초록 ▼

An optical microscope that can observe the image of a sample by scanning the sample, wherein are provided a beam splitter to branch a linearly polarized incident light beam and a light beam reflected from the sample; an objective lens to illuminate the sample by focusing the incident light beam on t

An optical microscope that can observe the image of a sample by scanning the sample, wherein are provided a beam splitter to branch a linearly polarized incident light beam and a light beam reflected from the sample; an objective lens to illuminate the sample by focusing the incident light beam on the sample; and a quarter wavelength plate disposed between the objective lens and sample, whereby the placement of the quarter wavelength plate on the sample side of the objective lens improves the S/N ratio and allows low reflectivity samples to be measured.

대표청구항 ▼

[ What is claimed is:] [1.] In a confocal optical microscope for observing an image of a sample by optically scanning said sample, said microscope comprising:a light source for providing an incident light;polarizer means for polarizing said incident light;rotatable disk means comprising:a microlens

[ What is claimed is:] [1.] In a confocal optical microscope for observing an image of a sample by optically scanning said sample, said microscope comprising:a light source for providing an incident light;polarizer means for polarizing said incident light;rotatable disk means comprising:a microlens disk having a plurality of microlenses arranged in a first pattern;a Nipkow disk having a plurality of pin holes arranged in a second pattern, said second pattern being similar to said first pattern; andmeans for connecting said microlens disk to be parallel to and at a predetermined distance from said Nipkow disk and to be concurrently rotatable;a beam splitter disposed between said microlens disk and said Nipkow disk for branching incident light from said light source through said microlens to said pin holes and to an objective lens to said sample, and for branching reflected light from said sample through said pin holes to an output terminal;analyzer means for analyzing reflected light from said sample which is outputted from said beam splitter; andsaid objective lens used to illuminate said sample by focusing said polarized light onto said sample; the improvement whereindisposed between said objective lens and said sample is a quarter wavelength plate only which is positioned at an azimuthal angle of 45.degree., and wherein said polarizer means and said analyzer means are adjusted to azimuthal angles which produce an extinguished state for reflected light from components of said microscope other than reflected light from said sample of about 10.sup.-6 and ratio of surface reflection at said objective lens of 10.sup.4 or less, so that signal to noise ratio is improved with reflected light from said sample being 100% transmitted and background light including light reflected from said objective lens and other components of said microscope other than said sample being reduced so that measurement of a sample of low reflectivity is made possible.