$\require{mediawiki-texvc}$

연합인증

연합인증 가입 기관의 연구자들은 소속기관의 인증정보(ID와 암호)를 이용해 다른 대학, 연구기관, 서비스 공급자의 다양한 온라인 자원과 연구 데이터를 이용할 수 있습니다.

이는 여행자가 자국에서 발행 받은 여권으로 세계 각국을 자유롭게 여행할 수 있는 것과 같습니다.

연합인증으로 이용이 가능한 서비스는 NTIS, DataON, Edison, Kafe, Webinar 등이 있습니다.

한번의 인증절차만으로 연합인증 가입 서비스에 추가 로그인 없이 이용이 가능합니다.

다만, 연합인증을 위해서는 최초 1회만 인증 절차가 필요합니다. (회원이 아닐 경우 회원 가입이 필요합니다.)

연합인증 절차는 다음과 같습니다.

최초이용시에는
ScienceON에 로그인 → 연합인증 서비스 접속 → 로그인 (본인 확인 또는 회원가입) → 서비스 이용

그 이후에는
ScienceON 로그인 → 연합인증 서비스 접속 → 서비스 이용

연합인증을 활용하시면 KISTI가 제공하는 다양한 서비스를 편리하게 이용하실 수 있습니다.

Method and system for high speed measuring of microscopic targets 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01B-011/24
출원번호 US-0419586 (1999-10-18)
발명자 / 주소
  • Svetkoff Donald J.
  • Kilgus Donald B. T.
  • Lin Warren
  • Ehrmann Jonathan S.
출원인 / 주소
  • General Scanning, Inc.
대리인 / 주소
    Brooks & Kushman P.C.
인용정보 피인용 횟수 : 15  인용 특허 : 22

초록

A system including confocal and triangulation-based scanners or subsystems provides data which is both acquired and processed under the control of a control algorithm to obtain information such as dimensional information about microscopic targets which may be "non-cooperative." The "non-cooperative"

대표청구항

[ What is claimed is:] [1.] A system for developing dimensional information about an object, the system comprising:at least one illuminator for illuminating an object with at least one beam of electromagnetic energy to obtain at least one reflected beam of electromagnetic energy;a confocal detector

이 특허에 인용된 특허 (22)

  1. Lee Ken K. (Los Altos CA), Automated surface acquisition for a confocal microscope.
  2. Houpt Pieter M. (The Hague NLX) Draaijer Arie (Zwijndrecht NLX), Confocal laser scanning microscope.
  3. Ellis Gordon W. (Media PA), Confocal laser scanning microscope having relay lens and a slit for removing stray light.
  4. Goldstein Seth R. (Bethesda MD), Confocal scanning laser microscope having no moving parts.
  5. Biegen James F. (Middletown CT), Interferometric method and apparatus to measure surface topography.
  6. Worster Bruce W. (Saratoga CA) Crane Dale E. (Pleasanton CA) Hansen Hans J. (Pleasanton CA) Fairley Christopher R. (San Jose CA) Lee Ken K. (Los Altos CA), Laser imaging system for inspection and analysis of sub-micron particles.
  7. Ray Rajarshi (Princeton NJ), Method and apparatus for inspection of specular, three-dimensional features.
  8. Thompson Timothy V. (1220 N. Bascom Ave. ; #8 San Jose CA 95128) Fairlay Christopher R. (809 Harding Ave. San Jose CA 95126) Lee Ken K. (1326 Morton Ave. Los Altos CA 94024), Method and apparatus for performing an automatic focus operation for a microscope.
  9. Svetkoff Donald J. (Ann Arbor MI) Doss Brian L. (Ypsilanti MI), Method and system for high-speed, high-resolution, 3-D imaging of an object at a vision station.
  10. Liu Kuo-Ching ; Liang Chu-Kwo ; Fwu Jong-Kae ; Huang Chung-Po, Method and system for measuring object features.
  11. Svetkoff Donald J. (Ann Arbor MI) Rohrer Donald K. (Whitmore Lake MI) Noblett David A. (Agoura CA) Jackson Robert L. (Moorpark CA), Method and system for triangulation-based, 3-D imaging utilizing an angled scaning beam of radiant energy.
  12. Grosskopf Rudolf E. (Koenigsbronn DEX), Microscope system for providing three-dimensional resolution.
  13. Derndinger Eberhard (Aalen DEX) Grosskopf Rudolf E. (Konigsbronn DEX) Knupfer Klaus (Essingen DEX), Optical device with an illuminating grid and detector grid arranged confocally to an object.
  14. Schick Anton (Schwindegg DEX) Schneider Richard (Taufkirchen DEX) Stockmann Michael (Bruckmhl DEX), Optical distance sensor.
  15. Morgan Colin G. (Horspath GBX), Optical sensor for imaging an object.
  16. Horikawa Yoshiaki (Hachioji JPX), Scanning optical microscope.
  17. Lindow James T. (Saratoga CA) Bennett Simon D. (Los Gatos CA) Smith Ian R. (Los Gatos CA) Melmon Gary A. (Saratoga CA), Semiconductor wafer scanning system.
  18. Batchelder David N. (London GBX) Pitt G. David (Gloucestershire GBX), Spectroscopic apparatus and methods.
  19. Chen Sullivan (Centerport NY) Yonescu William E. (Dix Hills NY) Stern Howard K. (Greenlawn NY), System for 3-D inspection of objects.
  20. Kerstens Pieter J. (Beacon NY) Mandeville Jon R. (Redmond WA) Wu Frederick Y. (Cos Cob CT), Tandem linear scanning confocal imaging system with focal volumes at different heights.
  21. Svetkoff Donald J. ; Rohrer Donald K. ; Kelley Robert W., Triangulation-based 3-D imaging and processing method and system.
  22. Svetkoff Ronald J. (Ann Arbor MI) Rohrer Donald K. (Whitmore Lake MI) Kelley Robert W. (Ann Arbor MI), Triangulation-based 3D imaging and processing method and system.

