Richard (21 Leighton St. Medford MA 02155), Photoresist curing method.
  23. Ohmori Toshiaki (Itami JPX) Fukumoto Takaaki (Itami JPX), Semiconductor manufacturing apparatus.
  24. Khan Ashraf R. ; Ramanathan Sasangan ; Foggiato Giovanni Antonio, Surface modification of semiconductors using electromagnetic radiation.
  25. Kubodera Masao (Yamanashi JPX) Narushima Masaki (Yamanashi JPX) Ozawa Masahito (Yamanashi JPX) Kumagai Hiromi (Tokyo JPX) Yonenaga Tomihiro (Yamanashi JPX) Tanaka Sumi (Yamanashi JPX), Surface processing apparatus.
  26. Ninomiya Ken (Nakano JPX) Suzuki Keizo (Hachioji JPX) Nishimatsu Shigeru (Kokubunji JPX), Surface treatment apparatus.

이 특허를 인용한 특허 (25)

  1. Fayfield Robert T. ; Schwab Brent, Apparatus for processing both sides of a microelectronic device precursor.
  2. Butterbaugh,Jeffery W.; Gray,David C.; Fayfield,Robert T.; Siefering,Kevin; Heitzinger,John; Hiatt,Fred C., Apparatus for surface conditioning.
  3. Englhardt, Eric A.; Rice, Michael R.; Hudgens, Jeffrey C.; Hongkham, Steve; Pinson, Jay D.; Salek, Mohsen; Carlson, Charles; Weaver, William T; Armer, Helen R., Cartesian cluster tool configuration for lithography type processes.
  4. Rice, Mike; Hudgens, Jeffrey; Carlson, Charles; Weaver, William Tyler; Lowrance, Robert; Englhardt, Eric; Hruzek, Dean C.; Silvetti, Dave; Kuchar, Michael; Katwyk, Kirk Van; Hoskins, Van; Shah, Vinay, Cartesian robot cluster tool architecture.
  5. Ishikawa, Tetsuya; Roberts, Rick J.; Armer, Helen R.; Volfovski, Leon; Pinson, Jay D.; Rice, Michael; Quach, David H.; Salek, Mohsen S.; Lowrance, Robert; Backer, John A.; Weaver, William Tyler; Carlson, Charles; Wang, Chongyang; Hudgens, Jeffrey; Herchen, Harald; Lue, Brian, Cluster tool architecture for processing a substrate.
  6. Ishikawa, Tetsuya; Roberts, Rick J.; Armer, Helen R.; Volfovski, Leon; Pinson, Jay D.; Rice, Michael; Quach, David H.; Salek, Mohsen S.; Lowrance, Robert; Backer, John A.; Weaver, William Tyler; Carlson, Charles; Wang, Chongyang; Hudgens, Jeffrey; Herchen, Harald; Lue, Brian, Cluster tool architecture for processing a substrate.
  7. Ishikawa, Tetsuya; Roberts, Rick J.; Armer, Helen R.; Volfovski, Leon; Pinson, Jay D.; Rice, Michael; Quach, David H.; Salek, Mohsen S.; Lowrance, Robert; Backer, John A.; Weaver, William Tyler; Carlson, Charles; Wang, Chongyang; Hudgens, Jeffrey; Herchen, Harald; Lue, Brian, Cluster tool architecture for processing a substrate.
  8. Ishikawa,Tetsuya; Roberts,Rick J.; Armer,Helen R.; Volfovski,Leon; Pinson,Jay D.; Rice,Michael; Quach,David H.; Salek,Mohsen S.; Lowrance,Robert; Backer,John A.; Weaver,William Tyler; Carlson,Charles; Wang,Chongyang; Hudgens,Jeffrey; Herchen,Harald; Lue,Brian, Cluster tool architecture for processing a substrate.
  9. Volfovski, Leon; Ishikawa, Tetsuya, Cluster tool substrate throughput optimization.
  10. Harrison, Dale A.; Weldon, Matthew, Contamination monitoring and control techniques for use with an optical metrology instrument.
  11. Harrison, Dale A.; Weldon, Matthew, Contamination monitoring and control techniques for use with an optical metrology instrument.
  12. Harrison,Dale A.; Weldon,Matthew, Contamination monitoring and control techniques for use with an optical metrology instrument.
  13. Tolle, John; Goodman, Matthew G., Germanium oxide pre-clean module and process.
  14. Yael Nemirovsky IL; Sara Stolyarova IL; Benjamin Brosilow IL, Method and apparatus for removing native oxide layers from silicon wafers.
  15. Bollinger, Lynn David; Tokmouline, Iskander, Method for rapid thermal processing of substrates.
  16. Matsushita, Kiyohiro; Fukuda, Hideaki; Kagami, Kenichi, Method of cleaning UV irradiation chamber.
  17. Tolle, John; Goodman, Matthew G.; Vyne, Robert Michael; Hill, Eric R., Plasma pre-clean module and process.
  18. Tolle, John; Goodman, Matthew G.; Vyne, Robert Michael; Hill, Eric R., Plasma pre-clean module and process.
  19. Scott, Robin Charis; Johnson, Matt, Process and apparatus for treating wafers.
  20. Siefering Kevin L. ; Seppanen Timothy V., Processing apparatus for microelectronic devices in which polymeric bellows are used to help accomplish substrate transport inside of the apparatus.
  21. Ono, Yoshiharu; Hattori, Sachiko; Odamura, Yuko, Semiconductor manufacturing apparatus, method for cleaning the semiconductor manufacturing apparatus, and light source unit.
  22. Rice, Mike; Hudgens, Jeffrey; Carlson, Charles; Weaver, William Tyler; Lowrance, Robert; Englhardt, Eric; Hruzek, Dean C.; Silvetti, Dave; Kuchar, Michael; Van Katwyk, Kirk; Hoskins, Van; Shah, Vinay, Substrate processing sequence in a Cartesian robot cluster tool.
  23. Rice, Mike; Hudgens, Jeffrey; Carlson, Charles; Weaver, William Tyler; Lowrance, Robert; Englhardt, Eric; Hruzek, Dean C.; Silvetti, Dave; Kuchar, Michael; Katwyk, Kirk Van; Hoskins, Van; Shah, Vinay, Substrate processing sequence in a cartesian robot cluster tool.
  24. Rice, Mike; Hudgens, Jeffrey; Carlson, Charles; Weaver, William Tyler; Lowrance, Robert; Englhardt, Eric; Hruzek, Dean C.; Silvetti, Dave; Kuchar, Michael; Van Katwyk, Kirk; Hoskins, Van; Shah, Vinay, Substrate processing sequence in a cartesian robot cluster tool.
  25. Powell,Don Carl, System and method for selectively increasing surface temperature of an object.
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