$\require{mediawiki-texvc}$

연합인증

연합인증 가입 기관의 연구자들은 소속기관의 인증정보(ID와 암호)를 이용해 다른 대학, 연구기관, 서비스 공급자의 다양한 온라인 자원과 연구 데이터를 이용할 수 있습니다.

이는 여행자가 자국에서 발행 받은 여권으로 세계 각국을 자유롭게 여행할 수 있는 것과 같습니다.

연합인증으로 이용이 가능한 서비스는 NTIS, DataON, Edison, Kafe, Webinar 등이 있습니다.

한번의 인증절차만으로 연합인증 가입 서비스에 추가 로그인 없이 이용이 가능합니다.

다만, 연합인증을 위해서는 최초 1회만 인증 절차가 필요합니다. (회원이 아닐 경우 회원 가입이 필요합니다.)

연합인증 절차는 다음과 같습니다.

최초이용시에는
ScienceON에 로그인 → 연합인증 서비스 접속 → 로그인 (본인 확인 또는 회원가입) → 서비스 이용

그 이후에는
ScienceON 로그인 → 연합인증 서비스 접속 → 서비스 이용

연합인증을 활용하시면 KISTI가 제공하는 다양한 서비스를 편리하게 이용하실 수 있습니다.

Non-invasive system and method for diagnosing potential malfunctions of semiconductor equipment components 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G06F-011/30
출원번호 US-0247143 (1999-02-09)
발명자 / 주소
  • Bottomfield Roger L.
대리인 / 주소
    Gray Cary Ware and Freidenrich, LLP
인용정보 피인용 횟수 : 22  인용 특허 : 17

초록

A system to diagnose potential malfunctions in semiconductor manufacturing equipment components, this system includes a transducer to monitor component vibration signatures of the semiconductor manufacturing equipment components. This transducer provides an output signal representative of the compon

대표청구항

[What is claimed is:] [1.]a transducer to monitor present component vibration signatures of the semiconductor manufacturing equipment components and provide at least one output signal representative of present component vibration;an electrical circuit to read said at least one output signal generate

이 특허에 인용된 특허 (17)

  1. Frey Donald J. (Boulder CO) Holtz Michael J. (Boulder CO), Automated diagnostic system having temporally coordinated wireless sensors.
  2. Morrow Robert S. (Columbus OH), Data acquisition system.
  3. Kawakami Eigo (Ebina JPX) Ozawa Kunitaka (Isehara JPX) Uda Koji (Yokohama JPX) Shimoda Isamu (Zama JPX) Uzawa Shunichi (Tokyo JPX), Exposure apparatus and control of the same.
  4. Shima Ichiji (Kansai Electric Power Company Incorporated ; Sohgo Gijyutsu Kenkyusho ; No. 1 Nakohji Ichinotsubo ; Amagasaki-shi ; Hyogo-ken JPX) Teshima Hiroshi (Kansai Electric Power Company Incorpo, Judging system for detecting failure of machine.
  5. Demjanenko Victor (1482 D\Angelo Dr. North Tonawanda NY 14120) Soom Andres (125 Wickham Dr. Williamsville NY 14221) Lee Yong H. (4285 Chestnut Ridge Rd. ; Apt. #35A Tonawanda NY 14150) Reinhorn Andre, Method and apparatus for diagnosing the state of a machine.
  6. Demjanenko Victor (North Tonawanda NY) Benenson David M. (Williamsville NY) Park Soon Y. (Chonnam CA KRX) Wright Selwyn (Palo Alto CA) Soom Andres (Williamsville NY) Acharya Raj S. (East Amherst NY) , Method and apparatus for diagnosing the state of a machine.
  7. Osborne Robert L. (Nether Providence Township ; Delaware County PA) Haley Paul H. (Monroeville PA) Jennings Stephen J. (Radnor Township ; Delaware County PA), Method and apparatus for the automatic diagnosis of system malfunctions.
  8. Sarangapani Jagannathan, Method and apparatus of predicting a fault condition.
  9. Haseley Robert K. (Mooresville NC) Kirkpatrick Paul A. (Charlotte NC), Method for collecting machine vibration data.
  10. Saxena Sharad (Richardson TX), Method of diagnosing malfunctions in semiconductor manufacturing equipment.
  11. Imam, Imdad; Bernd, Leslie H., On-line rotor crack detection.
  12. Zaschel Jorg (Reuflingen DEX), Process for early detection of damage to machine parts.
  13. Oates James H. (Gilroy CA) Liu Lun K. (Moraga CA) Sundaram Swaminathan H. (San Jose CA) Tafarrodi Hassanali (San Jose CA), Shaft to impeller integrity determination in assembled pumps by remote sensing.
  14. Thomas Charles E. (Scotia NY), Tool break/wear detection using a tracking minimum of detected vibrational signal.
  15. Nichol Robert E. (Bainbridge Island WA) Grant Robert B. (Bainbridge Island WA) Faddis Charles T. (Bainbridge Island WA), Vibration data collecting and processing apparatus and method.
  16. Taniguti Ryousuke (Nagasaki JPX), Vibration monitoring apparatus.
  17. Canada Ronald G. (Knoxville TN) Piety Kenneth R. (Knoxville TN) Simpson Daniel G. (Knoxville TN) Pardue E. Forrest (Lenoir City TN), Vibration monitoring device.

