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Method and apparatus for infrared pyrometer calibration in a thermal processing system using multiple light sources 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01K-015/00
출원번호 US-0861519 (1997-05-22)
발명자 / 주소
  • Yam Mark
출원인 / 주소
  • Applied Materials, Inc.
대리인 / 주소
    Fish & Richardson
인용정보 피인용 횟수 : 27  인용 특허 : 17

초록

A calibration instrument for calibrating a temperature probe, such as pyrometer. The calibration instrument uses two stable light sources, such as light emitting diodes, to simulate a blackbody of a known temperature.

대표청구항

[ What is claimed is:] [1.] An apparatus for calibrating a temperature probe that measures the temperature of a substrate, comprising:a) a first light source having a first spectral range;b) a second light source having a second spectral range, the second spectral range different from the first spec

이 특허에 인용된 특허 (17)

  1. Rosenthal Robert D. (Gaithersburg MD) Rosenthal Scott B. (Gaithersburg MD), Apparatus for near infrared quantitative analysis.
  2. Sopori Bhushan L. (Denver CO), Apparatus for synthesis of a solar spectrum.
  3. Kilmer Louis C. (Torrance CA), High fidelity dual source solar simulator.
  4. Kim James C. (Westlake Village CA), Light emitting diode for use as an efficient emitter or detector of light at a common wavelength and method for forming.
  5. Yam Mark, Method and apparatus for infrared pyrometer calibration in a rapid thermal processing system.
  6. Yam Mark, Method and apparatus for infrared pyrometer calibration in a thermal processing system.
  7. Rosenthal Robert D. (Gaithersburg MD), Method and means for generating synthetic spectra allowing quantitative measurement in near infrared measuring instrumen.
  8. Rosenthal Robert D. (Gaithersburg MD), Method and means for generating synthetic spectra allowing quantitative measurement in near infrared measuring instrumen.
  9. Kim James C. (Westlake Village CA), Method for forming a light emitting diode for use as an efficient emitter or detector of light at a common wavelength.
  10. Rosenthal Robert D. (Gaithersburg MD), Optical quantitative analysis using curvilinear interpolation.
  11. Gibbons, James F., Process for high temperature surface reactions in semiconductor material.
  12. Gronet Christian M. (Palo Alto CA) Gibbons James F. (Palo Alto CA), Rapid thermal heating apparatus and method.
  13. Gronet Christian M. (Palo Alto CA) Gibbons James F. (Palo Alto CA), Rapid thermal heating apparatus and method.
  14. Pinkus Alan R. (Fairborn OH) Task Harry L. (Dayton OH), Spectral distribution emulation.
  15. Chen Wallace W. (La Palma CA) Shih I-Fu (Los Alamitos CA), Target for calibrating and testing infrared devices.
  16. Moslehi Mehrdad M. (Dallas TX) Najm Habib (Dallas TX) Velo Lino A. (Dallas TX), Wireless temperature calibration device and method.
  17. Moslehi Mehrdad M. (Dallas TX) Najm Habib (Dallas TX) Velo Lino A. (Dallas TX), Wireless temperature calibration device and method.

이 특허를 인용한 특허 (27)

  1. Ranish, Joseph M.; Koelmel, Blake; Hunter, Aaron, Apparatus and method for measuring radiation energy during thermal processing.
  2. Ranish, Joseph M.; Koelmel, Blake; Hunter, Aaron Muir, Apparatus and method for measuring radiation energy during thermal processing.
  3. Timans, Paul Janis, Apparatus and method for reducing stray light in substrate processing chambers.
  4. Timans,Paul Janis, Apparatus and method for reducing stray light in substrate processing chambers.
  5. Timans,Paul Janis, Apparatus and method for reducing stray light in substrate processing chambers.
  6. Ji, Sang Hyun, Apparatus for calibrating pyrometer.
  7. Bell, Ken; Thebert, Robert, Apparatuses, systems, and methods controlling testing optical fire detectors.
  8. Barlett, Darryl; Wissman, Barry D.; Taylor, II, Charles A., Blackbody fitting for temperature determination.
  9. Jack Chen TW; John Lin TW, Blackbody furnace.
  10. Näegele, Thomas; Hannak, Detlef; Sturm, Simon, Calibration light source.
  11. Yoshiro Yamada JP, Fixed-point crucible, fixed-point temperature realizing apparatus using the crucible and temperature calibration method.
  12. Hwang,Jack, Flash assisted annealing.
  13. Lee, Jerald D.; Dabell, Stanley D., Fluorometer with low heat-generating light source.
  14. Lee, Jerald D.; Dabell, Stanley D., Fluorometer with low heat-generating light source.
  15. Lee,Jerald D.; Dabell,Stanley D., Fluorometer with low heat-generating light source.
  16. Yonezawa, Toshihiro, Mechanism for fixing probe card.
  17. Yonezawa, Toshihiro, Mechanism for fixing probe card.
  18. Yonezawa, Toshihiro, Mechanism for fixing probe card.
  19. Brown, Douglas; Meadows, Robert David; Tao, David; Koch, Mathias, Optical path improvement, focus length change compensation, and stray light reduction for temperature measurement system of RTP tool.
  20. Timans, Paul J.; Acharya, Narasimha, Pulsed processing semiconductor heating methods and associated system using combinations of heating sources.
  21. Timans, Paul J.; Acharya, Narasimha, Pulsed processing semiconductor heating methods using combinations of heating sources.
  22. Timans, Paul J.; Acharya, Narasimha, Pulsed processing semiconductor heating methods using combinations of heating sources.
  23. Timans, Paul J.; Acharya, Narasimha, Pulsed processing semiconductor heating methods using combinations of heating sources.
  24. Timans,Paul J.; Acharya,Narasimha, Pulsed processing semiconductor heating methods using combinations of heating sources.
  25. Schwarze, Dieter; Alberts, Daniel, Pyrometric detection device, method for calibrating the same, and apparatus for producing three-dimensional work pieces.
  26. Allen, David W.; Yoon, Howard, Radiance output and temperature controlled LED radiance source.
  27. Alexander Stein, Range pyrometer.
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