이 특허를 인용한 특허 (15)

  1. Akimitsu Ebihara JP, Apparatus and method for measuring three-dimensional shape of object.
  2. Kitai,Anton T.; Ehrmann,Jonathan S., Flexible scan field.
  3. Kitai,Anton; Ehrmann,Jonathan S, Flexible scan field.
  4. Blake,Scott; Ehrlich,Buddy; Eisack,Eric; Luoma,Robert, High accuracy inspection system and method for using same.
  5. Persi,Fred M.; Hoffman,Eric, Method and apparatus for creating a registration network of a scene.
  6. Svetkoff, Donald J.; Kilgus, Donald B. T.; Lin, Warren; Ehrmann, Jonathan S., Method and system for 3D imaging of target regions.
  7. Svetkoff Donald J. ; Kilgus Donald B. T. ; Lin Warren ; Ehrmann Jonathan S., Method and system for high speed measuring of microscopic targets.
  8. Svetkoff,Donald J.; Kilgus,Donald B. T.; Lin,Warren; Ehrmann,Jonathan S., Method and system for high speed measuring of microscopic targets.
  9. Hurley, Neil Francis; Zhang, Tuanfeng, Method for characterizing a geological formation traversed by a borehole.
  10. Zhang, Tuanfeng; Hurley, Neil Francis; Zhao, Weishu, Method to generate numerical pseudocores using borehole images, digital rock samples, and multi-point statistics.
  11. Hurley, Neil Francis; Zhang, Tuanfeng; Xu, Guangping; Xu, Lili; Slim, Mirna, Method to quantify discrete pore shapes, volumes, and surface areas using confocal profilometry.
  12. Castellanos Nolasco,Ramiro; Mathur,Sanjeev; Thornell,John Mark; Carrington,Thomas Casey; Sim,Hak Chuah; Guest,Clyde Maxwell; Harris,Charles Kenneth, System and method for inspection using off-angle lighting.
  13. Feng, Wenyi, Systems for and methods of facilitating focusing an optical scanner.
  14. Feng, Wenyi, Systems for and methods of facilitating focusing an optical scanner.
  15. Feng, Wenyi, Systems for and methods of facilitating focusing an optical scanner.
섹션별 컨텐츠 바로가기

AI-Helper ※ AI-Helper는 오픈소스 모델을 사용합니다.

AI-Helper 아이콘
AI-Helper
안녕하세요, AI-Helper입니다. 좌측 "선택된 텍스트"에서 텍스트를 선택하여 요약, 번역, 용어설명을 실행하세요.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.

선택된 텍스트

맨위로