이 특허를 인용한 특허 (22)

  1. Kaushal,Sanjeev; Pandey,Pradeep; Sugishima,Kenji, Built-in self test for a thermal processing system.
  2. Kaushal,Sanjeev; Pandey,Pradeep; Sugishima,Kenji; Dip,Anthony; Smith,David; Joe,Raymond; Gandhi,Sundar, Built-in self test for a thermal processing system.
  3. Schultz,Paul C., Condition assessment system and method.
  4. Schultz,Paul C., Condition assessment system and method.
  5. Komura, Hidemichi; Shibata, Kazuo; Shimomura, Kazuhiro, Fault diagnosis method and apparatus.
  6. Takahashi, Ichiro; Kurokawa, Seigo; Asano, Tatsuhiko; Kaneko, Hiromitsu, Instruments management system and method and monitoring apparatus, database apparatus and data base client apparatuses and recording medium.
  7. Weng, Hung-Jen; Klaus, Enk, Method and apparatus for determining and assessing chamber inconsistency in a tool.
  8. Miller, Michael Lee, Method and apparatus for integrating near real-time fault detection in an APC framework.
  9. Kaushal, Sanjeev; Pandey, Pradeep; Sugishima, Kenji, Method and apparatus for monolayer deposition (MLD).
  10. Kaushal, Sanjeev; Pandey, Pradeep; Sugishima, Kenji, Method for creating a built-in self test (BIST) table for monitoring a monolayer deposition (MLD) system.
  11. Lee, Chin-Wen; Chiou, Hung-Wen, Method for generating a signal vibration alert.
  12. Kaushal, Sanjeev; Sugishima, Kenji; Rao, Donthineni Ramesh Kumar, Method of monitoring a semiconductor processing system using a wireless sensor network.
  13. Chandler, Phil; Clark, Daniel O.; Vermeulen, Robbert M.; Jung, Jay J.; Johnson, Roger M.; Loldj, Youssef A.; Smith, James L., Methods and apparatus for assembling and operating electronic device manufacturing systems.
  14. Raoux, Sebastien; Curry, Mark W.; Porshnev, Peter; Fox, Allen, Methods and apparatus for improving operation of an electronic device manufacturing system.
  15. Curry, Mark W.; Raoux, Sebastien; Porshnev, Peter, Methods and apparatus for pressure control in electronic device manufacturing systems.
  16. Chiu, Ho-Man Rodney; Clark, Daniel O.; Crawford, Shaun W.; Jung, Jay J.; Loldj, Youssef A.; Vermeulen, Robbert M., Methods and apparatus for smart abatement using an improved fuel circuit.
  17. Kaushal, Sanjeev; Pandey, Pradeep; Sugishima, Kenji, Monitoring a monolayer deposition (MLD) system using a built-in self test (BIST) table.
  18. Kaushal,Sanjeev; Pandey,Pradeep; Sugishima,Kenji, Monitoring a single-wafer processing system.
  19. Kaushal,Sanjeev; Pandey,Pradeep; Sugishima,Kenji, Monitoring a system during low-pressure processes.
  20. Kaushal,Sanjeev; Pandey,Pradeep; Sugishima,Kenji, Monitoring a thermal processing system.
  21. Lim,Khoon Peng; Foo,Lai Seng, Real time monitoring of particulate contamination in a wafer processing chamber.
  22. Takahashi, Ichiro; Kurokawa, Seigo; Asano, Tatsuhiko; Kaneko, Hiromitsu, System and method for managing monitoring equipment.
섹션별 컨텐츠 바로가기

AI-Helper ※ AI-Helper는 오픈소스 모델을 사용합니다.

AI-Helper 아이콘
AI-Helper
안녕하세요, AI-Helper입니다. 좌측 "선택된 텍스트"에서 텍스트를 선택하여 요약, 번역, 용어설명을 실행하세요.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.

선택된 텍스트

맨위로